Profili

Shijian Zheng

Institute of Metal Research, Chinese Academy of Sciences/Hebei University of Technology

Preverjeni e-poštni naslov na imr.ac.cn

Navedeno v 9760 virih

Material Science interfaces TEM/STEM

Haoyuan Qi (戚浩远)

ams Osram

Preverjeni e-poštni naslov na ams-osram.com

Navedeno v 3464 virih

TEM/STEM SEM-FIB EDS

Raza Moshwan

Research Fellow, QUT, Australia || CAS PIFI Fellow, DICP, China || A/Prof, IUBAT …

Preverjeni e-poštni naslov na qut.edu.au

Navedeno v 2043 virih

Thermoelectricitiy XRD TEM/STEM SEM/EDS FIB-SEM

Yusuke Nakanishi

Department of Advanced Materials science, The University of Tokyo

Preverjeni e-poštni naslov na edu.ku-tokyo.ac.jp

Navedeno v 1887 virih

Materials science Nanotubes Nanowires 2D materials TEM/STEM

Jiangtao Zhu

Arizona State University

Preverjeni e-poštni naslov na asu.edu

Navedeno v 1468 virih

Materials Characterization Electron Microscopy TEM/STEM EELS

Kuang-Hui Li

Principal Engineer at TSMC, ATMD EPI

Preverjeni e-poštni naslov na kaust.edu.sa

Navedeno v 1465 virih

Epitaxy technologies Material characterizations wide-bandgap semiconductors TEM/STEM RBS

Genrikh Shterk

University of Twente

Preverjeni e-poštni naslov na utwente.nl

Navedeno v 1171 virih

Catalysis catalysts characterization XPS TEM-STEM

Cong He (何聪)

National Institute for Materials Science (NIMS); Chongqing University

Preverjeni e-poštni naslov na nims.go.jp

Navedeno v 815 virih

TEM/STEM Mg alloys Crystal defects Solute segregation.

Marcus Wyss

Head of Nano Imaging Lab, Swiss Nanoscience Institute (SNI), University of Basel

Preverjeni e-poštni naslov na unibas.ch

Navedeno v 781 virih

SQUID microscopy FIB FEBID TEM/STEM PEEM

Eva Mutunga

Bredesen Center graduate student, University of Tennessee, Knoxville

Preverjeni e-poštni naslov na vols.utk.edu

Navedeno v 516 virih

nanotechnology electron beam induced deposition TEM/STEM

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