Valley splittings in Si/SiGe quantum dots with a germanium spike in the silicon well T McJunkin, ER MacQuarrie, L Tom, SF Neyens, JP Dodson, ... Physical Review B 104 (8), 085406, 2021 | 37 | 2021 |
Defect Identification of Atomic Layer Deposited Aluminum Oxide using Kelvin Probe Force Microscopy L Tom, Z Krebs, J Varley, E Joseph, M Eriksson, K Ray, V Lordi, V Brar, ... Bulletin of the American Physical Society, 2024 | | 2024 |
Defect Identification Using Kelvin Probe Force Microscopy and Optimization of Long Single-Channel One-Dimensional Quantum Wires L Tom The University of Wisconsin-Madison, 2023 | | 2023 |
Characterizing Charged Defects in Oxide-on-Silicon using Kelvin Probe Force Microscopy SNCMGF Leah Tom, Zachary J. Krebs, Emily Joseph, Keith G Ray, Joel Varley ... Bulletin of the American Physical Society, 2023 | | 2023 |
Engineering long ballistic single mode electrostatically defined quantum wires for future detection of Majorana zero modes K Kumar, K Hudson, L Tom, B Ramsay, Y Ashlea Alava, Q Wang, YK Lee, ... APS March Meeting Abstracts 2023, F52. 010, 2023 | | 2023 |
Optimizing Quantum Wires for Single-Mode Transmission using Electrostatics Simulations SNCMGF Leah Tom, Karina Hudson, Krittika Kumar, Alexander Hamilton 2022 Gordon Godfrey Workshop: Spins, Topology and Strong Electron Correlations, 2022 | | 2022 |
Characterizing Charged Defects in Oxide-on-Silicon using Kelvin Probe Force Microscopy SNCMGF Leah Tom, Zachary J. Krebs, Justin T. White, Wyatt A. Behn, Mark A ... Bulletin of the American Physical Society, 2022 | | 2022 |