Rapid deformation analysis in digital holographic interferometry using graphics processing unit accelerated Wigner–Ville distribution A Vishnoi, G Rajshekhar Applied optics 58 (16), 4420-4424, 2019 | 30 | 2019 |
Phase derivative estimation in digital holographic interferometry using a deep learning approach AVS Vithin, A Vishnoi, R Gannavarpu Applied Optics 61 (11), 3061-3069, 2022 | 23 | 2022 |
Automated defect identification from carrier fringe patterns using Wigner–Ville distribution<? TeX\break?> and a machine learning-based method A Vishnoi, A Madipadaga, S Ajithaprasad, R Gannavarpu Applied Optics 60 (15), 4391-4397, 2021 | 18 | 2021 |
Phase recovery method in digital holographic interferometry using high-resolution signal parameter estimation A Vishnoi, J Ramaiah, G Rajshekhar Applied optics 58 (6), 1485-1490, 2019 | 11 | 2019 |
Wigner–Ville distribution based diffraction phase microscopy for non-destructive testing A Vishnoi, A Sreeprasad, G Rajshekhar Journal of Modern Optics 66 (16), 1644-1651, 2019 | 10 | 2019 |
Demodulation of noisy interferograms with rapid phase variations and amplitude fluctuations using a surrogate principle-based optimization method AVS Vithin, A Vishnoi, R Gannavarpu Applied Optics 60 (7), 1937-1942, 2021 | 3 | 2021 |
Wrapped phase denoising using adaptive Kalman smoother algorithm S Sharma, R Kulkarni, A Vishnoi, R Gannavarpu Journal of Modern Optics 69 (15), 838-849, 2022 | 2 | 2022 |
Single shot quantitative phase gradient estimation using Wigner-Ville distribution in digital holographic microscopy A Vishnoi, R Gannavarpu OSA Continuum 4 (9), 2452-2459, 2021 | 2 | 2021 |
Non-invasive surface profile measurement using a unitary transformation subspace approach in digital holography J Ramaiah, A Vishnoi, R Gannavarpu Optics Continuum 1 (4), 684-696, 2022 | 1 | 2022 |
High Speed Non-destructive Testing Method Using Digital Holographic Interferometry A Vishnoi, G Rajshekhar ICOL-2019: Proceedings of the International Conference on Optics and Electro …, 2021 | 1 | 2021 |
Fast fringe analysis method using graphics processing unit acceleration for dynamic fault identification A Vishnoi, R Gannavarpu Optics and Photonics for Advanced Dimensional Metrology 11352, 118-124, 2020 | 1 | 2020 |
Graphics processing unit assisted space-frequency method for high-speed defect propagation analysis from fringe patterns A Vishnoi, G Rajshekhar | | |