| On-chip adaptive body bias for reducing the impact of NBTI on 6T SRAM cells AP Shah, N Yadav, A Beohar, SK Vishvakarma IEEE Transactions on Semiconductor Manufacturing 31 (2), 242-249, 2018 | 48 | 2018 |
| Process variation and NBTI resilient Schmitt trigger for stable and reliable circuits AP Shah, N Yadav, A Beohar, SK Vishvakarma IEEE Transactions on Device and Materials Reliability 18 (4), 546-554, 2018 | 28 | 2018 |
| Performance enhancement of asymmetrical underlap 3D‐cylindrical GAA‐TFET with low spacer width A Beohar, SK Vishvakarma Micro & Nano Letters 11 (8), 443-445, 2016 | 24 | 2016 |
| THz imaging technology trends and wide variety of applications: a detailed survey V Anitha, A Beohar, A Nella Plasmonics 18 (2), 441-483, 2023 | 19 | 2023 |
| Analysis of trap‐assisted tunnelling in asymmetrical underlap 3D‐cylindrical GAA‐TFET based on hetero‐spacer engineering for improved device reliability A Beohar, N Yadav, SK Vishvakarma Micro & Nano Letters 12 (12), 982-986, 2017 | 19 | 2017 |
| Analog/RF characteristics of a 3D-Cyl underlap GAA-TFET based on a Ge source using fringing-field engineering for low-power applications A Beohar, N Yadav, AP Shah, SK Vishvakarma Journal of Computational Electronics 17 (4), 1650-1657, 2018 | 18 | 2018 |
| Impact of drain underlap and high bandgap strip on cylindrical gate all around tunnel FET and its influence on analog/RF performance A Dutt, S Tiwari, AK Upadhyay, R Mathew, A Beohar Silicon 14 (15), 9789-9796, 2022 | 13 | 2022 |
| Efficient low-precision cordic algorithm for hardware implementation of artificial neural network G Raut, V Bhartiy, G Rajput, S Khan, A Beohar, SK Vishvakarma VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India …, 2019 | 10 | 2019 |
| Analysis of DC and analog/RF performance on Cyl-GAA-TFET using distinct device geometry SK Vishvakarma, A Beohar, V Vijayvargiya, P Trivedi Journal of Semiconductors 38 (7), 074003, 2017 | 10 | 2017 |
| NMOS only Schmitt trigger circuit for NBTI resilient CMOS circuits AP Shah, N Yadav, A Beohar, SK Vishvakarma Electronics Letters 54 (14), 868-870, 2018 | 9 | 2018 |
| SUBHDIP: process variations tolerant subthreshold Darlington pair‐based NBTI sensor circuit AP Shah, N Yadav, A Beohar, SK Vishvakarma IET Computers & Digital Techniques 13 (3), 243-249, 2019 | 7 | 2019 |
| Novel pvt resilient low-power dynamic xor/xnor design using variable threshold mos for iot applications AS Yadav, BS Reniwal, A Beohar IETE Journal of Research 70 (5), 5190-5200, 2024 | 6 | 2024 |
| An investigation of a suppressed-drain cylindrical gate-all-around retrograde-doped heterospacer steep-density-film tunneling field-effect transistor S Tiwari, A Dutt, M Joshi, P Nigam, R Mathew, A Beohar Journal of Computational Electronics 20, 1702-1710, 2021 | 6 | 2021 |
| Diminish Short Channel Effects on Cylindrical GAA Hetero-gate Dielectric TFET using High-Density Delta A Dutt, S Tiwari, M Joshi, P Nigam, R Mathew, A Beohar IETE Journal of Research 69 (12), 9166-9173, 2023 | 4 | 2023 |
| High-performance tunnel field-effect transistors (TFETs) for future low power applications R Mathew, A Beohar, AK Upadhyay Semiconductor Devices and Technologies for Future Ultra Low Power …, 2021 | 4 | 2021 |
| On-chip Analysis of Etched Drain based Cyl. GAA TFET with Elevated Density Strip A Dutt, S Tiwari, M Joshi, P Nigam, R Mathew, A Beohar IOP Conference Series: Materials Science and Engineering 1166 (1), 012044, 2021 | 4 | 2021 |
| Novel standby leakage reduction technique in SRAM cell with enhanced read data stability by dynamically varying the cell ratio and pull-up ratio using wordline AS Yadav, A Beohar, S Ambulker 2020 IEEE 17th India Council International Conference (INDICON), 1-6, 2020 | 4 | 2020 |
| Subthreshold darlington pair based NBTI sensor for reliable CMOS circuits AP Shah, N Yadav, A Beohar, SK Vishvakarma 2017 International Conference on Electron Devices and Solid-State Circuits …, 2017 | 4 | 2017 |
| Enhancement of power quality problems using DSTATCOM: An optimized control approach D Khadse, A Beohar Solar Energy 268, 112260, 2024 | 3 | 2024 |
| In-silico investigation of Cyl. Gate all around (GAA) tunnel field effect transistor (TFET) biosensor S Tiwari, A Dutt, M Joshi, P Nigam, A Beohar, R Mathew IOP Conference Series: Materials Science and Engineering 1166 (1), 012045, 2021 | 3 | 2021 |