| Effects of substrate temperature on copper (II) phthalocyanine thin films E Jungyoon, S Kim, E Lim, K Lee, D Cha, B Friedman Applied Surface Science 205 (1-4), 274-279, 2003 | 155 | 2003 |
| Enhanced coherence of all-nitride superconducting qubits epitaxially grown on silicon substrate S Kim, Hirotaka Terai, Taro Yamashita, ... Communications Materials 2 (98), 1-7, 2021 | 81 | 2021 |
| Scanning laser THz imaging system H Murakami, K Serita, Y Maekawa, S Fujiwara, E Matsuda, S Kim, ... Journal of Physics D: Applied Physics 47 (37), 374007, 2014 | 63 | 2014 |
| Transmission-type laser THz emission microscope using a solid immersion lens S Kim, H Murakami, M Tonouchi IEEE Journal of Selected Topics in Quantum Electronics 14 (2), 498-504, 2008 | 47 | 2008 |
| Near-field radiative nanothermal imaging of nonuniform Joule heating in narrow metal wires Q Weng, KT Lin, K Yoshida, H Nema, S Komiyama, S Kim, K Hirakawa, ... Nano Letters 18 (7), 4220-4225, 2018 | 44 | 2018 |
| Study on electrical properties of CdS films prepared by chemical pyrolysis deposition D Cha, S Kim, NK Huang Materials Science and Engineering: B 106 (1), 63-68, 2004 | 42 | 2004 |
| Backside observation of large-scale integrated circuits with multilayered interconnections using laser terahertz emission microscope M Yamashita, C Otani, K Kawase, T Matsumoto, K Nikawa, S Kim, ... Applied Physics Letters 94 (19), 2009 | 39 | 2009 |
| Laser terahertz emission microscope H Murakami, N Uchida, R Inoue, S Kim, T Kiwa, M Tonouchi Proceedings of the IEEE 95 (8), 1646-1657, 2007 | 38 | 2007 |
| Periodic oscillations of Josephson-vortex flow resistance in oxygen-deficient M Nagao, S Urayama, SM Kim, HB Wang, KS Yun, Y Takano, T Hatano, ... Physical Review B—Condensed Matter and Materials Physics 74 (5), 054502, 2006 | 37 | 2006 |
| Fiske steps studied by flux-flow resistance oscillation in a narrow stack of junctions SM Kim, HB Wang, T Hatano, S Urayama, S Kawakami, M Nagao, ... Physical Review B—Condensed Matter and Materials Physics 72 (14), 140504, 2005 | 37 | 2005 |
| π phase shifter based on NbN-based ferromagnetic Josephson junction on a silicon substrate T. Yamashita, S. Kim, H. Kato, W. Qiu, K. Semba, A. Fujimaki, H. Terai Scientific reports 10, 13687, 2020 | 33 | 2020 |
| Two-color detection with charge sensitive infrared phototransistors S Kim, S Komiyama, T Ueda, T Satoh, Y Kajihara Applied Physics Letters 107 (18), 2015 | 32 | 2015 |
| Terahertz oscillation in submicron sized intrinsic Josephson junctions HB Wang, S Urayama, SM Kim, S Arisawa, T Hatano, BY Zhu Applied physics letters 89 (25), 2006 | 30 | 2006 |
| A high signal-to-noise ratio passive near-field microscope equipped with a helium-free cryostat KT Lin, S Komiyama, S Kim, K Kawamura, Y Kajihara Review of Scientific Instruments 88 (1), 2017 | 27 | 2017 |
| THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis M Yamashita, C Otani, T Matsumoto, Y Midoh, K Miura, K Nakamae, ... Optics Express 19 (11), 10864-10873, 2011 | 27 | 2011 |
| Nondestructive high spatial resolution imaging with a 60 GHz near-field scanning millimeter-wave microscope M Kim, J Kim, H Kim, S Kim, J Yang, H Yoo, S Kim, K Lee, B Friedman Review of scientific instruments 75 (3), 684-688, 2004 | 22 | 2004 |
| Shapiro steps observed in annular intrinsic Josephson junctions at low microwave frequencies HB Wang, SM Kim, S Urayama, M Nagao, T Hatano, S Arisawa, ... Applied physics letters 88 (6), 2006 | 20 | 2006 |
| Laser THz emission microscope as a novel tool for LSI failure analysis M Yamashita, C Otani, S Kim, H Murakami, M Tonouchi, T Matsumoto, ... Microelectronics Reliability 49 (9-11), 1116-1126, 2009 | 19 | 2009 |
| Semiconductor inspection device and inspection method T Matsumoto, Y Aoki, M Tonouchi, H Murakami, S Kim, M Yamashita, ... US Patent App. 13/061,363, 2011 | 18 | 2011 |
| Fast Josephson vortex ratchet made of intrinsic Josephson junctions in HB Wang, BY Zhu, C Gürlich, M Ruoff, S Kim, T Hatano, BR Zhao, ... Physical Review B—Condensed Matter and Materials Physics 80 (22), 224507, 2009 | 18 | 2009 |
Masayoshi TonouchiOsaka UniversityВерификована је имејл адреса на ile.osaka-u.ac.jp
