| Demonstration of 4.7 kV breakdown voltage in NiO/β-Ga2O3 vertical rectifiers JS Li, CC Chiang, X Xia, TJ Yoo, F Ren, H Kim, SJ Pearton Applied Physics Letters 121 (4), 2022 | 99 | 2022 |
| Annealing temperature dependence of band alignment of NiO/β-Ga2O3 X Xia, JS Li, CC Chiang, TJ Yoo, F Ren, H Kim, SJ Pearton Journal of Physics D: Applied Physics 55 (38), 385105, 2022 | 44 | 2022 |
| Superior high temperature performance of 8 kV NiO/Ga 2 O 3 vertical heterojunction rectifiers JS Li, CC Chiang, X Xia, HH Wan, F Ren, SJ Pearton Journal of Materials Chemistry C 11 (23), 7750-7757, 2023 | 32 | 2023 |
| Effect of drift layer doping and NiO parameters in achieving 8.9 kV breakdown in 100 μm diameter and 4 kV/4 A in 1 mm diameter NiO/β-Ga2O3 rectifiers JS Li, CC Chiang, X Xia, HH Wan, F Ren, SJ Pearton Journal of Vacuum Science & Technology A 41 (4), 2023 | 31 | 2023 |
| Reproducible NiO/Ga2O3 Vertical Rectifiers with Breakdown Voltage > 8 kV JS Li, HH Wan, CC Chiang, X Xia, TJ Yoo, H Kim, F Ren, SJ Pearton Crystals 13 (6), 886, 2023 | 27 | 2023 |
| Deposition of sputtered NiO as a p-type layer for heterojunction diodes with Ga2O3 JS Li, X Xia, CC Chiang, DC Hays, BP Gila, V Craciun, F Ren, SJ Pearton Journal of Vacuum Science & Technology A 41 (1), 2023 | 23 | 2023 |
| Breakdown up to 13.5 kV in NiO/β-Ga2O3 vertical heterojunction rectifiers JS Li, HH Wan, CC Chiang, TJ Yoo, MH Yu, F Ren, H Kim, YT Liao, ... ECS Journal of Solid State Science and Technology 13 (3), 035003, 2024 | 22 | 2024 |
| Temperature dependence of on–off ratio and reverse recovery time in NiO/β-Ga2O3 heterojunction rectifiers JS Li, CC Chiang, X Xia, F Ren, SJ Pearton Journal of Vacuum Science & Technology A 40 (6), 2022 | 22 | 2022 |
| 7.5 kV, 6.2 GW cm− 2 NiO/β-Ga2O3 vertical rectifiers with on–off ratio greater than 1013 JS Li, CC Chiang, X Xia, HH Wan, F Ren, SJ Pearton Journal of Vacuum Science & Technology A 41 (3), 2023 | 19 | 2023 |
| Dynamic switching of 1.9 A/1.76 kV forward current NiO/β-Ga2O3 rectifiers JS Li, CC Chiang, X Xia, CT Tsai, F Ren, YT Liao, SJ Pearton ECS Journal of Solid State Science and Technology 11 (10), 105003, 2022 | 19 | 2022 |
| Detailed simulation of fluid dynamics and heat transfer in coffee bean roaster CC Chiang, DY Wu, DY Kang Journal of food process engineering 40 (2), e12398, 2017 | 17 | 2017 |
| Properties of SiCN films relevant to dental implant applications X Xia, CC Chiang, SK Gopalakrishnan, AV Kulkarni, F Ren, KJ Ziegler, ... Materials 16 (15), 5318, 2023 | 14 | 2023 |
| 1 mm2, 3.6 kV, 4.8 A NiO/Ga2O3 heterojunction rectifiers JS Li, CC Chiang, X Xia, HH Wan, F Ren, SJ Pearton ECS Journal of Solid State Science and Technology 12 (8), 085001, 2023 | 11 | 2023 |
| Reversible total ionizing dose effects in NiO/Ga2O3 heterojunction rectifiers JS Li, CC Chiang, X Xia, S Stepanoff, A Haque, DE Wolfe, F Ren, ... Journal of Applied Physics 133 (1), 2023 | 9 | 2023 |
| Rapid SARS-CoV-2 diagnosis using disposable strips and a metal-oxide-semiconductor field-effect transistor platform CW Chiu, M Xian, JL Stephany, X Xia, CC Chiang, F Ren, CT Tsai, ... Journal of Vacuum Science & Technology B 40 (2), 2022 | 9 | 2022 |
| High sensitivity saliva-based biosensor in detection of breast cancer biomarkers: HER2 and CA15-3 HH Wan, H Zhu, CC Chiang, JS Li, F Ren, CT Tsai, YT Liao, D Neal, ... Journal of Vacuum Science & Technology B 42 (2), 2024 | 8 | 2024 |
| Ion energy dependence of dry etch damage depth in Ga2O3 Schottky rectifiers CC Chiang, X Xia, JS Li, F Ren, SJ Pearton Applied Surface Science 631, 157489, 2023 | 8 | 2023 |
| 15 MeV proton damage in NiO/β-Ga2O3 vertical rectifiers JS Li, CC Chiang, X Xia, HH Wan, J Kim, F Ren, SJ Pearton Journal of Physics: Materials 6 (4), 045003, 2023 | 8 | 2023 |
| An electrolytic conductance cell for use at elevated temperatures and pressures DA Lown, L Wynne-Jones Journal of Scientific Instruments 44 (12), 1037, 1967 | 8 | 1967 |
| The Optimization of NiO Doping, Thickness, and Extension in kV-Class NiO/Ga2O3 Vertical Rectifiers CC Chiang, JS Li, HH Wan, F Ren, SJ Pearton Crystals 13 (7), 1124, 2023 | 7 | 2023 |
Fan RenUniversity of Florida, Bell Lab, AT&TOverená e-mailová adresa na: che.ufl.edu