ติดตาม
Zhen Cui
Zhen Cui
ยืนยันอีเมลแล้วที่ qti.qualcomm.com
ชื่อ
อ้างโดย
อ้างโดย
ปี
PVP-mediated galvanic replacement synthesis of smart elliptic Cu–Ag nanoflakes for electrically conductive pastes
Y Zhang, P Zhu, G Li, Z Cui, C Cui, K Zhang, J Gao, X Chen, G Zhang, ...
ACS applied materials & interfaces 11 (8), 8382-8390, 2019
422019
Thermal kinetic and mechanical behaviors of pressure-assisted Cu nanoparticles sintering: A molecular dynamics study
D Hu, Z Cui, J Fan, X Fan, G Zhang
Results in Physics 19, 103486, 2020
402020
General coupling model for electromigration and one-dimensional numerical solutions
Z Cui, X Fan, G Zhang
Journal of Applied Physics 125 (10), 2019
272019
The influence of tilt grain boundaries on the mechanical properties of bicrystalline graphene nanoribbons
N Xu, JG Guo, Z Cui
Physica E: Low-dimensional Systems and Nanostructures 84, 168-174, 2016
262016
Effects of Defect and Temperature on the Mechanical Performance of WS2: A Multiscale Analysis
H Tang, D Hu, Z Cui, H Ye, G Zhang
The Journal of Physical Chemistry C 125 (4), 2680-2690, 2021
222021
Molecular dynamic study for concentration-dependent volume relaxation of vacancy
Z Cui, X Fan, G Zhang
Microelectronics Reliability 120, 114127, 2021
172021
Hydrolysis kinetic study of CaAlSiN3: Eu2+ red phosphor with both water immersion test and first-principles calculation
J Fan, L Zhou, Z Cui, S Chen, X Fan, G Zhang
Journal of Luminescence 219, 116874, 2020
172020
Theoretical investigations of the interfacial sliding and buckling of graphene on a flexible substrate
Z Cui, JG Guo
AIP Advances 6 (12), 2016
132016
Coupling model of electromigration and experimental verification–Part I: Effect of atomic concentration gradient
Z Cui, X Fan, Y Zhang, S Vollebregt, J Fan, G Zhang
Journal of the Mechanics and Physics of Solids 174, 105257, 2023
112023
Implementation of general coupling model of electromigration in ANSYS
Z Cui, X Fan, G Zhang
2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 1632-1637, 2020
112020
The interface adhesion of CaAlSiN3: Eu2+ phosphor/silicone used in light-emitting diode packaging: A first principles study
Z Cui, J Fan, HJ van Ginkel, X Fan, G Zhang
Applied Surface Science 510, 145251, 2020
112020
Effects of temperature and grain size on diffusivity of aluminium: electromigration experiment and molecular dynamic simulation
Z Cui, Y Zhang, D Hu, S Vollebregt, J Fan, X Fan, G Zhang
Journal of Physics: Condensed Matter 34 (17), 175401, 2022
92022
Insights into the high-sulphur aging of sintered silver nanoparticles: An experimental and ReaxFF study
D Hu, T Gu, Z Cui, S Vollebregt, X Fan, G Zhang, J Fan
Corrosion Science 192, 109846, 2021
92021
Multi-physics driven electromigration study: multi-scale modeling and experiment
Z Cui
92021
Coupling model of electromigration and experimental verification–Part II: Impact of thermomigration
Z Cui, X Fan, Y Zhang, S Vollebregt, J Fan, G Zhang
Journal of the Mechanics and Physics of Solids 174, 105256, 2023
72023
Implementation of fully coupled electromigration theory in COMSOL
Z Cui, X Fan, G Zhang
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 233-238, 2022
72022
Sulfur-rich ageing mechanism of silicone encapsulant used in LED packaging: An experimental and molecular dynamic simulation study
W Chen, Y Chen, Y Cao, Z Cui, X Fan, G Zhang, J Fan
Frontiers in Materials 9, 819294, 2022
52022
Interfacial properties of Cu/SiO2 using a multiscale modelling approach in electronic packages
Z Cui, X Chen, X Fan, G Zhang
2018 19th International Conference on Thermal, Mechanical and Multi-Physics …, 2018
32018
Electromigration-induced local dewetting in Cu films
Y Zhang, J Mo, Z Cui, S Vollebregt, G Zhang
2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023
22023
Effect of Passivation and Mechanical Constraint on Electromigration in Interconnect
Z Cui, X Fan, G Zhang
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 1327-1331, 2023
12023
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บทความ 1–20