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Timm Ostermann
Timm Ostermann
Assoc. Prof., Institute for Integrated Circuits, JKU University of Linz
Overená e-mailová adresa na: jku.at
Názov
Citované v
Citované v
Rok
A test-chip to characterize the benefit of on-chip decoupling to reduce the electromagnetic emission of integrated circuits
T Ostermann, C Bacher, D Schneider, W Gut, C Lackner, R Koessl, ...
2003 IEEE International Symposium on Electromagnetic Compatibility, 2003 …, 2003
512003
n-and p-Type SiGe HFETs and circuits
U König, M Zeuner, G Höck, T Hackbarth, M Glück, T Ostermann, ...
Solid-State Electronics 43 (8), 1383-1388, 1999
411999
New approach of ultrasonic distance measurement technique in robot applications
G Hueber, T Ostermann, T Bauernfeind, R Raschhofer, R Hagelauer
WCC 2000-ICSP 2000. 2000 5th International Conference on Signal Processing …, 2000
312000
CMOS output drivers with reduced ground bounce and electromagnetic emission
B Deutschmann, T Ostermann
ESSCIRC 2004-29th European Solid-State Circuits Conference (IEEE Cat. No …, 2003
302003
Performance estimation of Si/SiGe hetero-CMOS circuits
R Hagelauer, T Ostermann, U Konig, M Gluck, G Hock
Electronics letters 33 (3), 208-210, 1997
291997
A millimeter-wave wide-band transition from a differential microstrip to a rectangular waveguide for 60 GHz applications
M Ortner, Z Tong, T Ostermann
Proceedings of the 5th European Conference on Antennas and Propagation …, 2011
272011
Exploiting reversible logic design for implementing adiabatic circuits
A Rauchenecker, T Ostermann, R Wille
2017 MIXDES-24th International Conference" Mixed Design of Integrated …, 2017
232017
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
T Ostermann, B Deutschmann
Proceedings of the 13th ACM Great Lakes symposium on VLSI, 76-79, 2003
192003
Design rules for n-type SiGe hetero FETs
U König, M Glück, A Gruhle, G Höck, E Kohn, B Bozon, D Nuernbergk, ...
Solid-State Electronics 41 (10), 1541-1547, 1997
191997
Reproducibility and stability of C60 based organic field effect transistor
R Ahmed, M Sams, C Simbrunner, M Ullah, K Rehman, G Schwabegger, ...
Synthetic metals 161 (23-24), 2562-2565, 2012
162012
A fully integrated homodyne downconverter MMIC in SiGe: C for 60 GHz wireless applications
M Ortner, HP Forstner, L Verweyen, T Ostermann
2011 IEEE 11th Topical Meeting on Silicon Monolithic Integrated Circuits in …, 2011
162011
Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]
T Ostermann, B Deutschmann
The Eighth IEEE European Test Workshop, 2003. Proceedings., 132-137, 2003
152003
Influence of the power supply on the radiated electromagnetic emission of integrated circuits
T Ostermann
Microelectronics Journal 35 (6), 525-530, 2004
142004
LIMA: the new e-learning platform in microelectronic applications
T Ostermann, C Lackner, R Koessl, R Hagelauer, K Beer, L Krahn, ...
Proceedings 2003 IEEE International Conference on Microelectronic Systems …, 2003
142003
Hybrid FPGA debug approach
Z Panjkov, A Wasserbauer, T Ostermann, R Hagelauer
2015 25th International Conference on Field Programmable Logic and …, 2015
122015
Comparison of transport models far the simulation of degenerate semiconductors
D Schroeder, T Ostermann, O Kalz
Semiconductor science and technology 9 (4), 364, 1994
121994
On-chip digitally trimmable voltage reference
R Spilka, M Hirth, G Hilber, T Ostermann
Norchip 2007, 1-4, 2007
102007
Simulation model based on JEDEC JS-001-2014 for circuit simulation of HBM ESD pulses on IC level
M Kaufmann, T Ostermann
2015 10th International Workshop on the Electromagnetic Compatibility of …, 2015
92015
Nonlinear contact resistance and inhomogeneous current distribution at ohmic contacts
D Schroeder, T Ostermann, O Kalz
Simulation of Semiconductor Devices and Processes: Vol. 5, 445-448, 1993
81993
Mixed-mode S-parameter extraction for differential microstrip to waveguide transitions
M Ortner, Z Tong, T Ostermann
Proceedings of the 5th European Conference on Antennas and Propagation …, 2011
72011
Systém momentálne nemôže vykonať operáciu. Skúste to neskôr.
Články 1–20