Sledovať
Lorena Anghel
Lorena Anghel
Grenoble INP, University of Grenoble Alpes
Overená e-mailová adresa na: grenoble-inp.fr
Názov
Citované v
Citované v
Rok
Cost reduction and evaluation of temporary faults detecting technique
L Anghel, M Nicolaidis
Proceedings of the conference on Design, automation and test in Europe, 591-598, 2000
2642000
CNTFET modeling and reconfigurable logic-circuit design
I O'Connor, J Liu, F Gaffiot, F Prégaldiny, C Lallement, C Maneux, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2365-2379, 2007
2222007
Evaluation of a soft error tolerance technique based on time and/or space redundancy
L Anghel, D Alexandrescu, M Nicolaidis
Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000
1682000
Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric
T Frank, S Moreau, C Chappaz, P Leduc, L Arnaud, A Thuaire, E Chery, ...
Microelectronics Reliability 53 (1), 17-29, 2013
1152013
Resistance increase due to electromigration induced depletion under TSV
T Frank, C Chappaz, P Leduc, L Arnaud, F Lorut, S Moreau, A Thuaire, ...
2011 International Reliability Physics Symposium, 3F. 4.1-3F. 4.6, 2011
992011
New methods for evaluating the impact of single event transients in VDSM ICs
D Alexandrescu, L Anghel, M Nicolaidis
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002
962002
Cntfet basics and simulation
T Dang, L Anghel, R Leveugle
International Conference on Design and Test of Integrated Systems in …, 2006
942006
A diversified memory built-in self-repair approach for nanotechnologies
M Nicolaidis, N Achouri, L Anghel
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 313-318, 2004
712004
Backpropagation-based learning techniques for deep spiking neural networks: A survey
M Dampfhoffer, T Mesquida, A Valentian, L Anghel
IEEE Transactions on Neural Networks and Learning Systems, 2023
602023
Essential fault-tolerance metrics for NoC infrastructures
C Grecu, L Anghel, PP Pande, A Ivanov, R Saleh
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 37-42, 2007
572007
Are SNNs really more energy-efficient than ANNs? An in-depth hardware-aware study
M Dampfhoffer, T Mesquida, A Valentian, L Anghel
IEEE Transactions on Emerging Topics in Computational Intelligence 7 (3 …, 2022
552022
Electromigration behavior of 3D-IC TSV interconnects
T Frank, S Moreau, C Chappaz, L Arnaud, P Leduc, A Thuaire, L Anghel
2012 IEEE 62nd Electronic Components and Technology Conference, 326-330, 2012
522012
Reliability approach of high density through silicon via (TSV)
T Frank, C Chappaz, P Leduc, L Arnaud, S Moreau, A Thuaire, ...
2010 12th Electronics Packaging Technology Conference, 321-324, 2010
502010
Multiple event transient induced by nuclear reactions in CMOS logic cells
C Rusu, A Bougerol, L Anghel, C Weulerse, N Buard, S Benhammadi, ...
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 137-145, 2007
502007
Defects tolerant logic gates for unreliable future nanotechnologies
L Anghel, M Nicolaidis
International Work-Conference on Artificial Neural Networks, 422-429, 2007
442007
Special session: Reliability of hardware-implemented spiking neural networks (SNN)
EI Vatajelu, G Di Natale, L Anghel
2019 IEEE 37th VLSI Test Symposium (VTS), 1-8, 2019
422019
Simulating single event transients in VDSM ICs for ground level radiation
D Alexandrescu, L Anghel, M Nicolaidis
Journal of Electronic Testing 20, 413-421, 2004
422004
A predictive bottom-up hierarchical approach to digital system reliability
V Huard, E Pion, F Cacho, D Croain, V Robert, R Delater, P Mergault, ...
2012 IEEE International Reliability Physics Symposium (IRPS), 4B. 1.1-4B. 1.10, 2012
402012
Concurrent checking for VLSI
M Nicolaidis, L Anghel
Microelectronic Engineering 49 (1-2), 139-156, 1999
361999
Test and reliability in approximate computing
L Anghel, M Benabdenbi, A Bosio, M Traiola, EI Vatajelu
Journal of Electronic Testing 34 (4), 375-387, 2018
332018
Systém momentálne nemôže vykonať operáciu. Skúste to neskôr.
Články 1–20