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Ricardo Augusto da Luz Reis
Ricardo Augusto da Luz Reis
UFRGS
Подтвержден адрес электронной почты в домене inf.ufrgs.br
Название
Процитировано
Процитировано
Год
Fault-tolerance techniques for SRAM-based FPGAs
FL Kastensmidt, L Carro, RA da Luz Reis
Springer, 2006
3512006
Radiation effects on embedded systems
R Velazco, P Fouillat, R Reis
Springer Science & Business Media, 2007
2082007
Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Proceedings of the 40th annual Design Automation Conference, 650-655, 2003
2052003
Designing fault-tolerant techniques for SRAM-based FPGAs
FG de Lima Kastensmidt, G Neuberger, RF Hentschke, L Carro, R Reis
IEEE Design & Test of Computers 21 (6), 552-562, 2004
1762004
A fault injection analysis of Virtex FPGA TMR design methodology
F Lima, C Carmichael, J Fabula, R Padovani, R Reis
RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on …, 2001
1752001
Analyzing area and performance penalty of protecting different digital modules with Hamming code and triple modular redundancy
R Hentschke, F Marques, F Lima, L Carro, A Susin, R Reis
Proceedings. 15th Symposium on Integrated Circuits and Systems Design, 95-100, 2002
1602002
A multiple bit upset tolerant SRAM memory
G Neuberger, F De Lima, L Carro, R Reis
ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4 …, 2003
952003
Design of regular layouts to improve predictability
C Menezes, C Meinhardt, R Reis, R Tavares
2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006
912006
An automatic technique for optimizing Reed-Solomon codes to improve fault tolerance in memories
G Neuberger, FG de Lima Kastensmidt, R Reis
IEEE Design & Test of Computers 22 (1), 50-58, 2005
752005
An Effective Method for Simultaneous Gate Sizing and Vth Assignment using Lagrangian Relaxation
Flach, Reimann, Posser, Johann, Reis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
652014
An Effective Method for Simultaneous Gate Sizing and Vth Assignment using Lagrangian Relaxation
R FLACH, G., REIMANN, T., POSSER, G., JOHANN, G., REIS
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 33, 2014
652014
Predictive Evaluation of Electrical Characteristics of Sub-22nm Finfet Technologies Under Device Geometry Variations
R MEINHARDT, C., ZIMPECK, A., REIS
Microelectronics Reliability 54, 2014
642014
Designing and testing fault-tolerant techniques for sram-based fpgas
FL Kastensmidt, G Neuberger, L Carro, R Reis
Proceedings of the 1st conference on Computing frontiers, 419-432, 2004
632004
Circuit Design for Reliability
G REIS, R., CAO, Y., WIRTH
Springer, 2015
602015
Circuit Design for Reliability
G REIS, R., CAO, Y., WIRTH
Springer, 2015
602015
A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability
F Rosa, F Kastensmidt, R Reis, L Ost
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2015
542015
Using machine learning techniques to evaluate multicore soft error reliability
FR da Rosa, R Garibotti, L Ost, R Reis
IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2151-2164, 2019
532019
A low-cost solution for deploying processor cores in harsh environments
M Violante, C Meinhardt, R Reis, MS Reorda
IEEE Transactions on Industrial Electronics 58 (7), 2617-2626, 2011
512011
Low power 3–2 and 4–2 adder compressors implemented using ASTRAN
J Tonfat, R Reis
2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2012
482012
On the evolution of remote laboratories for prototyping digital electronic systems
LS Indrusiak, M Glesner, R Reis
IEEE Transactions on Industrial Electronics 54 (6), 3069-3077, 2007
482007
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