Bayesian accelerated life test plans for series systems with Weibull component lifetimes S Roy Applied Mathematical Modelling 62, 383-403, 2018 | 33 | 2018 |
Bayesian accelerated life testing under competing log-location-scale family of causes of failure C Mukhopadhyay, S Roy Computational Statistics 31 (1), 89-119, 2016 | 21 | 2016 |
Bayesian optimum life testing plans under progressive Type‐I interval censoring scheme S Roy, B Pradhan Quality and Reliability Engineering International 33 (8), 2727-2737, 2017 | 16 | 2017 |
Understanding the effect of contextual factors and decision making on team performance in Twenty20 cricket: an interpretable machine learning approach P Puram, S Roy, D Srivastav, A Gurumurthy Annals of Operations Research 325 (1), 261-288, 2023 | 14 | 2023 |
Maximum likelihood analysis of multi-stress accelerated life test data of series systems with competing log-normal causes of failure S Roy, C Mukhopadhyay Proceedings of the Institution of Mechanical Engineers, Part O: Journal of …, 2015 | 13 | 2015 |
Bayesian accelerated life testing under competing Weibull causes of failure S Roy, C Mukhopadhyay Communications in Statistics-Theory and Methods 43 (10-12), 2429-2451, 2014 | 12 | 2014 |
Bayesian C-optimal life testing plans under progressive type-I interval censoring scheme S Roy, B Pradhan Applied Mathematical Modelling 70, 299-314, 2019 | 11 | 2019 |
Squamous cell carcinoma and dental implants: a systematic review of case reports S Jeelani, E Rajkumar, GG Mary, PA Khan, H Gopal, S Roy, ... Journal of Pharmacy and Bioallied Sciences 7 (Suppl 2), S378-S380, 2015 | 11 | 2015 |
Optimum reliability acceptance sampling plan using Type-I generalized hybrid censoring scheme for products under warranty JB Chakrabarty, S Chowdhury, S Roy International Journal of Quality & Reliability Management 38 (3), 780-799, 2021 | 10 | 2021 |
Inference based on progressive type I interval censored data from log-normal distribution S Roy, EV Gijo, B Pradhan Communications in Statistics-Simulation and Computation 46 (8), 6495-6512, 2017 | 9 | 2017 |
Bayesian D-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure S Roy, C Mukhopadhyay Journal of Applied Statistics 43 (8), 1477-1493, 2016 | 9 | 2016 |
Forecasting day-ahead price of electricity–a dynamic regression approach A Bandyopadhayay, S Roy, D Ghosh International Journal of Business Excellence 6 (5), 584-604, 2013 | 9 | 2013 |
Optimum life test plan for Type-I hybrid censored Weibull distributed products sold under general rebate warranty JB Chakrabarty, S Chowdhury, S Roy International Journal of Production Research 58 (18), 5693-5706, 2020 | 8 | 2020 |
Estimation of P(X<Y) for generalized half logistic distribution based on Type-II censored data S Roy, B Pradhan, EV Gijo International Journal of Quality & Reliability Management 34 (7), 1111-1122, 2017 | 8 | 2017 |
On inference and design under progressive type-I interval censoring scheme for inverse Gaussian lifetime model S Roy, B Pradhan, A Purakayastha International Journal of Quality & Reliability Management 39 (8), 1937-1962, 2022 | 6 | 2022 |
Transformation from Traditional to Digital Marketing Communications: A Case Study on Parle-G Brand M Nandy, SS Roy Adhyayan: A Journal of Management Sciences 12 (01), 51-65, 2022 | 3 | 2022 |
In vitro regeneration and hardening of plantlets through seed culture in Spathoglottis plicata Blume S Roy, AK Biswas, N Kalyani In Vitro Culture, Transformation and Molecular Markers for Crop Improvement …, 2004 | 3 | 2004 |
Treatment compliance and outcome in geriatric patients with locally advanced non-small cell lung cancer: Experience from India S Pathy, S Roy, PS Malik, BK Mohanti, V Raina European Journal of Cancer 1 (72), S183, 2017 | 2 | 2017 |
Inference for the Component and System Lifetime Distribution of ak-unit Parallel System Based on System Data B Pradhan, S Roy, MZ Anis Communications in Statistics-Simulation and Computation 43 (1), 45-61, 2014 | 2 | 2014 |
Bayesian accelerated life testing under competing exponential causes of failure S Roy, C Mukhopadhyay Quality and reliability engineering—recent trends and future directions …, 2013 | 2 | 2013 |