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Changsoo Kim
Changsoo Kim
Подтвержден адрес электронной почты в домене kriss.re.kr
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Процитировано
Процитировано
Год
Antiferromagnetic coupling of van der Waals ferromagnetic Fe3GeTe2
D Kim, S Park, J Lee, J Yoon, S Joo, T Kim, K Min, SY Park, C Kim, ...
Nanotechnology 30 (24), 245701, 2019
822019
Label adherence for non-vitamin K antagonist oral anticoagulants in a prospective cohort of Asian patients with atrial fibrillation
SR Lee, YS Lee, JS Park, MJ Cha, TH Kim, J Park, JK Park, JM Lee, ...
Yonsei medical journal 60 (3), 277, 2019
792019
Distinct handedness of spin wave across the compensation temperatures of ferrimagnets
C Kim, S Lee, HG Kim, JH Park, KW Moon, JY Park, JM Yuk, KJ Lee, ...
Nature Materials 19 (9), 980-985, 2020
662020
Characterization of tantalum nitride thin films deposited on SiO2∕ Si substrates using dc magnetron sputtering for thin film resistors
ND Cuong, DJ Kim, BD Kang, CS Kim, KM Yu, SG Yoon
Journal of The Electrochemical Society 153 (2), G164, 2006
602006
Existence of in-plane magnetic skyrmion and its motion under current flow
KW Moon, J Yoon, C Kim, C Hwang
Physical review applied 12 (6), 064054, 2019
562019
Effects of barrier growth temperature on the properties of InGaN/GaN multi-quantum wells
S Kim, K Lee, K Park, CS Kim
Journal of crystal growth 247 (1-2), 62-68, 2003
502003
Sea-urchin-like iron oxide nanostructures for water treatment
HU Lee, SC Lee, YC Lee, S Vrtnik, C Kim, SG Lee, YB Lee, B Nam, ...
Journal of hazardous materials 262, 130-136, 2013
472013
Efficient visible-light responsive TiO2 nanoparticles incorporated magnetic carbon photocatalysts
HU Lee, G Lee, JC Park, YC Lee, SM Lee, B Son, SY Park, C Kim, SG Lee, ...
Chemical Engineering Journal 240, 91-98, 2014
442014
Characterizations of high resistivity TiNxOy thin films for applications in thin film resistors
ND Cuong, DJ Kim, BD Kang, CS Kim, SG Yoon
Microelectronics Reliability 47 (4-5), 752-754, 2007
432007
β-CuGaO2 as a Strong Candidate Material for Efficient Ferroelectric Photovoltaics
S Song, D Kim, HM Jang, BC Yeo, SS Han, CS Kim, JF Scott
Chemistry of Materials 29 (17), 7596-7603, 2017
412017
Field‐free switching of magnetization by tilting the perpendicular magnetic anisotropy of Gd/Co multilayers
HJ Kim, KW Moon, BX Tran, S Yoon, C Kim, S Yang, JH Ha, K An, TS Ju, ...
Advanced Functional Materials 32 (26), 2112561, 2022
352022
Effect of chromium concentration on the electrical properties of NiCr thin films resistor deposited at room temperature by magnetron cosputtering technique
NM Phuong, DJ Kim, BD Kang, CS Kim, SG Yoon
Journal of the Electrochemical Society 153 (1), G27, 2005
342005
Compositional analysis of In-rich InGaN layers grown on GaN templates by metalorganic chemical vapor deposition
HJ Kim, Y Shin, SY Kwon, HJ Kim, S Choi, S Hong, CS Kim, JW Yoon, ...
Journal of Crystal Growth 310 (12), 3004-3008, 2008
312008
Influence of SiN buffer layer in GaN epilayers
SE Park, SM Lim, CR Lee, CS Kim, O Byungsung
Journal of Crystal Growth 249 (3-4), 487-491, 2003
312003
Characteristics of Mg-doped GaN epilayers grown with the variation of Mg incorporation
CR Lee, JY Leem, SK Noh, SE Park, JI Lee, CS Kim, SJ Son, KY Leem
Journal of crystal growth 193 (3), 300-304, 1998
311998
Electrical generation and deletion of magnetic skyrmion‐bubbles via vertical current injection
S Yang, KW Moon, TS Ju, C Kim, HJ Kim, J Kim, BX Tran, JI Hong, ...
Advanced Materials 33 (45), 2104406, 2021
282021
Evaluation method for fieldlike-torque efficiency by modulation of the resonance field
C Kim, D Kim, BS Chun, KW Moon, C Hwang
Physical Review Applied 9 (5), 054035, 2018
242018
Universal method for magnetic skyrmion bubble generation by controlling the stripe domain instability
KW Moon, S Yang, TS Ju, C Kim, BS Chun, S Park, C Hwang
NPG Asia Materials 13 (1), 20, 2021
232021
Structural and electrical properties of Bi1. 5Mg1. 0Nb1. 5O7 thin films deposited on Pt/TiO2/SiO2/Si substrates by rf-magnetron sputtering
JK Ahn, ND Cuong, SG Yoon, CS Kim
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
222008
Effect of annealing temperature on structural and electrical properties of tantalum nitride thin film resistors deposited on SiO2∕ Si substrates by dc sputtering technique
ND Cuong, NM Phuong, DJ Kim, BD Kang, CS Kim, SG Yoon
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2006
212006
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Статьи 1–20