| Unambiguous evaluation of a chirp measurement standard J Seewig, M Eifler, G Wiora Surface Topography: Metrology and Properties 2 (4), 045003, 2014 | 49 | 2014 |
| Calibration sample for arbitrary metrological characteristics of optical topography measuring instruments M Eifler, J Hering, G Von Freymann, J Seewig Optics express 26 (13), 16609-16623, 2018 | 44 | 2018 |
| Manufacturing of new roughness standards for the linearity of the vertical axis–Feasibility study and optimization M Eifler, F Schneider, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 19 (4), 1993-2001, 2016 | 32 | 2016 |
| Application of function-oriented roughness parameters using confocal microscopy K Klauer, M Eifler, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 21 (3), 302-313, 2018 | 29 | 2018 |
| Manufacturing of the ISO 25178-70 material measures with direct laser writing: a feasibility study M Eifler, J Hering, G von Freymann, J Seewig Surface Topography: Metrology and Properties 6 (2), 024010, 2018 | 26 | 2018 |
| Correlation between different cutting conditions, surface roughness and dimensional accuracy when ball end micro milling material measures with freeform surfaces K Klauer, M Eifler, B Kirsch, J Seewig, JC Aurich Machining Science and Technology 24 (3), 446-464, 2020 | 25 | 2020 |
| Design and verification of geometric roughness standards by reverse engineering J Seewig, M Eifler, F Schneider, JC Aurich Procedia CIRP 45, 259-262, 2016 | 25 | 2016 |
| Crossing-the-line segmentation as a basis for Rsm and Rc evaluation J Seewig, PJ Scott, M Eifler, B Barwick, D Hüser Surface Topography: Metrology and Properties 8 (2), 024010, 2020 | 24 | 2020 |
| Comparison of material measures for areal surface topography measuring instrument calibration M Eifler, J Hering, J Seewig, RK Leach, G von Freymann, X Hu, G Dai Surface Topography: Metrology and Properties 8 (2), 025019, 2020 | 20 | 2020 |
| Ultrafast 3D high precision print of micro structures for optical instrument calibration procedures F Ströer, J Hering, M Eifler, I Raid, G von Freymann, J Seewig Additive Manufacturing 18, 22-30, 2017 | 20 | 2017 |
| Comparison of material measures for the determination of transfer characteristics of surface topography measuring instruments M Eifler, A Keksel, J Seewig Surface Topography: Metrology and Properties 7 (1), 015024, 2019 | 19 | 2019 |
| Two-photon laser lithography in optical metrology J Hering, M Eifler, L Hofherr, C Ziegler, J Seewig, G von Freymann Advanced fabrication technologies for micro/nano optics and photonics XI …, 2018 | 18 | 2018 |
| Ball end micro milling of areal material measures: influence of the tilt angle on the resulting surface topography K Klauer, M Eifler, B Kirsch, J Seewig, JC Aurich Production Engineering 14, 239-252, 2020 | 17 | 2020 |
| A model-based approach for the calibration and traceability of the angle resolved scattering light sensor J Seewig, M Eifler, F Schneider, B Kirsch, JC Aurich Surface Topography: Metrology and Properties 4 (2), 024010, 2016 | 17 | 2016 |
| Calibration of z-axis linearity for arbitrary optical topography measuring instruments M Eifler, J Seewig, J Hering, G von Freymann Optical measurement systems for industrial inspection IX 9525, 237-246, 2015 | 17 | 2015 |
| User-oriented evaluation of the metrological characteristics of areal surface topography measuring instruments M Eifler, F Ströer, J Hering, G von Freymann, J Seewig Optical Measurement Systems for Industrial Inspection XI 11056, 230-241, 2019 | 16 | 2019 |
| Micro-milling of areal material measures–influences on the resulting surface topography M Eifler, K Klauer, B Kirsch, J Seewig, JC Aurich Procedia CIRP 71, 122-127, 2018 | 16 | 2018 |
| Effects of vibratory finishing of 304 stainless steel samples on areal roughness parameters: a correlational analysis for anisotropy parameters M Eifler, IC Garretson, BS Linke, J Das, F Torner, J Seewig Journal of Materials Processing Technology 273, 116256, 2019 | 15 | 2019 |
| Calibration of areal surface topography measuring instruments J Seewig, M Eifler Fifth international conference on optical and photonics engineering 10449 …, 2017 | 15 | 2017 |
| Modellbasierte Entwicklung von Kalibriernormalen zur geometrischen Produktspezifikation M Eifler Technische Universität Kaiserslautern, 2016 | 15 | 2016 |
Jörg SeewigProfessor für Messtechnik und Sensorik, Technische Universität KaiserslauternВерификована је имејл адреса на mv.uni-kl.de
