Прати
Mottaqiallah Taouil
Mottaqiallah Taouil
Delft University of Technology
Верификована је имејл адреса на tudelft.nl
Наслов
Навело
Навело
Година
Memristor based computation-in-memory architecture for data-intensive applications
S Hamdioui, L Xie, HA Du Nguyen, M Taouil, K Bertels, H Corporaal, ...
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
2432015
Scouting logic: A novel memristor-based logic design for resistive computing
L Xie, HA Du Nguyen, J Yu, A Kaichouhi, M Taouil, M AlFailakawi, ...
2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 176-181, 2017
1382017
Testing open defects in memristor-based memories
S Hamdioui, M Taouil, NZ Haron
IEEE Transactions on Computers 64 (1), 247-259, 2013
1222013
Fast boolean logic mapped on memristor crossbar
L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels
2015 33rd IEEE International Conference on Computer Design (ICCD), 335-342, 2015
1212015
Memristive devices for computation-in-memory
J Yu, HA Du Nguyen, L Xie, M Taouil, S Hamdioui
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018
692018
A classification of memory-centric computing
HAD Nguyen, J Yu, MA Lebdeh, M Taouil, S Hamdioui, F Catthoor
ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (2), 1-26, 2020
682020
Test cost analysis for 3D die-to-wafer stacking
M Taouil, S Hamdioui, K Beenakker, EJ Marinissen
2010 19th IEEE Asian Test Symposium, 435-441, 2010
682010
Device-aware test: A new test approach towards DPPB level
M Fieback, L Wu, GC Medeiros, H Aziza, S Rao, EJ Marinissen, M Taouil, ...
2019 IEEE International Test Conference (ITC), 1-10, 2019
662019
Memristive devices for computing: Beyond CMOS and beyond von Neumann
HA Du Nguyen, J Yu, L Xie, M Taouil, S Hamdioui, D Fey
2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017
602017
Challenges and solutions in emerging memory testing
EI Vatajelu, P Prinetto, M Taouil, S Hamdioui
IEEE Transactions on Emerging Topics in Computing 7 (3), 493-506, 2017
582017
On maximizing the compound yield for 3D wafer-to-wafer stacked ICs
M Taouil, S Hamdioui, J Verbree, EJ Marinissen
2010 IEEE International Test Conference, 1-10, 2010
572010
Applications of computation-in-memory architectures based on memristive devices
S Hamdioui, HA Du Nguyen, M Taouil, A Sebastian, M Le Gallo, S Pande, ...
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 486-491, 2019
502019
Electrical modeling of STT-MRAM defects
L Wu, M Taouil, S Rao, EJ Marinissen, S Hamdioui
2018 IEEE International Test Conference (ITC), 1-10, 2018
492018
A mapping methodology of boolean logic circuits on memristor crossbar
L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
452017
Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier
I Agbo, M Taouil, D Kraak, S Hamdioui, H Kükner, P Weckx, P Raghavan, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2017
422017
On the implementation of computation-in-memory parallel adder
HA Du Nguyen, L Xie, M Taouil, R Nane, S Hamdioui, K Bertels
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (8 …, 2017
412017
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
EJ Marinissen, B De Wachter, K Smith, J Kiesewetter, M Taouil, ...
2014 International Test Conference, 1-10, 2014
372014
Parallel matrix multiplication on memristor-based computation-in-memory architecture
A Haron, J Yu, R Nane, M Taouil, S Hamdioui, K Bertels
2016 International Conference on High Performance Computing & Simulation …, 2016
352016
Layer redundancy based yield improvement for 3D wafer-to-wafer stacked memories
M Taouil, S Hamdioui
2011 Sixteenth IEEE European Test Symposium, 45-50, 2011
322011
Computation-in-memory based parallel adder
HA Du Nguyen, L Xie, M Taouil, R Nane, S Hamdioui, K Bertels
Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale …, 2015
312015
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