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Patrick Vandewalle
Patrick Vandewalle
Associate Professor, KU Leuven
Подтвержден адрес электронной почты в домене kuleuven.be - Главная страница
Название
Процитировано
Процитировано
Год
A frequency domain approach to registration of aliased images with application to super-resolution
P Vandewalle, S Süsstrunk, M Vetterli
EURASIP Journal on applied signal processing 2006, 233-233, 2006
7452006
Reproducible research in signal processing
P Vandewalle, J Kovačević, M Vetterli
Signal Processing Magazine, IEEE 26 (3), 37-47, 2009
3862009
Super-resolution from unregistered and totally aliased signals using subspace methods
P Vandewalle, L Sbaiz, J Vandewalle, M Vetterli
IEEE Transactions on Signal Processing 55 (7), 3687-3703, 2007
1522007
Code Sharing Is Associated with Research Impact in Image Processing
P Vandewalle
Computing in Science & Engineering 14 (4), 42-47, 2012
982012
Superresolution images reconstructed from aliased images
P Vandewalle, S Susstrunk, M Vetterli
SPIE/IS&T visual communication and image processing conference 5150, 1398-1405, 2003
832003
Super-resolution from unregistered aliased images
P Vandewalle
Ecole Polytechnique Fédérale de Lausanne, 2006
532006
How to take advantage of aliasing in bandlimited signals
P Vandewalle, L Sbaiz, J Vandewalle, M Vetterli
Acoustics, Speech, and Signal Processing, 2004. Proceedings.(ICASSP'04 …, 2004
452004
Automatic red-eye removal based on sclera and skin tone detection
F Volken, J Terrier, P Vandewalle
Conference on Colour in Graphics, Imaging, and Vision 2006 (1), 359-364, 2006
402006
Super-resolution from highly undersampled images
P Vandewalle, L Sbaiz, M Vetterli, S Sustrunk
IEEE International Conference on Image Processing 2005 1, I-889-92, 2005
402005
Display-independent 3D-TV production and delivery using the layered depth video format
B Bartczak, P Vandewalle, O Grau, G Briand, J Fournier, P Kerbiriou, ...
IEEE Transactions on Broadcasting 57 (2), 477-490, 2011
382011
Double resolution from a set of aliased images
P Vandewalle, S Süsstrunk, M Vetterli
SPIE/IS&T Electronic Imaging Conference 5301, 2004.128-135, 2004
382004
Depth Estimation From Monocular Images And Sparse Radar Using Deep Ordinal Regression Network
CC Lo, P Vandewalle
2021 IEEE International Conference on Image Processing (ICIP), 3343-3347, 2021
372021
Deep learning based porosity segmentation in X-ray CT measurements of polymer additive manufacturing parts
S Bellens, P Vandewalle, W Dewulf
Procedia CIRP 96, 336-341, 2021
372021
Joint demosaicing and super-resolution imaging from a set of unregistered aliased images
P Vandewalle, K Krichane, D Alleysson, S Süsstrunk
IS&T/SPIE Electronic Imaging: Digital Photography III 6502, 2007
372007
Evaluating conventional and deep learning segmentation for fast X-ray CT porosity measurements of polymer laser sintered AM parts
S Bellens, GM Probst, M Janssens, P Vandewalle, W Dewulf
Polymer Testing 110, 107540, 2022
252022
Modelling of facial soft tissue growth for maxillofacial surgery planning environments
P Vandewalle, F Schutyser, J Van Cleynenbreugel, P Suetens
International Symposium on Surgery Simulation and Soft Tissue Modeling, 27-37, 2003
242003
Semantic Extraction of Permanent Structures for the Reconstruction of Building Interiors from Point Clouds
I Coudron, S Puttemans, T Goedemé, P Vandewalle
Sensors 20 (23), 6916, 2020
172020
Groebner basis methods for multichannel sampling with unknown offsets
L Sbaiz, P Vandewalle, M Vetterli
Applied and Computational Harmonic Analysis 25 (3), 277-294, 2008
152008
Experiences with reproducible research in various facets of signal processing research
P Vandewalle, G Barrenetxea, I Jovanovic, A Ridolfi, M Vetterli
2007 IEEE International Conference on Acoustics, Speech and Signal …, 2007
152007
Multidimensional image enhancement from a set of unregistered and differently exposed images
AA Rad, L Meylan, P Vandewalle, S Süsstrunk
Proc. IS&T/SPIE Electronic Imaging: Computational Imaging V 6498, 3, 2007
152007
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Статьи 1–20