| Soft error mitigation through selective addition of functionally redundant wires S Almukhaizim, Y Makris IEEE Transactions on Reliability 57 (1), 23-31, 2008 | 80 | 2008 |
| Seamless integration of SER in rewiring-based design space exploration S Almukhaizim, Y Makris, YS Yang, A Veneris 2006 IEEE International Test Conference, 1-9, 2006 | 56 | 2006 |
| Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines S Almukhaizim, P Drineas, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006 | 52 | 2006 |
| Concurrent error detection methods for asynchronous burst-mode machines S Almukhaizim, Y Makris IEEE Transactions on Computers 56 (6), 785-798, 2007 | 41 | 2007 |
| Fusing multiple color images for texturing models N Bannai, A Agathos, RB Fisher Proceedings. 2nd International Symposium on 3D Data Processing …, 2004 | 39 | 2004 |
| Peak power reduction through dynamic partitioning of scan chains S Almukhaizim, O Sinanoglu 2008 IEEE International Test Conference, 1-10, 2008 | 34 | 2008 |
| Circuit and method providing dynamic scan chain partitioning SA Almukhaizim, O Sinanoglu US Patent 7,937,634, 2011 | 30 | 2011 |
| Fault tolerant design of combinational and sequential logic based on a parity check code S Almukhaizim, Y Makris Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003 | 29 | 2003 |
| Dynamic scan chain partitioning for reducing peak shift power during test S Almukhaizim, O Sinanoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 26 | 2009 |
| Novel hazard-free majority voter for N-modular redundancy-based fault tolerance in asynchronous circuits S Almukhaizim, O Sinanoglu IET Computers & Digital Techniques 5 (4), 306-315, 2011 | 22 | 2011 |
| Cost-effective graceful degradation in speculative processor subsystems: The branch prediction case S Almukhaizim, T Verdel, Y Makris Proceedings 21st International Conference on Computer Design, 194-197, 2003 | 22 | 2003 |
| Low-cost, software-based self-test methodologies for performance faults in processor control subsystems S Almukhaizim, P Petrov, A Orailoglu Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No …, 2001 | 21 | 2001 |
| Soft-error tolerance and mitigation in asynchronous burst-mode circuits S Almukhaizim, F Shi, E Love, Y Makris IEEE transactions on very large scale integration (VLSI) systems 17 (7), 869-882, 2009 | 20 | 2009 |
| Cost-driven selection of parity trees S Almukhaizim, P Drineas, Y Makris 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 319-324, 2004 | 20 | 2004 |
| Faults in processor control subsystems: Testing correctness and performance faults in the data prefetching unit S Almukhaizim, P Petrov, A Orailoglu Proceedings 10th Asian Test Symposium, 319-324, 2001 | 20 | 2001 |
| On concurrent error detection with bounded latency in FSMs S Almukhaizim, P Drineas, Y Makris Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004 | 18 | 2004 |
| X-align: Improving the scan cell observability of response compactors O Sinanoglu, S Almukhaizim IEEE transactions on very large scale integration (VLSI) systems 17 (10 …, 2009 | 17 | 2009 |
| A hazard-free majority voter for TMR-based fault tolerance in asynchronous circuits S Almukhaizim, O Sinanoglu 2007 2nd International Design and Test Workshop, 93-98, 2007 | 17 | 2007 |
| Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG J Ma, M Tehranipoor, O Sinanoglu, S Almukhaizim 2010 5th International Design and Test Workshop, 122-127, 2010 | 16 | 2010 |
| Circuit and method for increasing scan cell observability of response compactors O Sinanoglu, SA Almukhaizim US Patent 8,006,150, 2011 | 15 | 2011 |
