Članki z zahtevami za javni dostop - Daisuke KobayashiVeč o tem
Ni na voljo nikjer: 3
Influence of 60-MeV proton-irradiation on standard and strained n-and p-channel MuGFETs
PGD Agopian, JA Martino, D Kobayashi, E Simoen, C Claeys
IEEE Transactions on Nuclear Science 59 (4), 707-713, 2012
Zahteve: Research Foundation (Flanders)
Radiation hardness aspects of advanced FinFET and UTBOX devices
C Claeys, M Aoulaiche, E Simoen, A Griffoni, D Kobayashi, NN Mahatme, ...
2012 IEEE International SOI Conference (SOI), 1-2, 2012
Zahteve: Research Foundation (Flanders)
Impact of proton irradiation on strained triple gate SOI p-and n-MOSFETs
PGD Agopian, JA Martino, D Kobayashi, E Simoen, C Claeys
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
Zahteve: Research Foundation (Flanders)
Na voljo nekje: 2
The impact of technology scaling on the single-event transient response of SiGe HBTs
NE Lourenco, ZE Fleetwood, A Ildefonso, MT Wachter, NJH Roche, ...
IEEE Transactions on Nuclear Science 64 (1), 406-414, 2016
Zahteve: US National Science Foundation, US National Aeronautics and Space Administration
DIBL performance of 60 MeV proton-irradiated SOI MuGFETs
PGD Agopian, JA Martino, D Kobayashi, M Poizat, E Simoen, C Claeys
2010 10th IEEE International Conference on Solid-State and Integrated …, 2010
Zahteve: Research Foundation (Flanders)
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