| Denchmark: A bug benchmark of deep learning-related software M Kim, Y Kim, E Lee 2021 IEEE/ACM 18th International Conference on Mining Software Repositories …, 2021 | 15 | 2021 |
| An empirical study of deep transfer learning-based program repair for kotlin projects M Kim, Y Kim, H Jeong, J Heo, S Kim, H Chung, E Lee Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022 | 14 | 2022 |
| An empirical study of ir-based bug localization for deep learning-based software M Kim, Y Kim, E Lee 2022 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2022 | 10 | 2022 |
| Deep learning-based production and test bug report classification using source files M Kim, Y Kim, E Lee Proceedings of the ACM/IEEE 44th International Conference on Software …, 2022 | 6 | 2022 |
| A novel automatic query expansion with word embedding for ir-based bug localization M Kim, Y Kim, E Lee 2021 IEEE 32nd International Symposium on Software Reliability Engineering …, 2021 | 6 | 2021 |
| Impact of defect instances for successful deep learning-based automatic program repair M Kim, Y Kim, J Heo, H Jeong, S Kim, E Lee 2022 IEEE International Conference on Software Maintenance and Evolution …, 2022 | 4 | 2022 |
| Tracking down misguiding terms for locating bugs in deep learning-based software (student abstract) Y Kim, M Kim, E Lee Proceedings of the AAAI Conference on Artificial Intelligence 36 (11), 12983 …, 2022 | 4 | 2022 |
| Feature assortment for deep learning-based bug localization with a program graph Y Kim, M Kim, E Lee Proceedings of the 37th ACM/SIGAPP Symposium on Applied Computing, 1536-1544, 2022 | 4 | 2022 |
| Feature combination to alleviate hubness problem of source code representation for bug localization Y Kim, M Kim, E Lee 2020 27th Asia-Pacific Software Engineering Conference (APSEC), 511-512, 2020 | 3 | 2020 |
| Multi-objective Optimization-based Bug-fixing Template Mining for Automated Program Repair M Kim, Y Kim, K Kim, E Lee Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022 | 2 | 2022 |
| Noisy Token Removal for Bug Localization: The Impact of Semantically Confusing Misguiding Terms Y Kim, M Kim, E Lee IEEE Access, 2024 | 1 | 2024 |
| How does the first buggy file work well for iterative IR-based bug localization? M Kim, Y Kim, E Lee Proceedings of the 37th ACM/SIGAPP Symposium on Applied Computing, 1509-1516, 2022 | 1 | 2022 |
| Production and test bug report classification based on transfer learning M Kim, Y Kim, E Lee Information and Software Technology, 107685, 2025 | | 2025 |
| Improving Transformer-based Program Repair Model through False Behavior Diagnosis Y Kim, M Kim, E Lee Proceedings of the 2023 Conference on Empirical Methods in Natural Language …, 2023 | | 2023 |
| ProTeC: Production and Test Bug Report Classification Based on Deep Transfer Learning M Kim, Y Kim, E Lee Available at SSRN 3996179, 0 | | |
