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Ercan Yilmaz
Ercan Yilmaz
Professor of Physics, Bolu Abant Izzet Baysal University
Adresă de e-mail confirmată pe ibu.edu.tr - Pagina de pornire
Titlu
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Effect of γ-radiation on HfO2 based MOS capacitor
FB Ergin, R Turan, ST Shishiyanu, E Yilmaz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
752010
Frequency dependent electrical characteristics of BiFeO3 MOS capacitors
S Kaya, R Lok, A Aktag, J Seidel, E Yilmaz
Journal of Alloys and Compounds 583, 476-480, 2014
622014
Effects of post deposition annealing, interface states and series resistance on electrical characteristics of HfO2 MOS capacitors
A Kahraman, E Yilmaz, S Kaya, A Aktag
Journal of Materials Science: Materials in Electronics 26, 8277-8284, 2015
532015
Use of Al2O3 layer as a dielectric in MOS based radiation sensors fabricated on a Si substrate
E Yilmaz, İ Doğan, R Turan
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008
532008
Modifications of structural, chemical, and electrical characteristics of Er2O3/Si interface under Co-60 gamma irradiation
S Kaya, E Yilmaz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2018
512018
A Comprehensive Study on the Frequency-Dependent Electrical Characteristics of Sm2O3MOS Capacitors
S Kaya, E Yilmaz
IEEE Transactions on Electron Devices 62 (3), 980-987, 2015
512015
Evaluation of Radiation Sensor Aspects ofMOS Capacitors under Zero Gate Bias
A Kahraman, E Yilmaz, A Aktag, S Kaya
IEEE Transactions on Nuclear Science 63 (2), 1284-1293, 2016
472016
Samarium oxide thin films deposited by reactive sputtering: effects of sputtering power and substrate temperature on microstructure, morphology and electrical properties
S Kaya, E Yilmaz, H Karacali, AO Çetinkaya, A Aktag
Materials Science in Semiconductor Processing 33, 42-48, 2015
462015
Frequency dependent gamma-ray irradiation response of Sm2O3 MOS capacitors
S Kaya, E Yilmaz, A Kahraman, H Karacali
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015
452015
Influence of frequency and gamma irradiation on the electrical characteristics of Er2O3, Gd2O3, Yb2O3, and HfO2 MOS-based devices
A Kahraman, CD Seetharama, E Yilmaz
Journal of Materials Science, 2020
422020
Impact and origin of the oxide-interface traps in Al/Yb2O3/n-Si/Al on the electrical characteristics
A Kahraman, H Karacali, E Yilmaz
Journal of Alloys and Compounds 825, 154171, 2020
382020
A systematic study on MOS type radiation sensors
E Yilmaz, B Kaleli, R Turan
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
372007
Irradiation response of radio-frequency sputtered Al/Gd2O3/p-Si MOS capacitors
A Kahraman, E Yilmaz
Radiation Physics and Chemistry 139, 114-119, 2017
352017
Investigation of RadFET response to X-ray and electron beams
E Yilmaz, A Kahraman, AM McGarrigle, N Vasovic, D Yegen, A Jaksic
Applied Radiation and Isotopes 127, 156-160, 2017
342017
Influences of Co-60 gamma-ray irradiation on electrical characteristics of Al2O3 MOS capacitors
S Kaya, E Yilmaz
Journal of Radioanalytical and Nuclear Chemistry 302, 425-431, 2014
342014
Bilgi toplumuna geçiş ve siber güvenlik
E Yılmaz, H Ulus, S Gönen
Bilişim Teknolojileri Dergisi 8 (3), 133, 2015
332015
Structural characterization and electrical properties of Nd2O3 by sol–gel method
R Lok, E Budak, E Yilmaz
Journal of Materials Science: Materials in Electronics 31 (4), 3111-3118, 2020
312020
Surface morphology and depth profile study of Cd1− xZnxTe alloy nanostructures
E Yilmaz, E Tuğay, A Aktağ, I Yildiz, M Parlak, R Turan
Journal of alloys and compounds 545, 90-98, 2012
302012
A detailed study on the frequency-dependent electrical characteristics of Al/HfSiO4/p-Si MOS capacitors
R Lok, S Kaya, H Karacali, E Yilmaz
Journal of Materials Science: Materials in Electronics 27, 13154-13160, 2016
292016
Effects of substrate temperature on the microstructure and morphology of CdZnTe thin films
H Malkas, S Kaya, E Yilmaz
Journal of electronic materials 43, 4011-4017, 2014
292014
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Articole 1–20