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R F Egerton
R F Egerton
Emeritus Professor, University of Alberta
Подтвержден адрес электронной почты в домене ualberta.ca - Главная страница
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Год
Electron energy-loss spectroscopy in the electron microscope
RF Egerton
Springer Science & Business Media, 2011
75102011
Radiation damage in the TEM and SEM
RF Egerton, P Li, M Malac
Micron 35 (6), 399-409, 2004
24902004
Physical principles of electron microscopy
RF Egerton
Springer, 2005
21352005
Electron energy-loss spectroscopy in the TEM
RF Egerton
Reports on Progress in Physics 72 (1), 016502, 2008
11162008
EELS log‐ratio technique for specimen‐thickness measurement in the TEM
T Malis, SC Cheng, RF Egerton
Journal of electron microscopy technique 8 (2), 193-200, 1988
10521988
Vibrational spectroscopy in the electron microscope
OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209-212, 2014
8082014
Energy-filtering transmission electron microscopy
C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ...
Springer, 2013
4522013
Control of radiation damage in the TEM
RF Egerton
Ultramicroscopy 127, 100-108, 2013
4132013
Radiation damage to organic and inorganic specimens in the TEM
RF Egerton
Micron 119, 72-87, 2019
3902019
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
RF Egerton
Microscopy research and technique 75 (11), 1550-1556, 2012
3322012
Basic questions related to electron-induced sputtering in the TEM
RF Egerton, R McLeod, F Wang, M Malac
Ultramicroscopy 110 (8), 991-997, 2010
3012010
K-shell ionization cross-sections for use in microanalysis
RF Egerton
Ultramicroscopy 4 (2), 169-179, 1979
2811979
Inelastic scattering of 80 keV electrons in amorphous carbon
RF Egerton
Philosophical Magazine 31 (1), 199-215, 1975
2281975
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy
RF Egerton
Ultramicroscopy 107 (8), 575-586, 2007
2242007
Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements
O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ...
Physical Review B—Condensed Matter and Materials Physics 71 (3), 035204, 2005
2152005
Formulae for light-element micro analysis by electron energy-loss spectrometry
RF Egerton
Ultramicroscopy 3, 243-251, 1978
2021978
Measurement of local thickness by electron energy-loss spectroscopy
RF Egerton, SC Cheng
Ultramicroscopy 21 (3), 231-244, 1987
1921987
Choice of operating voltage for a transmission electron microscope
RF Egerton
Ultramicroscopy 145, 85-93, 2014
1882014
Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology
O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ...
Journal of Applied Physics 98 (3), 2005
1692005
Fabrication of submicrometer regular arrays of pillars and helices
M Malac, RF Egerton, MJ Brett, B Dick
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
1491999
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