Polarity control in double-gate, gate-all-around vertically stacked silicon nanowire FETs M De Marchi, D Sacchetto, S Frache, J Zhang, PE Gaillardon, Y Leblebici, ... Electron Devices Meeting (IEDM), 2012 IEEE International, 8.4. 1-8.4. 4, 2012 | 338 | 2012 |
Configurable logic gates using polarity-controlled silicon nanowire gate-all-around FETs M De Marchi, J Zhang, S Frache, D Sacchetto, PE Gaillardon, Y Leblebici, ... IEEE Electron Device Letters 35 (8), 880-882, 2014 | 129 | 2014 |
Top–Down Fabrication of Gate-All-Around Vertically Stacked Silicon Nanowire FETs With Controllable Polarity M De Marchi, D Sacchetto, J Zhang, S Frache, PE Gaillardon, Y Leblebici, ... IEEE Transactions on Nanotechnology 13 (6), 1029-1038, 2014 | 115 | 2014 |
A charge-based model for long-channel cylindrical surrounding-gate MOSFETs from intrinsic channel to heavily doped body F Liu, J He, L Zhang, J Zhang, J Hu, C Ma, M Chan IEEE transactions on electron devices 55 (8), 2187-2194, 2008 | 98 | 2008 |
Configurable circuits featuring dual-threshold-voltage design with three-independent-gate silicon nanowire FETs J Zhang, X Tang, PE Gaillardon, G De Micheli IEEE Transactions on Circuits and Systems I: Regular Papers 61 (10), 2851-2861, 2014 | 95 | 2014 |
Polarity-controllable silicon nanowire transistors with dual threshold voltages J Zhang, M De Marchi, D Sacchetto, PE Gaillardon, Y Leblebici, ... IEEE Transactions on Electron Devices 61 (11), 3654-3660, 2014 | 91 | 2014 |
A Schottky-barrier silicon FinFET with 6.0 mV/dec subthreshold slope over 5 decades of current J Zhang, M De Marchi, PE Gaillardon, G De Micheli Electron Devices Meeting (IEDM), 2014 IEEE International, 13.4. 1-13.4. 4, 2014 | 77 | 2014 |
Dual-threshold-voltage configurable circuits with three-independent-gate silicon nanowire FETs J Zhang, PE Gaillardon, G De Micheli Circuits and Systems (ISCAS), 2013 IEEE International Symposium on, 2111-2114, 2013 | 54 | 2013 |
A non-charge-sheet analytic model for symmetric double-gate MOSFETs with smooth transition between partially and fully depleted operation modes F Liu, J He, J Zhang, Y Chen, M Chan IEEE transactions on electron devices 55 (12), 3494-3502, 2008 | 51 | 2008 |
Advanced system on a chip design based on controllable-polarity FETs PE Gaillardon, L Amaru, J Zhang, G De Micheli Proceedings of the conference on Design, Automation & Test in Europe, 235, 2014 | 50 | 2014 |
A carrier-based approach for compact modeling of the long-channel undoped symmetric double-gate MOSFETs J He, F Liu, J Zhang, J Feng, J Hu, S Yang, M Chan IEEE transactions on electron devices 54 (5), 1203-1209, 2007 | 45 | 2007 |
Power-Gated Differential Logic Style Based on Double-Gate Controllable-Polarity Transistors L Amarú, PE Gaillardon, J Zhang, G De Micheli IEEE Transactions on Circuits and Systems II: Express Briefs 60 (10), 672-676, 2013 | 43 | 2013 |
An approximate carrier-based compact model for fully depleted surrounding-gate MOSFETs with a finite doping body J He, F Liu, W Bian, J Feng, J Zhang, X Zhang Semiconductor science and technology 22 (6), 671, 2007 | 33 | 2007 |
Effects of body doping on threshold voltage and channel potential of symmetric DG MOSFETs with continuous solution from accumulation to strong-inversion regions F Liu, L Zhang, J Zhang, J He, M Chan Semiconductor Science and Technology 24 (8), 085005, 2009 | 30 | 2009 |
A charge-based compact model for predicting the current–voltage and capacitance–voltage characteristics of heavily doped cylindrical surrounding-gate MOSFETs F Liu, J Zhang, F He, F Liu, L Zhang, M Chan Solid-State Electronics 53 (1), 49-53, 2009 | 27 | 2009 |
TSPC flip-flop circuit design with three-independent-gate silicon nanowire FETs X Tang, J Zhang, PE Gaillardon, G De Micheli 2014 IEEE International Symposium on Circuits and Systems (ISCAS), 1660-1663, 2014 | 21 | 2014 |
Process/design co-optimization of regular logic tiles for double-gate silicon nanowire transistors S Bobba, PE Gaillardon, J Zhang, M De Marchi, D Sacchetto, Y Leblebici, ... 2012 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH …, 2012 | 20 | 2012 |
An analytic model for nanowire MOSFETs with Ge/Si core/shell structure L Zhang, J He, J Zhang, F Liu, Y Fu, Y Song, X Zhang IEEE Transactions on Electron Devices 55 (11), 2907-2917, 2008 | 20 | 2008 |
On Temperature Dependency of Steep Subthreshold Slope in Dual-Independent-Gate FinFET J Zhang, J Trommer, WM Weber, PE Gaillardon, G De Micheli IEEE Journal of the Electron Devices Society 3 (6), 452-456, 2015 | 18 | 2015 |
FinFET: From compact modeling to circuit performance F He, X Zhou, C Ma, J Zhang, Z Liu, W Wu, X Zhang, L Zhang Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International …, 2010 | 17 | 2010 |