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Angeliki Tserepi
Angeliki Tserepi
NCSR Demokritos
Подтвержден адрес электронной почты в домене inn.demokritos.gr
Название
Процитировано
Процитировано
Год
Mechanisms of oxygen plasma nanotexturing of organic polymer surfaces: from stable super hydrophilic to super hydrophobic surfaces
K Tsougeni, N Vourdas, A Tserepi, E Gogolides, C Cardinaud
Langmuir 25 (19), 11748-11759, 2009
4122009
Durable superhydrophobic and superamphiphobic polymeric surfaces and their applications: A review
K Ellinas, A Tserepi, E Gogolides
Advances in colloid and interface science 250, 132-157, 2017
2772017
From superamphiphobic to amphiphilic polymeric surfaces with ordered hierarchical roughness fabricated with colloidal lithography and plasma nanotexturing
K Ellinas, A Tserepi, E Gogolides
Langmuir 27 (7), 3960-3969, 2011
2642011
Hierarchical micro and nano structured, hydrophilic, superhydrophobic and superoleophobic surfaces incorporated in microfluidics, microarrays and lab on chip microsystems
E Gogolides, K Ellinas, A Tserepi
Microelectronic Engineering 132, 135-155, 2015
2422015
Nanotexturing of poly (dimethylsiloxane) in plasmas for creating robust super-hydrophobic surfaces
AD Tserepi, ME Vlachopoulou, E Gogolides
Nanotechnology 17 (15), 3977, 2006
2362006
“Smart” polymeric microfluidics fabricated by plasma processing: controlled wetting, capillary filling and hydrophobic valving
K Tsougeni, D Papageorgiou, A Tserepi, E Gogolides
Lab on a Chip 10 (4), 462-469, 2010
2102010
Nanotextured super-hydrophobic transparent poly (methyl methacrylate) surfaces using high-density plasma processing
N Vourdas, A Tserepi, E Gogolides
Nanotechnology 18 (12), 125304, 2007
2102007
A low temperature surface modification assisted method for bonding plastic substrates
ME Vlachopoulou, A Tserepi, P Pavli, P Argitis, M Sanopoulou, ...
Journal of Micromechanics and Microengineering 19 (1), 015007, 2008
2062008
Plasma micro-nanotextured, scratch, water and hexadecane resistant, superhydrophobic, and superamphiphobic polymeric surfaces with perfluorinated monolayers
K Ellinas, SP Pujari, DA Dragatogiannis, CA Charitidis, A Tserepi, ...
ACS applied materials & interfaces 6 (9), 6510-6524, 2014
2042014
Validation of actinometry for estimating relative hydrogen atom densities and electron energy evolution in plasma assisted diamond deposition reactors
A Gicquel, M Chenevier, K Hassouni, A Tserepi, M Dubus
Journal of applied physics 83 (12), 7504-7521, 1998
1751998
All-plastic, low-power, disposable, continuous-flow PCR chip with integrated microheaters for rapid DNA amplification
D Moschou, N Vourdas, G Kokkoris, G Papadakis, J Parthenios, ...
Sensors and Actuators B: Chemical 199, 470-478, 2014
1692014
The lab-on-PCB approach: tackling the μTAS commercial upscaling bottleneck
D Moschou, A Tserepi
Lab on a Chip 17 (8), 1388-1405, 2017
1542017
Controlling roughness: from etching to nanotexturing and plasma-directed organization on organic and inorganic materials
E Gogolides, V Constantoudis, G Kokkoris, D Kontziampasis, K Tsougeni, ...
Journal of Physics D: Applied Physics 44 (17), 174021, 2011
1502011
Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors
V Constantoudis, GP Patsis, A Tserepi, E Gogolides
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
1502003
Thermal properties of suspended porous silicon micro-hotplates for sensor applications
C Tsamis, AG Nassiopoulou, A Tserepi
Sensors and Actuators B: Chemical 95 (1-3), 78-82, 2003
1362003
Control of Nanotexture and Wetting Properties of Polydimethylsiloxane from Very Hydrophobic to Super‐Hydrophobic by Plasma Processing
K Tsougeni, A Tserepi, G Boulousis, V Constantoudis, E Gogolides
Plasma Processes and Polymers 4 (4), 398-405, 2007
1342007
Is there a threshold in the antibacterial action of superhydrophobic surfaces?
K Ellinas, D Kefallinou, K Stamatakis, E Gogolides, A Tserepi
ACS applied materials & interfaces 9 (45), 39781-39789, 2017
1262017
A review of line edge roughness and surface nanotexture resulting from patterning processes
E Gogolides, V Constantoudis, GP Patsis, A Tserepi
Microelectronic Engineering 83 (4-9), 1067-1072, 2006
1122006
Quantification of line-edge roughness of photoresists. I. A comparison between off-line and on-line analysis of top-down scanning electron microscopy images
GP Patsis, V Constantoudis, A Tserepi, E Gogolides, G Grozev
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
1022003
Biomimetic, antireflective, superhydrophobic and oleophobic PMMA and PMMA-coated glass surfaces fabricated by plasma processing
D Kontziampasis, G Boulousis, A Smyrnakis, K Ellinas, A Tserepi, ...
Microelectronic Engineering 121, 33-38, 2014
932014
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