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Vasileios Tenentes
Vasileios Tenentes
Associate Professor, University of Ioannina
Подтвержден адрес электронной почты в домене arm.com
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Процитировано
Процитировано
Год
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards and Earth System Science 14 (1), 143-153, 2014
922014
Aging Benefits in Nanometer CMOS Designs
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017
422017
Reliable power gating with NBTI aging benefits
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016
312016
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008
302008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
292010
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
272017
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
232010
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating
D Rossi, V Tenentes, S Khursheed, B Al-Hashimi
20th IEEE European Test Symposium (ETS 2015), 2015
202015
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories
D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi
IEEE international on-Line testing symposium (IOLTS'15), 2015
192015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011
182011
High-quality statistical test compression with narrow ATE interface
V Tenentes, X Kavousianos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
172013
Exploiting aging benefits for the design of reliable drowsy cache memories
D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018
132018
BTI aware thermal management for reliable DVFS designs
H Chahal, V Tenentes, D Rossi, BM Al-Hashimi
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016
132016
Recycled IC detection through aging sensor
D Rossi, V Tenentes, S Khursheed, SM Reddy
2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018
102018
High quality testing of grid style power gating
V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang
2014 IEEE 23rd Asian Test Symposium, 186-191, 2014
102014
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards Earth Systems Science Discussion 1, 4777-4800, 2013
102013
Low power test-compression for high test-quality and low test-data volume
V Tenentes, X Kavousianos
2011 Asian Test Symposium, 46-53, 2011
102011
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
V Tenentes, X Kavousianos
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 747-754, 2011
102011
MeV ion event observed at 0950 UT on 4 May 1998 at a quasi‐perpendicular bow shock region: New observations and an alternative interpretation on its origin
GC Anagnostopoulos, V Tenentes, ES Vassiliadis
Journal of Geophysical Research: Space Physics 114 (A9), 2009
82009
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology
B Halak, V Tenentes, D Rossi
Microelectronics Reliability 67, 74-81, 2016
72016
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