| Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, DS Suh, JC Park, SO Park, ... IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004 | 907 | 2004 |
| Field-portable reflection and transmission microscopy based on lensless holography M Lee, O Yaglidere, A Ozcan Biomedical optics express 2 (9), 2721-2730, 2011 | 177 | 2011 |
| Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devices S Kwon, J Park, K Kim, Y Cho, M Lee Light: Science & Applications 11 (1), 32, 2022 | 54 | 2022 |
| Improved slow-light delay performance of a broadband stimulated Brillouin scattering system using fiber Bragg gratings M Lee, R Pant, MA Neifeld Applied Optics 47 (34), 6404-6415, 2008 | 39 | 2008 |
| Modern Trends in Imaging VIII: Lensfree Computational Microscopy Tools for Cell and Tissue Imaging at the Point‐of‐Care and in Low‐Resource Settings SO Isikman, A Greenbaum, M Lee, W Bishara, O Mudanyali, TW Su, ... Analytical Cellular Pathology 35 (4), 229-247, 2012 | 35 | 2012 |
| Tech. Dig. Int. Electron Devices Meet. IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, DS Suh, JC Park, SO Park, ... San Francisco, CA, 587-590, 2004 | 24 | 2004 |
| Fourier ptychographic topography H Wang, J Zhu, J Sung, G Hu, J Greene, Y Li, S Park, W Kim, M Lee, ... Optics Express 31 (7), 11007-11018, 2023 | 23 | 2023 |
| Adv. Mater.(Weinheim, Ger.) MJ Lee, Y Park, DS Suh, EH Lee, S Seo, DC Kim, R Jung, BS Kang, ... | 23 | 2007 |
| International electron devices meeting IG Baek, GM Lee, SS Seo, MJ Lee, DH Seo, D Suh, SJ Park, CSO Park, ... Technical Digest (Cat. No. 05CH37703)(IEEE, Piscataway, NJ, 2005), pp769-772, 2005 | 21 | 2005 |
| SBS gain-based slow-light system with a Fabry–Perot resonator M Lee, R Pant, MD Stenner, MA Neifeld Optics Communications 281 (10), 2975-2984, 2008 | 20 | 2008 |
| High-fidelity, broadband stimulated-Brillouin-scattering-based slow light using fast noise modulation Y Zhu, M Lee, MA Neifeld, DJ Gauthier Optics Express 19 (2), 687-697, 2011 | 19 | 2011 |
| Toward realization of high-throughput hyperspectral imaging technique for semiconductor device metrology C Yoon, G Park, D Han, S Im, S Jo, J Kim, W Kim, C Choi, M Lee Journal of Micro/Nanopatterning, Materials, and Metrology 21 (2), 021209-021209, 2022 | 18 | 2022 |
| Metrology using overlay and yield critical patterns D Kandel, MD Smith, M Wagner, E Amit, M Lee US Patent 10,685,165, 2020 | 17 | 2020 |
| U-In Chung and Moon JT IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, S DS, JC Park, SO Park, ... Tech. Dig. IEDM 587, C90, 2004 | 17 | 2004 |
| Information-theoretic analysis of a stimulated-Brillouin-scattering-based slow-light system M Lee, Y Zhu, DJ Gauthier, ME Gehm, MA Neifeld Applied optics 50 (32), 6063-6072, 2011 | 14 | 2011 |
| Improving SEM image quality using pixel super resolution technique M Lee, J Cantone, J Xu, L Sun, R Kim Metrology, Inspection, and Process Control for Microlithography XXVIII 9050 …, 2014 | 13 | 2014 |
| Information theoretic framework for the analysis of a slow-light delay device MA Neifeld, M Lee Journal of the Optical Society of America B 25 (12), C31-C38, 2008 | 11 | 2008 |
| Systematic design study of an all-optical delay line based on Brillouin scattering enhancedcascade coupled ring resonators M Lee, ME Gehm, MA Neifeld Journal of Optics 12 (10), 104012, 2010 | 10 | 2010 |
| IR Hwang, SH Kim, IS Byun, J.-S. Kim, JS Choi, and BH Park,“Reproducible resistance switching in polycrystalline NiO films” S Seo, MJ Lee, DH Seo, EJ Jeoung, DS Suh, YS Joung, IK Yoo Appl. Phys. Lett 85 (23), 5655, 2004 | 10 | 2004 |
| Moon, Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses, presented at the IEDM Technical Digest IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, DS Suh, JC Park, SO Park, ... Proceedings of the IEEE International Electron Devices Meeting, San …, 2004 | 9 | 2004 |
Aydogan OzcanChancellor's Professor at UCLA & HHMI ProfessorOverená e-mailová adresa na: ucla.edu