John Dell

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	Toate	Din 2020
Referințe bibliografice	5156	1272
h-index	36	18
i10-index	138	31

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Adrian KeatingThe University of Western AsutraliaAdresă de e-mail confirmată pe uwa.edu.au
mariusz martyniukThe University of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Gilberto A Umana-MembrenoThe University of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Yinong LiuThe University of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Han HuangProfessor of Mechanical EngineeringUniversity of Queensland, AustraliaAdresă de e-mail confirmată pe uq.edu.au
Gino PutrinoUniversity of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Xiaozhi HuWinthrop Professor of Mech. Eng. (PhD-Sydney, Post/Doc-ETH-Zurich), University of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Martin SaundersThe University of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Robert WoodwardUniversity of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Alexandra SuvorovaUniversity of Western AustraliaAdresă de e-mail confirmată pe uwa.edu.au
Brian LawnNIST Fellow Emeritus, National Institute of Standards & TechnologyAdresă de e-mail confirmată pe nist.gov
Meyer jrNaval Research LabAdresă de e-mail confirmată pe nrl.navy.mil
Jeffrey LindemuthLake Shore CryotronicsAdresă de e-mail confirmată pe lakeshore.com
Charles N. IronsideCurtin UniversityAdresă de e-mail confirmată pe curtin.edu.au
Sanjay KrishnaProfessor and George R Smith Chair of Engineering, ECE Department, Ohio State UniversityAdresă de e-mail confirmată pe osu.edu
Takuya TsuzukiAssociate Professor, Australian National UniversityAdresă de e-mail confirmată pe anu.edu.au
Kazufumi ItoNorth Carolina State UniversityAdresă de e-mail confirmată pe math.ncsu.edu

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John Dell

Senior Research Fellow, University of Western Australia

Adresă de e-mail confirmată pe uwa.edu.au

Micro Electromechanical Systems Infrared Sensors Semiconductors


Titlu Sortați după descrierea bibliografică Sortați după an Sortați după titlu	Citat de Citat de	Anul
Effect of deposition conditions on mechanical properties of low-temperature PECVD silicon nitride films H Huang, KJ Winchester, A Suvorova, BR Lawn, Y Liu, XZ Hu, JM Dell, ... Materials Science and Engineering: A 435, 453-459, 2006	259	2006
Scattering mechanisms limiting two-dimensional electron gas mobility in modulation-doped field-effect transistors J Antoszewski, M Gracey, JM Dell, L Faraone, TA Fisher, G Parish, YF Wu, ... Journal of Applied Physics 87 (8), 3900-3904, 2000	164	2000
Widely tunable MEMS-based Fabry–Perot filter JS Milne, JM Dell, AJ Keating, L Faraone Journal of microelectromechanical systems 18 (4), 905-913, 2009	153	2009
/sup 60/Co gamma irradiation effects on n-GaN Schottky diodes GA Umana-Membreno, JM Dell, G Parish, BD Nener, L Faraone, ... IEEE Transactions on Electron Devices 50 (12), 2326-2334, 2003	136	2003
MEMS-based microspectrometer technologies for NIR and MIR wavelengths LP Schuler, JS Milne, JM Dell, L Faraone Journal of Physics D: Applied Physics 42 (13), 133001, 2009	135	2009
Nanoscratch-induced phase transformation of monocrystalline Si YQ Wu, H Huang, J Zou, LC Zhang, JM Dell Scripta Materialia 63 (8), 847-850, 2010	107	2010
Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry–Perot optical filters H Huang, K Winchester, Y Liu, XZ Hu, CA Musca, JM Dell, L Faraone Journal of Micromechanics and Microengineering 15 (3), 608, 2005	101	2005
⁶⁰Co gamma-irradiation-induced defects in GA Umana-Membreno, JM Dell, TP Hessler, BD Nener, G Parish, ... Applied physics letters 80 (23), 4354-4356, 2002	93	2002
Monolithic integration of an infrared photon detector with a MEMS-based tunable filter CA Musca, J Antoszewski, KJ Winchester, AJ Keating, T Nguyen, K Silva, ... IEEE electron device letters 26 (12), 888-890, 2005	88	2005
Quantifying the effects of 16p11. 2 copy number variants on brain structure: a multisite genetic-first study S Martin-Brevet, B Rodríguez-Herreros, JA Nielsen, C Moreau, ... Biological Psychiatry 84 (4), 253-264, 2018	85	2018
Tunable Fabry-Pérot cavities fabricated from PECVD silicon nitrideemploying zinc sulphide as the sacrificial layer KJ Winchester, JM Dell Journal of Micromechanics and Microengineering 11 (5), 589, 2001	81	2001
HgCdTe mid-wavelength IR photovoltaic detectors fabricated using plasma induced junction technology JM Dell, J Antoszewski, MH Rais, C Musca, JK White, BD Nener, ... Journal of Electronic Materials 29, 841-848, 2000	78	2000
Magnetic field dependent Hall data analysis of electron transport in modulation-doped AlGaN/GaN heterostructures Z Dziuba, J Antoszewski, JM Dell, L Faraone, P Kozodoy, S Keller, ... Journal of applied physics 82 (6), 2996-3002, 1997	69	1997
Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thinfilms M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone Smart Materials and Structures 15 (1), S29, 2005	67	2005
Nanoscratch-induced deformation of single crystal silicon YQ Wu, H Huang, J Zou, JM Dell Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009	66	2009
GaSb: A new alternative substrate for epitaxial growth of HgCdTe W Lei, RJ Gu, J Antoszewski, J Dell, L Faraone Journal of electronic materials 43, 2788-2794, 2014	65	2014
Characterization of Hg_0.7Cd_0.3Te n- on p-type structures obtained by reactive ion etching induced p- to n conversion J Antoszewski, CA Musca, JM Dell, L Faraone Journal of Electronic materials 29, 837-840, 2000	64	2000
MEMS-based tunable Fabry–Perot filters for adaptive multispectral thermal imaging H Mao, KD Silva, M Martyniuk, J Antoszewski, J Bumgarner, BD Nener, ... Journal of Microelectromechanical Systems 25 (1), 227-235, 2016	57	2016
Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes A Jozwikowska, K Jozwikowski, J Antoszewski, CA Musca, T Nguyen, ... Journal of applied physics 98 (1), 2005	55	2005
MBE growth of mid-wave infrared HgCdTe layers on GaSb alternative substrates W Lei, RJ Gu, J Antoszewski, J Dell, G Neusser, M Sieger, B Mizaikoff, ... Journal of Electronic Materials 44, 3180-3187, 2015	53	2015

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