| All-semiconductor plasmonic nanoantennas for infrared sensing S Law, L Yu, A Rosenberg, D Wasserman Nano letters 13 (9), 4569-4574, 2013 | 215 | 2013 |
| A novel dry selective etch of SiGe for the enablement of high performance logic stacked gate-all-around nanosheet devices N Loubet, S Kal, C Alix, S Pancharatnam, H Zhou, C Durfee, M Belyansky, ... 2019 IEEE International Electron Devices Meeting (IEDM), 11.4. 1-11.4. 4, 2019 | 83 | 2019 |
| Full bottom dielectric isolation to enable stacked nanosheet transistor for low power and high performance applications J Zhang, J Frougier, A Greene, X Miao, L Yu, R Vega, P Montanini, ... 2019 IEEE International Electron Devices Meeting (IEDM), 11.6. 1-11.6. 4, 2019 | 83 | 2019 |
| Epitaxial growth of engineered metals for mid-infrared plasmonics S Law, L Yu, D Wasserman Journal of Vacuum Science & Technology B 31 (3), 2013 | 76 | 2013 |
| All-semiconductor negative-index plasmonic absorbers S Law, C Roberts, T Kilpatrick, L Yu, T Ribaudo, EA Shaner, V Podolskiy, ... Physical review letters 112 (1), 017401, 2014 | 64 | 2014 |
| Wafer-Scale Production of Uniform InAsyP1–y Nanowire Array on Silicon for Heterogeneous Integration JC Shin, A Lee, P Katal Mohseni, DY Kim, L Yu, JH Kim, HJ Kim, WJ Choi, ... Acs Nano 7 (6), 5463-5471, 2013 | 64 | 2013 |
| Damage-free smooth-sidewall InGaAs nanopillar array by metal-assisted chemical etching L Kong, Y Song, JD Kim, L Yu, D Wasserman, WK Chim, SY Chiam, X Li ACS nano 11 (10), 10193-10205, 2017 | 52 | 2017 |
| Parasitic resistance reduction strategies for advanced CMOS FinFETs beyond 7nm H Wu, O Gluschenkov, G Tsutsui, C Niu, K Brew, C Durfee, C Prindle, ... 2018 IEEE International Electron Devices Meeting (IEDM), 35.4. 1-35.4. 4, 2018 | 47 | 2018 |
| Mid-wave infrared narrow bandwidth guided mode resonance notch filter Y Zhong, Z Goldenfeld, K Li, W Streyer, L Yu, L Nordin, N Murphy, ... Optics Letters 42 (2), 223-226, 2017 | 44 | 2017 |
| Enhanced optical transmission through MacEtch-fabricated buried metal gratings R Liu, X Zhao, C Roberts, L Yu, PK Mohseni, X Li, V Podolskiy, ... Adv. Mater 28 (7), 1441-1448, 2016 | 27 | 2016 |
| Room-temperature mid-infrared quantum well lasers on multi-functional metamorphic buffers D Jung, L Yu, S Dev, D Wasserman, ML Lee Applied Physics Letters 109 (21), 2016 | 21 | 2016 |
| 2.8 μm emission from type-I quantum wells grown on InAsxP1− x/InP metamorphic graded buffers D Jung, Y Song, L Yu, D Wasserman, M Larry Lee Applied Physics Letters 101 (25), 2012 | 20 | 2012 |
| Mid-infrared electroluminescence from InAs type-I quantum wells grown on InAsP/InP metamorphic buffers D Jung, L Yu, D Wasserman, M Larry Lee Journal of Applied Physics 118 (18), 2015 | 18 | 2015 |
| Mid-infrared emission from In (Ga) Sb layers on InAs (Sb) R Liu, Y Zhong, L Yu, H Kim, S Law, JM Zuo, D Wasserman Optics Express 22 (20), 24466-24477, 2014 | 17 | 2014 |
| External resistance reduction by nanosecond laser anneal in Si/SiGe CMOS technology O Gluschenkov, H Wu, K Brew, C Niu, L Yu, Y Sulehria, S Choi, C Durfee, ... 2018 IEEE International Electron Devices Meeting (IEDM), 35.3. 1-35.3. 4, 2018 | 16 | 2018 |
| Contact resistance reduction in nanosheet device structure H Wu, D Guo, R Bao, J Wang, L Yu, R Vega, A Carr US Patent 11,289,573, 2022 | 15 | 2022 |
| Leakage control for gate-all-around field-effect transistor devices L Yu, H Wu, R Bao, J Wang, D Guo US Patent 10,797,163, 2020 | 14 | 2020 |
| Advanced arsenic doped epitaxial growth for source drain extension formation in scaled FinFET devices S Mochizuki, B Colombeau, L Yu, A Dube, S Choi, M Stolfi, Z Bi, F Chang, ... 2018 IEEE International Electron Devices Meeting (IEDM), 35.2. 1-35.2. 4, 2018 | 13 | 2018 |
| Controlling quantum dot energies using submonolayer bandstructure engineering L Yu, D Jung, S Law, J Shen, JJ Cha, ML Lee, D Wasserman Applied Physics Letters 105 (8), 2014 | 12 | 2014 |
| Stacked gate structures C Zhang, D Guo, J Wang, R Xie, K Cheng, J Li, C Park, R Bao, SD Suk, ... US Patent 11,282,838, 2022 | 11 | 2022 |
Daniel WassermanProfessor of Electrical and Computer Engineering, University of Texas AustinPreverjeni e-poštni naslov na utexas.edu