Addition energies and vibrational fine structure measured in electromigrated single‐molecule junctions based on an oligophenylenevinylene derivative EA Osorio, K O'Neill, N Stuhr‐Hansen, OF Nielsen, T Bjørnholm, ... Advanced Materials 19 (2), 281-285, 2007 | 165 | 2007 |
Electronic excitations of a single molecule contacted in a three-terminal configuration EA Osorio, K O'Neill, M Wegewijs, N Stuhr-Hansen, J Paaske, ... Nano letters 7 (11), 3336-3342, 2007 | 163 | 2007 |
Temperature dependence of three-terminal molecular junctions with sulfur end-functionalized tercyclohexylidenes M Poot, E Osorio, K O'Neill, JM Thijssen, D Vanmaekelbergh, ... Nano letters 6 (5), 1031-1035, 2006 | 144 | 2006 |
Self-breaking in planar few-atom Au constrictions for nanometer-spaced electrodes K O’Neill, EA Osorio, HSJ Van der Zant Applied Physics Letters 90 (13), 2007 | 137 | 2007 |
Molecular three-terminal devices: fabrication and measurements HSJ Van Der Zant, YV Kervennic, M Poot, K O’Neill, Z de Groot, ... Faraday discussions 131, 347-356, 2006 | 133 | 2006 |
In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy HB Heersche, G Lientschnig, K O’Neill, HSJ van der Zant, ... Applied Physics Letters 91 (7), 2007 | 132 | 2007 |
Microfabricated mounts for high-throughput macromolecular cryocrystallography RE Thorne, Z Stum, J Kmetko, K O'Neill, R Gillilan Applied Crystallography 36 (6), 1455-1460, 2003 | 89 | 2003 |
Low-voltage gallium–indium–zinc–oxide thin film transistors based logic circuits on thin plastic foil: Building blocks for radio frequency identification application AK Tripathi, EC Smits, J Van Der Putten, M van Neer, K Myny, M Nag, ... Applied Physics Letters 98 (16), 2011 | 83 | 2011 |
The MINDView brain PET detector, feasibility study based on SiPM arrays AJ González, S Majewski, F Sánchez, S Aussenhofer, A Aguilar, P Conde, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2016 | 73 | 2016 |
Semiconductor photomultiplier with baseline restoration for a fast terminal signal output including output loads to correct an overshoot of an output signal (as amended) K O'neill, L Wall, JC Jackson US Patent 9,939,536, 2018 | 61 | 2018 |
High-volume silicon photomultiplier production, performance, and reliability C Jackson, K O’Neill, L Wall, B McGarvey Optical Engineering 53 (8), 081909-081909, 2014 | 53 | 2014 |
Electromigrated molecular junctions HSJ Van der Zant, EA Osorio, M Poot, K O'Neill physica status solidi (b) 243 (13), 3408-3412, 2006 | 49 | 2006 |
Charge transport in organic transistors accounting for a wide distribution of carrier energies—Part II: TFT modeling F Torricelli, K O'Neill, GH Gelinck, K Myny, J Genoe, E Cantatore IEEE transactions on electron devices 59 (5), 1520-1528, 2012 | 47 | 2012 |
Phase-matched second harmonic generation in asymmetric double quantum wells KL Vodopyanov, K O’Neill, GB Serapiglia, CC Phillips, M Hopkinson, ... Applied physics letters 72 (21), 2654-2656, 1998 | 47 | 1998 |
Design status of ASPIICS, an externally occulted coronagraph for PROBA-3 E Renotte, A Alia, A Bemporad, J Bernier, C Bramanti, S Buckley, ... Solar Physics and Space Weather Instrumentation VI 9604, 71-85, 2015 | 46 | 2015 |
Fast timing silicon photomultipliers for scintillation detectors JY Yeom, R Vinke, N Pavlov, S Bellis, L Wall, K O'Neill, C Jackson, ... IEEE Photonics Technology Letters 25 (14), 1309-1312, 2013 | 36 | 2013 |
Crossover from two-dimensional to one-dimensional collective pinning in E Slot, HSJ Van Der Zant, K O’neill, RE Thorne Physical Review B 69 (7), 073105, 2004 | 31 | 2004 |
Semiconductor photomultiplier and readout method N Pavlov, C Jackson, K O'neill US Patent 9,634,156, 2017 | 29 | 2017 |
Imaging shear in sliding charge-density waves by x-ray diffraction topography Y Li, SG Lemay, JH Price, K Cicak, K O'Neill, K Ringland, KD Finkelstein, ... Physical review letters 83 (17), 3514, 1999 | 28 | 1999 |
Performance Evaluation of SensL SiPM Arrays for High-Resolution PET JD Thiessen, C Jackson, K O’Neill, D Bishop, P Kozlowski, F Retière, ... IEEE MIC conference record 2013, 2013 | 27 | 2013 |