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Etienne Okada
Etienne Okada
Ingénieur, IEMN
Overená e-mailová adresa na: iemn.univ-lille1.fr
Názov
Citované v
Citované v
Rok
High performance and highly robust AlN/GaN HEMTs for millimeter-wave operation
K Harrouche, R Kabouche, E Okada, F Medjdoub
IEEE Journal of the Electron Devices Society 7, 1145-1150, 2019
1122019
Power performance at 40 GHz of AlGaN/GaN high-electron mobility transistors grown by molecular beam epitaxy on Si (111) substrate
P Altuntas, F Lecourt, A Cutivet, N Defrance, E Okada, M Lesecq, ...
IEEE Electron Device Letters 36 (4), 303-305, 2015
892015
Bandwidth enhancement in disordered metamaterial absorbers
J Hao, É Lheurette, L Burgnies, É Okada, D Lippens
Applied Physics Letters 105 (8), 2014
612014
First power performance demonstration of flexible AlGaN/GaN high electron mobility transistor
S Mhedhbi, M Lesecq, P Altuntas, N Defrance, E Okada, Y Cordier, ...
IEEE Electron Device Letters 37 (5), 553-555, 2016
362016
Optimization of High Electron Mobility Heterostructures for High-Power/Frequency Performances
S Rennesson, F Lecourt, N Defrance, M Chmielowska, S Chenot, ...
IEEE transactions on electron devices 60 (10), 3105-3111, 2013
332013
Force assistance control for standing-up motion
D Chugo, K Kawabata, H Kaetsu, N Miyake, K Kosuge, H Asama, ...
The First IEEE/RAS-EMBS International Conference on Biomedical Robotics and …, 2006
322006
High-speed uni-traveling-carrier photodiodes on silicon nitride
D Maes, S Lemey, G Roelkens, M Zaknoune, V Avramovic, E Okada, ...
APL Photonics 8 (1), 2023
282023
High power, high PAE Q‐band sub‐10 nm barrier thickness AlN/GaN HEMTs
E Dogmus, R Kabouche, A Linge, E Okada, M Zegaoui, F Medjdoub
physica status solidi (a) 214 (8), 1600797, 2017
212017
Impact of undoped channel thickness and carbon concentration on AlN/GaN-on-SiC HEMT performances
K Harrouche, S Venkatachalam, F Grandpierron, E Okada, F Medjdoub
Applied Physics Express 15 (11), 116504, 2022
202022
Non-volatile RF and mm-wave switches based on monolayer hBN
M Kim, E Pallecchi, R Ge, X Wu, V Avramovic, E Okada, JC Lee, H Happy, ...
2019 IEEE International Electron Devices Meeting (IEDM), 9.5. 1-9.5. 4, 2019
192019
Comparison of C-doped AlN/GaN HEMTs and AlN/GaN/AlGaN double heterostructure for mmW applications
R Kabouche, J Derluyn, R Pusche, S Degroote, M Germain, R Pécheux, ...
2018 13th European Microwave Integrated Circuits Conference (EuMIC), 5-8, 2018
192018
Power measurement setup for on-wafer large signal characterization up to Q-band
R Kabouche, E Okada, E Dogmus, A Linge, M Zegaoui, F Medjdoub
IEEE Microwave and wireless components letters 27 (4), 419-421, 2017
182017
High Power AlN/GaN HEMTs with record power-added-efficiency> 70% at 40 GHz
K Harrouche, R Kabouche, E Okada, F Medjdoub
2020 IEEE/MTT-S International Microwave Symposium (IMS), 285-288, 2020
162020
Large-area femtosecond laser milling of silicon employing trench analysis
A Bhaskar, J Philippe, F Braud, E Okada, V Avramovic, JF Robillard, ...
Optics & Laser Technology 138, 106866, 2021
152021
Gallium nitride MEMS resonators: how residual stress impacts design and performances
C Morelle, D Théron, J Derluyn, S Degroote, M Germain, V Zhang, ...
Microsystem Technologies 24, 371-377, 2018
152018
2 W mm− 1 power density of an AlGaN/GaN HEMT grown on free-standing GaN substrate at 40 GHz
MR Irekti, M Lesecq, N Defrance, E Okada, E Frayssinet, Y Cordier, ...
Semiconductor Science and Technology 34 (12), 12LT01, 2019
142019
On the correlation between kink effect and effective mobility in InAlN/GaN HEMTs
P Altuntas, N Defrance, M Lesecq, A Agboton, R Ouhachi, E Okada, ...
2014 9th European Microwave Integrated Circuit Conference, 88-91, 2014
132014
Low trapping effects and high electron confinement in short AlN/GaN-On-SiC HEMTs by means of a thin AlGaN back barrier
K Harrouche, S Venkatachalam, L Ben-Hammou, F Grandpierron, ...
Micromachines 14 (2), 291, 2023
122023
Importance of buffer configuration in GaN HEMTs for high microwave performance and robustness
R Pécheux, R Kabouche, E Dogmus, A Linge, E Okada, M Zegaoui, ...
2017 47th European Solid-State Device Research Conference (ESSDERC), 228-231, 2017
102017
Assessment of transistors based on GaN on silicon substrate in view of integration with silicon technology
A Soltani, Y Cordier, JC Gerbedoen, S Joblot, E Okada, M Chmielowska, ...
Semiconductor science and technology 28 (9), 094003, 2013
102013
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Články 1–20