| TBar: Revisiting template-based automated program repair K Liu, A Koyuncu, D Kim, TF Bissyandé Proceedings of the 28th ACM SIGSOFT international symposium on software …, 2019 | 386 | 2019 |
| Fixminer: Mining relevant fix patterns for automated program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon Empirical Software Engineering 25, 1980-2024, 2020 | 267 | 2020 |
| Avatar: Fixing semantic bugs with fix patterns of static analysis violations K Liu, A Koyuncu, D Kim, TF Bissyandé 2019 IEEE 26th International Conference on Software Analysis, Evolution and …, 2019 | 225 | 2019 |
| You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon 2019 12th IEEE conference on software testing, validation and verification …, 2019 | 193 | 2019 |
| On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs K Liu, S Wang, A Koyuncu, K Kim, TF Bissyandé, D Kim, P Wu, J Klein, ... Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 181 | 2020 |
| Learning to spot and refactor inconsistent method names K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 1-12, 2019 | 146 | 2019 |
| Evaluating representation learning of code changes for predicting patch correctness in program repair H Tian, K Liu, AK Kaboré, A Koyuncu, L Li, J Klein, TF Bissyandé Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020 | 131 | 2020 |
| iFixR: Bug report driven program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, M Monperrus, J Klein, Y Le Traon Proceedings of the 2019 27th ACM joint meeting on european software …, 2019 | 120 | 2019 |
| A critical review on the evaluation of automated program repair systems K Liu, L Li, A Koyuncu, D Kim, Z Liu, J Klein, TF Bissyandé Journal of Systems and Software 171, 110817, 2021 | 102 | 2021 |
| LSRepair: Live search of fix ingredients for automated program repair K Liu, A Koyuncu, K Kim, D Kim, TF Bissyandé 2018 25th Asia-Pacific Software Engineering Conference (APSEC), 658-662, 2018 | 88 | 2018 |
| A closer look at real-world patches K Liu, D Kim, A Koyuncu, L Li, TF Bissyandé, Y Le Traon 2018 IEEE International Conference on Software Maintenance and Evolution …, 2018 | 67 | 2018 |
| D&c: A divide-and-conquer approach to ir-based bug localization A Koyuncu, TF Bissyandé, D Kim, K Liu, J Klein, M Monperrus, YL Traon arXiv preprint arXiv:1902.02703, 2019 | 37 | 2019 |
| The best of both worlds: Combining learned embeddings with engineered features for accurate prediction of correct patches H Tian, K Liu, Y Li, AK Kaboré, A Koyuncu, A Habib, L Li, J Wen, J Klein, ... ACM Transactions on Software Engineering and Methodology 32 (4), 1-34, 2023 | 36 | 2023 |
| Where were the repair ingredients for defects4j bugs? exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems D Yang, K Liu, D Kim, A Koyuncu, K Kim, H Tian, Y Lei, X Mao, J Klein, ... Empirical Software Engineering 26, 1-33, 2021 | 33 | 2021 |
| iBiR: Bug-report-driven Fault Injection A Khanfir, A Koyuncu, M Papadakis, M Cordy, TF Bissyandé, J Klein, ... ACM Transactions on Software Engineering and Methodology 32 (2), 1-31, 2023 | 30 | 2023 |
| Impact of tool support in patch construction A Koyuncu, TF Bissyandé, D Kim, J Klein, M Monperrus, YL Traon International Symposium on Software Testing and Analysis (ISSTA), 2017 | 26 | 2017 |
| Learning to spot and refactor inconsistent method names. In 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE) K Liu, D Kim, TF Bissyandé, T Kim, K Kim, A Koyuncu, S Kim, Y Le Traon IEEE, 1ś12, 2019 | 22 | 2019 |
| Large-scale, Independent and Comprehensive study of the power of LLMs for test case generation WC Ouédraogo, K Kaboré, H Tian, Y Song, A Koyuncu, J Klein, D Lo, ... arXiv preprint arXiv:2407.00225, 2024 | 9 | 2024 |
| Reliable fix patterns inferred from static checkers for automated program repair K Liu, J Zhang, L Li, A Koyuncu, D Kim, C Ge, Z Liu, J Klein, TF Bissyandé ACM Transactions on Software Engineering and Methodology 32 (4), 1-38, 2023 | 9 | 2023 |
| Flexirepair: Transparent program repair with generic patches A Koyuncu, TF Bissyandé, J Klein, YL Traon arXiv preprint arXiv:2011.13280, 2020 | 9 | 2020 |
Tegawendé F. BissyandéChief Scientist II / ERC Fellow / TruX @SnT, University of LuxembourgVerifierad e-postadress på uni.lu