| Real-time quantitative phase imaging with a spatial phase-shifting algorithm SK Debnath, YK Park Optics letters 36 (23), 4677-4679, 2011 | 202 | 2011 |
| Index-based groundwater vulnerability mapping models using hydrogeological settings: a critical evaluation P Kumar, BKS Bansod, SK Debnath, PK Thakur, C Ghanshyam Environmental Impact Assessment Review 51, 38-49, 2015 | 195 | 2015 |
| Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates SK Debnath, MP Kothiyal, J Schmit, P Hariharan Optics express 14 (11), 4662-4667, 2006 | 85 | 2006 |
| Evaluation of spectral phase in spectrally resolved white-light interferometry: comparative study of single-frame techniques SK Debnath, MP Kothiyal, SW Kim Optics and Lasers in Engineering 47 (11), 1125-1130, 2009 | 74 | 2009 |
| Groundwater: a regional resource and a regional governance P Kumar, PK Thakur, BKS Bansod, SK Debnath Environment, development and sustainability 20, 1133-1151, 2018 | 73 | 2018 |
| Spectrally resolved phase-shifting interferometry of transparent thin films: sensitivity of thickness measurements SK Debnath, MP Kothiyal, J Schmit, P Hariharan Applied optics 45 (34), 8636-8640, 2006 | 61 | 2006 |
| Multi-criteria evaluation of hydro-geological and anthropogenic parameters for the groundwater vulnerability assessment P Kumar, PK Thakur, BKS Bansod, SK Debnath Environmental monitoring and assessment 189, 1-24, 2017 | 55 | 2017 |
| Assessment of the effectiveness of DRASTIC in predicting the vulnerability of groundwater to contamination: a case study from Fatehgarh Sahib district in Punjab, India P Kumar, PK Thakur, BKS Bansod, SK Debnath Environmental Earth Sciences 75, 1-13, 2016 | 48 | 2016 |
| Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry SK Debnath, MP Kothiyal Applied optics 45 (27), 6965-6972, 2006 | 37 | 2006 |
| Optical profiler based on spectrally resolved white light interferometry SK Debnath, MP Kothiyal Optical Engineering 44 (1), 013606-013606-5, 2005 | 34 | 2005 |
| Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer SK Debnath, MP Kothiyal Applied Optics 46 (22), 5103-5109, 2007 | 30 | 2007 |
| Revisit to comparison of numerical reconstruction of digital holograms using angular spectrum method and Fresnel diffraction method G Dwivedi, SK Debnath, B Das, R Kumar Journal of Optics 49, 118-126, 2020 | 27 | 2020 |
| Groundwater vulnerability assessment and mapping using DRASTIC model P Kumar, P Thakur, S Debnath CRC Press, 2019 | 21 | 2019 |
| Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry SK Debnath, J You, SW Kim International journal of precision engineering and manufacturing 10, 5-10, 2009 | 21 | 2009 |
| Groundwater vulnerability assessment of Fatehgarh Sahib district, Punjab, India P Kumar, PK Thakur, BK Bansod, SK Debnath Proceedings of India international science festival (IISF)—young scientists …, 2016 | 19 | 2016 |
| Design of refractive head-up display system using rotational symmetric aspheric optics T Chand, SK Debnath, SK Rayagond, V Karar Optik 131, 515-519, 2017 | 15 | 2017 |
| Analysis of spectrally resolved white light interferometry by Hilbert transform method SK Debnath, MP Kothiyal Interferometry XIII: Techniques and Analysis 6292, 223-228, 2006 | 15 | 2006 |
| Performance evaluation of a digital holographic camera under variable source power and exposure time G Dwivedi, L Pensia, SK Debnath, R Kumar Applied Optics 60 (4), A120-A130, 2021 | 13 | 2021 |
| Comparison of numerical reconstruction of digital holograms using angular spectrum method and Fresnel diffraction method G Dwivedi, A Sharma, S Debnath, Rajkumar Journal of Optics, 1-10, 2017 | 13 | 2017 |
| Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate SK Debnath, SW Kim, MP Kothiyal, P Hariharan Applied optics 49 (34), 6624-6629, 2010 | 12 | 2010 |
Praveen K. ThakurIndian Institute of Remote Sensing (IIRS), DehradunPreverjeni e-poštni naslov na iirs.gov.in