| Two-dimensional nanosheets produced by liquid exfoliation of layered materials JN Coleman, M Lotya, A O’Neill, SD Bergin, PJ King, U Khan, K Young, ... Science 331 (6017), 568-571, 2011 | 7991 | 2011 |
| All-printed thin-film transistors from networks of liquid-exfoliated nanosheets AG Kelly, T Hallam, C Backes, A Harvey, AS Esmaeily, I Godwin, J Coelho, ... Science 356 (6333), 69-73, 2017 | 548 | 2017 |
| High-performance sensors based on molybdenum disulfide thin films. K Lee, R Gatensby, N McEvoy, T Hallam, GS Duesberg Advanced materials (Deerfield Beach, Fla.) 25 (46), 6699-6702, 2013 | 538 | 2013 |
| Atomically precise placement of single dopants in Si SR Schofield, NJ Curson, MY Simmons, FJ Rueß, T Hallam, L Oberbeck, ... Physical review letters 91 (13), 136104, 2003 | 513 | 2003 |
| Raman characterization of platinum diselenide thin films M O’Brien, N McEvoy, C Motta, JY Zheng, NC Berner, J Kotakoski, ... 2D Materials 3 (2), 021004, 2016 | 222 | 2016 |
| Toward atomic-scale device fabrication in silicon using scanning probe microscopy FJ Ruess, L Oberbeck, MY Simmons, KEJ Goh, AR Hamilton, T Hallam, ... Nano Letters 4 (10), 1969-1973, 2004 | 218 | 2004 |
| Controlled synthesis of transition metal dichalcogenide thin films for electronic applications R Gatensby, N McEvoy, K Lee, T Hallam, NC Berner, E Rezvani, ... Applied Surface Science 297, 139-146, 2014 | 192 | 2014 |
| Mapping of low-frequency Raman modes in CVD-grown transition metal dichalcogenides: Layer number, stacking orientation and resonant effects M O’Brien, N McEvoy, D Hanlon, T Hallam, JN Coleman, GS Duesberg Scientific reports 6 (1), 19476, 2016 | 162 | 2016 |
| Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy KL Jungjohann, JE Evans, JA Aguiar, I Arslan, ND Browning Microscopy and Microanalysis 18 (3), 621-627, 2012 | 145 | 2012 |
| Strain, bubbles, dirt, and folds: a study of graphene Polymer‐Assisted transfer T Hallam, NC Berner, C Yim, GS Duesberg Advanced Materials Interfaces 1 (6), 1400115, 2014 | 134 | 2014 |
| Transition metal dichalcogenide growth via close proximity precursor supply M O'Brien, N McEvoy, T Hallam, HY Kim, NC Berner, D Hanlon, K Lee, ... Scientific reports 4 (1), 7374, 2014 | 113 | 2014 |
| All-printed capacitors from graphene-BN-graphene nanosheet heterostructures AG Kelly, D Finn, A Harvey, T Hallam, JN Coleman Applied Physics Letters 109 (2), 2016 | 106 | 2016 |
| Highly sensitive, transparent, and flexible gas sensors based on gold nanoparticle decorated carbon nanotubes K Lee, V Scardaci, HY Kim, T Hallam, H Nolan, BE Bolf, GS Maltbie, ... Sensors and Actuators B: Chemical 188, 571-575, 2013 | 96 | 2013 |
| Functionalisation of graphene surfaces with downstream plasma treatments N McEvoy, H Nolan, NA Kumar, T Hallam, GS Duesberg Carbon 54, 283-290, 2013 | 96 | 2013 |
| Progress in silicon-based quantum computing RG Clark, R Brenner, TM Buehler, V Chan, NJ Curson, AS Dzurak, ... Philosophical Transactions of the Royal Society of London. Series A …, 2003 | 90 | 2003 |
| Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy T Hallam, MJ Lee, N Zhao, I Nandhakumar, M Kemerink, M Heeney, ... Physical Review Letters 103 (25), 256803, 2009 | 81 | 2009 |
| Measurement of phosphorus segregation in silicon at the atomic scale using scanning tunneling microscopy L Oberbeck, NJ Curson, T Hallam, MY Simmons, G Bilger, RG Clark Applied Physics Letters 85 (8), 1359-1361, 2004 | 74 | 2004 |
| A scanning Kelvin probe study of charge trapping in zone-cast pentacene thin film transistors T Hallam, CM Duffy, T Minakata, M Ando, H Sirringhaus Nanotechnology 20 (2), 025203, 2008 | 61 | 2008 |
| Scanning probe microscopy for silicon device fabrication MY Simmons, FJ Ruess, KEJ Goh, T Hallam, SR Schofield, L Oberbeck, ... Molecular Simulation 31 (6-7), 505-515, 2005 | 60 | 2005 |
| Molybdenum disulfide/pyrolytic carbon hybrid electrodes for scalable hydrogen evolution H Nolan, N McEvoy, M O'Brien, NC Berner, C Yim, T Hallam, ... Nanoscale 6 (14), 8185-8191, 2014 | 59 | 2014 |
Niall McEvoyTaighde Eireann - Research Ireland (formerly Trinity College Dublin)Verifierad e-postadress på tcd.ie