| Mechanisms for fatigue of micron‐scale silicon structural films DH Alsem, ON Pierron, EA Stach, CL Muhlstein, RO Ritchie Advanced Engineering Materials 9 (1‐2), 15-30, 2007 | 132 | 2007 |
| The influence of hydride blisters on the fracture of Zircaloy-4 ON Pierron, DA Koss, AT Motta, KS Chan Journal of nuclear materials 322 (1), 21-35, 2003 | 117 | 2003 |
| Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films E Hosseinian, ON Pierron Nanoscale 5 (24), 12532-12541, 2013 | 92 | 2013 |
| The critical role of environment in fatigue damage accumulation in deep-reactive ion-etched single-crystal silicon structural films ON Pierron, CL Muhlstein Journal of Microelectromechanical Systems 15 (1), 111-119, 2006 | 75 | 2006 |
| Galvanic effects in Si-based microelectromechanical systems: Thick oxide formation and its implications for fatigue reliability ON Pierron, DD Macdonald, CL Muhlstein Applied Physics Letters 86 (21), 2005 | 56 | 2005 |
| Investigation of the low-cycle fatigue mechanism for micron-scale monocrystalline silicon films EK Baumert, PO Theillet, ON Pierron Acta Materialia 58 (8), 2854-2863, 2010 | 55 | 2010 |
| Tensile specimen geometry and the constitutive behavior of Zircaloy-4 ON Pierron, DA Koss, AT Motta Journal of Nuclear Materials 312 (2-3), 257-261, 2003 | 50 | 2003 |
| Skin-like low-noise elastomeric organic photodiodes Y Park, C Fuentes-Hernandez, K Kim, WF Chou, FA Larrain, S Graham, ... Science Advances 7 (51), eabj6565, 2021 | 48 | 2021 |
| Fatigue rates of monocrystalline silicon thin films in harsh environments: Influence of stress amplitude, relative humidity, and temperature PO Theillet, ON Pierron Applied physics letters 94 (18), 2009 | 46 | 2009 |
| Advanced microelectromechanical systems-based nanomechanical testing: beyond stress and strain measurements S Bhowmick, H Espinosa, K Jungjohann, T Pardoen, O Pierron Mrs Bulletin 44 (6), 487-493, 2019 | 44 | 2019 |
| Failure of hydrided Zircaloy-4 under equal-biaxial and plane-strain tensile deformation A Glendening, DA Koss, ON Pierron, AT Motta, RS Damt Zirconium in the Nuclear Industry: Fourteenth International Symposium, 833-850, 2005 | 44 | 2005 |
| A versatile microelectromechanical system for nanomechanical testing B Pant, BL Allen, T Zhu, K Gall, ON Pierron Applied Physics Letters 98 (5), 2011 | 42 | 2011 |
| Temperature and humidity effects on the quality factor of a silicon lateral rotary micro-resonator in atmospheric air E Hosseinian, PO Theillet, ON Pierron Sensors and Actuators A: Physical 189, 380-389, 2013 | 41 | 2013 |
| Highly localized surface oxide thickening on polycrystalline silicon thin films during cyclic loading in humid environments M Budnitzki, ON Pierron Acta Materialia 57 (10), 2944-2955, 2009 | 37 | 2009 |
| Size effects on intergranular crack growth mechanisms in ultrathin nanocrystalline gold free-standing films E Hosseinian, S Gupta, ON Pierron, M Legros Acta Materialia 143, 77-87, 2018 | 35 | 2018 |
| Environmentally assisted cracking in silicon nitride barrier films on poly (ethylene terephthalate) substrates K Kim, H Luo, AK Singh, T Zhu, S Graham, ON Pierron ACS applied materials & interfaces 8 (40), 27169-27178, 2016 | 35 | 2016 |
| MEMS based nanomechanical testing method with independent electronic sensing of stress and strain S Gupta, ON Pierron Extreme Mechanics Letters 8, 167-176, 2016 | 33 | 2016 |
| Quantifying and observing viscoplasticity at the nanoscale: highly localized deformation mechanisms in ultrathin nanocrystalline gold films E Hosseinian, M Legros, ON Pierron Nanoscale 8 (17), 9234-9244, 2016 | 33 | 2016 |
| Methodology for low-and high-cycle fatigue characterization with kHz-frequency resonators ON Pierron, CC Abnet, CL Muhlstein Sensors and Actuators A: Physical 128 (1), 140-150, 2006 | 33 | 2006 |
| Fatigue degradation properties of LIGA Ni films using kilohertz microresonators EK Baumert, ON Pierron Journal of microelectromechanical systems 22 (1), 16-25, 2012 | 28 | 2012 |
Ting ZhuGeorgia Institute of TechnologyВерификована је имејл адреса на me.gatech.edu
