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Vincent PAILLARD
Vincent PAILLARD
Université de Toulouse
Подтвержден адрес электронной почты в домене cemes.fr
Название
Процитировано
Процитировано
Год
Photoluminescence properties of silicon nanocrystals as a function of their size
G Ledoux, O Guillois, D Porterat, C Reynaud, F Huisken, B Kohn, ...
Physical Review B 62 (23), 15942, 2000
6402000
Improved one-phonon confinement model for an accurate size determination of silicon nanocrystals
V Paillard, P Puech, MA Laguna, R Carles, B Kohn, F Huisken
Journal of Applied Physics 86 (4), 1921-1924, 1999
3421999
From free clusters to cluster-assembled materials
P Melinon, V Paillard, V Dupuis, A Perez, P Jensen, A Hoareau, JP Perez, ...
International journal of modern physics B 9 (04n05), 339-397, 1995
3281995
Deposition of SiO2 and TiO2 thin films by plasma enhanced chemical vapor deposition for antireflection coating
C Martinet, V Paillard, A Gagnaire, J Joseph
Journal of Non-Crystalline Solids 216, 77-82, 1997
2401997
Photoluminescence and resonant Raman spectra of silicon films produced by size-selected cluster beam deposition
M Ehbrecht, B Kohn, F Huisken, MA Laguna, V Paillard
Physical Review B 56 (11), 6958, 1997
2331997
Engineering strained silicon on insulator wafers with the Smart CutTM technology
B Ghyselen, JM Hartmann, T Ernst, C Aulnette, B Osternaud, ...
Solid-state electronics 48 (8), 1285-1296, 2004
1652004
Diamondlike carbon films obtained by low energy cluster beam deposition: evidence of a memory effect of the properties of free carbon clusters
V Paillard, P Melinon, V Dupuis, JP Perez, A Perez, B Champagnon
Physical review letters 71 (25), 4170, 1993
1571993
Evolutionary multi-objective optimization of colour pixels based on dielectric nanoantennas
PR Wiecha, A Arbouet, C Girard, A Lecestre, G Larrieu, V Paillard
Nature nanotechnology 12 (2), 163-169, 2017
1462017
Stress measurements of germanium nanocrystals embedded in silicon oxide
A Wellner, V Paillard, C Bonafos, H Coffin, A Claverie, B Schmidt, ...
Journal of Applied Physics 94 (9), 5639-5642, 2003
1402003
Silicon as a candidate carrier for ERE
G Ledoux, M Ehbrecht, O Guillois, F Huisken, B Kohn, M Laguna, ...
Astronomy and Astrophysics-A&A 333, 39-42, 1998
1201998
Damping of the acoustic vibrations of individual gold nanoparticles
R Marty, A Arbouet, C Girard, A Mlayah, V Paillard, VK Lin, SL Teo, ...
Nano letters 11 (8), 3301-3306, 2011
1022011
Structured films of light-emitting silicon nanoparticles produced by cluster beam deposition
F Huisken, B Kohn, V Paillard
Applied physics letters 74 (25), 3776-3778, 1999
871999
Resonant Raman scattering in polycrystalline silicon thin films
V Paillard, P Puech, MA Laguna, P Temple-Boyer, B Caussat, JP Couderc, ...
Applied physics letters 73 (12), 1718-1720, 1998
861998
Strongly directional scattering from dielectric nanowires
PR Wiecha, A Cuche, A Arbouet, C Girard, G Colas des Francs, ...
ACS photonics 4 (8), 2036-2046, 2017
842017
Experimental study of LO phonons and excitons in ZnO nanoparticles produced by room-temperature organometallic synthesis
F Demangeot, V Paillard, PM Chassaing, ML Kahn, A Maisonnat, ...
Applied physics letters 88 (7), 2006
792006
Production of diamondlike carbon films through random compact cluster stacking
V Paillard, P Melinon, V Dupuis, A Perez, JP Perez, G Guiraud, ...
Physical Review B 49 (16), 11433, 1994
711994
Surface optical phonons as a probe of organic ligands on ZnO nanoparticles: An investigation using a dielectric continuum model and Raman spectrometry
PM Chassaing, F Demangeot, V Paillard, A Zwick, N Combe, C Pages, ...
Physical Review B—Condensed Matter and Materials Physics 77 (15), 153306, 2008
702008
Magnetic properties of nanostructured iron films obtained by low energy neutral cluster beam deposition
JP Perez, V Dupuis, J Tuaillon, A Perez, V Paillard, P Melinon, M Treilleux, ...
Journal of magnetism and magnetic materials 145 (1-2), 74-80, 1995
691995
Observations of confined acoustic phonons in silicon membranes
CMS Torres, A Zwick, F Poinsotte, J Groenen, M Prunnila, J Ahopelto, ...
physica status solidi (c) 1 (11), 2609-2612, 2004
672004
Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry
V Paillard, P Puech, R Sirvin, S Hamma, P Roca i Cabarrocas
Journal of Applied Physics 90 (7), 3276-3279, 2001
672001
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Статьи 1–20