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Florian Krüger
Florian Krüger
Ďalšie menáFlorian Krueger
Overená e-mailová adresa na: umich.edu
Názov
Citované v
Citované v
Rok
Voltage waveform tailoring in radio frequency plasmas for surface charge neutralization inside etch trenches
F Krüger, S Wilczek, T Mussenbrock, J Schulze
Plasma Sources Science and Technology 28 (7), 075017, 2019
522019
Machine learning plasma-surface interface for coupling sputtering and gas-phase transport simulations
F Krüger, T Gergs, J Trieschmann
Plasma Sources Science and Technology 28 (3), 035002, 2019
392019
Voltage waveform tailoring for high aspect ratio plasma etching of SiO2 using Ar/CF4/O2 mixtures: Consequences of ion and electron distributions on etch profiles
F Krüger, H Lee, SK Nam, MJ Kushner
Journal of Vacuum Science & Technology A 41 (1), 2023
82023
Electric field reversals resulting from voltage waveform tailoring in Ar/O2 capacitively coupled plasmas sustained in asymmetric systems
F Krüger, H Lee, SK Nam, MJ Kushner
Plasma Sources Science and Technology 30 (8), 085002, 2021
82021
Formation and behaviour of plasma spots on the surface of titanium film
P Hermanns, F Kogelheide, V Bracht, S Ries, F Krüger, S Böddeker, ...
Journal of Physics D: Applied Physics 54 (8), 085203, 2020
82020
Voltage waveform tailoring for high aspect ratio plasma etching of SiO2 using Ar/CF4/O2 mixtures: Consequences of low fundamental frequency biases
F Krüger, H Lee, SK Nam, MJ Kushner
Physics of Plasmas 31 (3), 2024
52024
Comparison of glancing-angle scatterings on different materials in a high aspect ratio plasma etching process using molecular dynamics simulation
Y Du, F Krüger, SK Nam, H Lee, S Yoo, J Eapen, MJ Kushner, S Shannon
Journal of Vacuum Science & Technology A 40 (5), 2022
52022
Modeling and Optimization of High Aspect Ratio Plasma Etching
F Krueger
12024
ICP vs CCP in High Aspect Ratio Etching of SiO2 using Ar/C4F8/O2 Gas Mixtures
F Krüger, MJ Kushner, S Shim, H Lee, SK Nam
2020 IEEE International Conference on Plasma Science (ICOPS), 88-88, 2020
12020
Autonomous hybrid optimization of a SiO2 plasma etching mechanism
F Krüger, D Zhang, P Luan, M Park, A Metz, MJ Kushner
Journal of Vacuum Science & Technology A 42 (4), 2024
2024
Automatic Optimization of Reaction Mechanisms in Simulations of High Aspect Ratio Plasma Etching
F Krueger, D Zhang, P Luan, M Oh, M Park, A Metz, M Kushner
APS Annual Gaseous Electronics Meeting Abstracts, GW1. 003, 2023
2023
Voltage Waveform Tailoring in Plasma Etching of Dielectrics to Mitigate Surface Charging Effects
F Krüger, MJ Kushner, H Lee, SK Nam
2022 IEEE International Conference on Plasma Science (ICOPS), 1-1, 2022
2022
Passivation and Redeposition During High Aspect Ratio Etching of p-Si Using HBr Containing Gas Mixtures
MJK Florian Krüger, Hyunjae Lee, Sang Ki Nam
AVS Symposium 67, 2021
2021
Mitigating the effects of surface charging during high aspect ratio plasma etching using voltage waveform tailoring
F Krüger, H Lee, SK Nam, M Kushner
APS Annual Gaseous Electronics Meeting Abstracts, PR22. 004, 2021
2021
Student Excellence Award Finalist: A potential remedy for etched trench deformations based on voltage waveform tailoring and electric field reversal
F Krüger, S Wilczek, T Mussenbock, J Schulze
APS Annual Gaseous Electronics Meeting Abstracts, ET2. 006, 2019
2019
Interface model of plasma-surface interactions using artificial neural networks
F Krueger, T Gergs, T Mussenbrock, J Trieschmann
APS Annual Gaseous Electronics Meeting Abstracts, GT1. 076, 2018
2018
Systém momentálne nemôže vykonať operáciu. Skúste to neskôr.
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