| Design and analysis of a small-scale magnetorheological brake PS Wellborn, JE Mitchell, NJ Pieper, RJ Webster IEEE/ASME Transactions on Mechatronics 27 (5), 3099-3109, 2021 | 33 | 2021 |
| Single-event upset cross-section trends for D-FFs at the 5-and 7-nm bulk FinFET technology nodes Y Xiong, NJ Pieper, AT Feeley, B Narasimham, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (4), 381-386, 2022 | 16 | 2022 |
| Study of multicell upsets in SRAM at a 5-nm bulk FinFET node NJ Pieper, Y Xiong, A Feeley, J Pasternak, N Dodds, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (4), 401-409, 2023 | 12 | 2023 |
| Soft error characterization of D-FFs at the 5-nm bulk FinFET technology for the terrestrial environment Y Xiong, A Feeley, NJ Pieper, DR Ball, B Narasimham, J Brockman, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 7C. 3-1-7C. 3-7, 2022 | 11 | 2022 |
| Efficacy of spatial and temporal RHBD techniques at advanced bulk FinFET technology nodes Y Xiong, NJ Pieper, B Narasimham, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1814-1820, 2023 | 7 | 2023 |
| Effects of collected charge and drain area on SE response of SRAMs at the 5-nm FinFET node NJ Pieper, Y Xiong, DR Ball, J Pasternak, BL Bhuva 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 5 | 2023 |
| Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7-and 5-nm Bulk FinFET Nodes Y Xiong, NJ Pieper, MW McCurdy, DR Ball, BD Sierwaski, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1687-1693, 2023 | 5 | 2023 |
| Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology NJ Pieper, Y Xiong, J Pasternak, NA Dodds, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1673-1679, 2023 | 5 | 2023 |
| Single-Event Latchup Vulnerability at the 7-nm FinFET Node NJ Pieper, Y Xiong, A Feeley, DR Ball, BL Bhuva 2022 IEEE International Reliability Physics Symposium (IRPS), 5C. 2-1-5C. 2-6, 2022 | 5 | 2022 |
| Response of 5-nm bulk FinFET SRAMs to extreme ionizing and non-ionizing doses Y Xiong, NJ Pieper, NA Dodds, G Vizkelethy, RN Nowlin, BL Bhuva IEEE Transactions on Nuclear Science 71 (4), 437-445, 2023 | 4 | 2023 |
| SE Performance of D-FF Designs With Different VT Options at Near-Threshold Supply Voltages in 7-nm Bulk FinFET Technology A Feeley, Y Xiong, NJ Pieper, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 69 (7), 1582-1586, 2022 | 4 | 2022 |
| Multiple bit upsets in register circuits at the 5-nm bulk finfet node Y Xiong, NJ Pieper, JB Kronenberg, DR Ball, M Casey, BL Bhuva 2024 IEEE International Reliability Physics Symposium (IRPS), P46. RE-1-P46 …, 2024 | 3 | 2024 |
| Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology Y Xiong, Y Chiang, NJ Pieper, DR Ball, BL Bhuva 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 3 | 2023 |
| Micro-latchup location and temperature characterization in a 7-nm bulk FinFET technology NJ Pieper, Y Xiong, A Feeley, DG Walker, R Fung, SJ Wen, DR Ball, ... 2021 21th European Conference on Radiation and Its Effects on Components and …, 2021 | 3 | 2021 |
| Multicell Upsets in Flip-Flops in Advanced FinFET Nodes NJ Pieper, Y Xiong, JB Kronenberg, CNN Sanchez, M Delaney, D Ball, ... IEEE Transactions on Nuclear Science, 2024 | 2 | 2024 |
| Effects of TID on SRAM Data Retention Stability at the 5-nm Node NJ Pieper, Y Xiong, J Pasternak, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 71 (8), 1864-1871, 2023 | 2 | 2023 |
| Single-Event Upsets Due to n-Hits and p-Hits at the 3nm Bulk FinFET Node JB Kronenberg, NJ Pieper, Y Xiong, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science, 2025 | 1 | 2025 |
| Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes Y Xiong, NJ Pieper, JB Kronenberg, Y Chiang, R Fung, SJ Wen, ... IEEE Transactions on Nuclear Science 71 (8), 1675-1681, 2024 | 1 | 2024 |
| SRAM electrical variability and SEE sensitivity at 5-nm bulk FinFET technology Y Qian, NJ Pieper, Y Xiong, J Pasternak, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 71 (4), 663-669, 2023 | 1 | 2023 |
| Single-Event Responses of Dual-and Triple-well Designs at the 5nm Bulk FinFET Node JB Kronenberg, NJ Pieper, Y Xiong, CNN Sanchez, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science, 2025 | | 2025 |
