Unlocking hardware security assurance: The potential of LLMs X Meng, A Srivastava, A Arunachalam, A Ray, PH Silva, R Psiakis, ... arXiv preprint arXiv:2308.11042, 2023 | 26 | 2023 |
Machine learning approach to thickness prediction from in situ spectroscopic ellipsometry data for atomic layer deposition processes A Arunachalam, SN Berriel, C Feit, U Kumar, S Seal, K Basu, P Banerjee Journal of Vacuum Science & Technology A 40 (1), 2022 | 12 | 2022 |
In situ ellipsometry aided rapid ALD process development and parameter space visualization of cerium oxide nanofilms U Kumar, C Feit, SN Berriel, A Arunachalam, TS Sakthivel, K Basu, ... Journal of Vacuum Science & Technology A 39 (6), 2021 | 9 | 2021 |
Survey on quantum noise-aware machine learning C Lu, S Kundu, A Arunachalam, K Basu 2022 IEEE 15th Dallas Circuit And System Conference (DCAS), 1-2, 2022 | 6 | 2022 |
Machine learning-enhanced efficient spectroscopic ellipsometry modeling A Arunachalam, SN Berriel, P Banerjee, K Basu arXiv preprint arXiv:2201.04933, 2022 | 6 | 2022 |
Hardcompress: A novel hardware-based low-power compression scheme for dnn accelerators A Arunachalam, S Kundu, A Raha, S Banerjee, S Natarajan, K Basu 2021 22nd International Symposium on Quality Electronic Design (ISQED), 457-462, 2021 | 4 | 2021 |
A novel low-power compression scheme for systolic array-based deep learning accelerators A Arunachalam, S Kundu, A Raha, S Banerjee, S Natarajan, K Basu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 3 | 2022 |
Real-time artificial intelligence enhanced defect engineering in CeO2 nanostructures U Kumar, A Arunachalam, C Feit, SN Berriel, K Basu, P Banerjee, S Seal Journal of Vacuum Science & Technology A 41 (6), 2023 | 2 | 2023 |
Unsupervised learning-based early anomaly detection in AMS circuits of automotive SoCs A Arunachalam, A Kizhakkayil, S Kundu, A Raha, S Banerjee, R Jin, F Su, ... 2022 IEEE International Test Conference (ITC), 229-238, 2022 | 2 | 2022 |
Fault resilience of DNN accelerators for compressed sensor inputs A Arunachalam, S Kundu, A Raha, S Banerjee, K Basu 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 329-332, 2022 | 2 | 2022 |
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits A Arunachalam, S Das, M Rajan, F Su, X Jin, S Banerjee, A Raha, ... 2023 IEEE International Test Conference (ITC), 266-275, 2023 | 1 | 2023 |
Search space reduction for efficient quantum compilation A Srivastava, C Lu, N Choudhury, A Arunachalam, K Basu Proceedings of the Great Lakes Symposium on VLSI 2023, 109-114, 2023 | 1 | 2023 |
NSPG: Natural language Processing-based Security Property Generator for Hardware Security Assurance X Meng, A Srivastava, A Arunachalam, A Ray, PH Silva, R Psiakis, ... Proceedings of the 61st ACM/IEEE Design Automation Conference, 1-6, 2024 | | 2024 |
Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning A Arunachalam, I Kintz, S Banerjee, A Raha, X Jin, F Su, VP Prasanth, ... arXiv preprint arXiv:2404.01632, 2024 | | 2024 |
Towards AI and Hardware Synergy A Arunachalam | | 2023 |
Trusted data management systems and methods Y Nagao, V Tiwari, J Kannadkar, A Arunachalam US Patent App. 18/198,278, 2023 | | 2023 |
Hardware accelerators for deep reinforcement learning VK Mishra, K Basu, A Arunachalam Artificial Intelligence and Machine Learning for Multi-Domain Operations …, 2023 | | 2023 |
In-Situ Ellipsometry Aided Rapid ALD Process Development and Parameter Space Visualization U Kumar, C Feit, S Berriel, A Arunachalam, TS Sakthivel, K Basu, ... Electrochemical Society Meeting Abstracts 240, 872-872, 2021 | | 2021 |
Benefits and Challenges of Utilizing Hardware Performance Counters for COPPA Violation Detection AP Kuruvila, A Arunachalam, K Basu 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020 | | 2020 |