| An overview of the Trilinos project MA Heroux, RA Bartlett, VE Howle, RJ Hoekstra, JJ Hu, TG Kolda, ... ACM Transactions on Mathematical Software (TOMS) 31 (3), 397-423, 2005 | 1479 | 2005 |
| Two‐dimensional modeling of high plasma density inductively coupled sources for materials processing PLG Ventzek, RJ Hoekstra, MJ Kushner Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1994 | 458 | 1994 |
| Two‐dimensional hybrid model of inductively coupled plasma sources for etching PLG Ventzek, TJ Sommerer, RJ Hoekstra, MJ Kushner Applied physics letters 63 (5), 605-607, 1993 | 220 | 1993 |
| Microtrenching resulting from specular reflection during chlorine etching of silicon RJ Hoekstra, MJ Kushner, V Sukharev, P Schoenborn Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 144 | 1998 |
| Integrated plasma equipment model for polysilicon etch profiles in an inductively coupled plasma reactor with subwafer and superwafer topography RJ Hoekstra, MJ Grapperhaus, MJ Kushner Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 15 (4 …, 1997 | 144 | 1997 |
| Predictions of ion energy distributions and radical fluxes in radio frequency biased inductively coupled plasma etching reactors RJ Hoekstra, MJ Kushner Journal of applied physics 79 (5), 2275-2286, 1996 | 105 | 1996 |
| A 10‐year follow‐up after transurethral resection of the prostate, contact laser prostatectomy and electrovaporization in men with benign prostatic hyperplasia; long‐term … RJ Hoekstra, HHE Van Melick, ET Kok, JLH Ruud Bosch BJU international 106 (6), 822-826, 2010 | 85 | 2010 |
| Performance of a parallel algebraic multilevel preconditioner for stabilized finite element semiconductor device modeling PT Lin, JN Shadid, M Sala, RS Tuminaro, GL Hennigan, RJ Hoekstra Journal of Computational Physics 228 (17), 6250-6267, 2009 | 76 | 2009 |
| Spatial distributions of dust particles in plasmas generated by capacitively coupled radiofrequency discharges SJ Choi, PLG Ventzek, RJ Hoekstra, MJ Kushner Plasma Sources Science and Technology 3 (3), 418, 1994 | 67 | 1994 |
| A parallel preconditioning strategy for efficient transistor-level circuit simulation HK Thornquist, ER Keiter, RJ Hoekstra, DM Day, EG Boman Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009 | 55 | 2009 |
| Xyce Parallel Electronic Simulator: users' guide. ER Keiter, T Mei, TV Russo, EL Rankin, RL Schiek, HK Thornquist, ... Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA …, 2012 | 52* | 2012 |
| Penile intraepithelial neoplasia: nomenclature, incidence and progression to malignancy in the Netherlands RJ Hoekstra, EJ Trip, FJ Ten Kate, S Horenblas, MTWT Lock International Journal of Urology 26 (3), 353-357, 2019 | 43 | 2019 |
| Comparison of two-dimensional and three-dimensional models for profile simulation of poly-Si etching of finite length trenches RJ Hoekstra, MJ Kushner Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (6 …, 1998 | 43 | 1998 |
| Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation ET Phipps, RA Bartlett, DM Gay, RJ Hoekstra Advances in automatic differentiation, 351-362, 2008 | 40 | 2008 |
| The Xyce™ parallel electronic simulator–an overview S Hutchinson, E Keiter, R Hoekstra, H Watts, A Waters, T Russo, ... Parallel Computing: Advances and Current Issues, 165-172, 2002 | 40 | 2002 |
| Redesigning the WARPED simulation kernel for analysis and application development DE Martin, PA Wilsey, RJ Hoekstra, ER Keiter, SA Hutchinson, TV Russo, ... 36th Annual Simulation Symposium, 2003., 216-223, 2003 | 31 | 2003 |
| Parallel transistor-level circuit simulation ER Keiter, HK Thornquist, RJ Hoekstra, TV Russo, RL Schiek, EL Rankin Simulation and Verification of Electronic and Biological Systems, 1-21, 2011 | 30 | 2011 |
| The effect of subwafer dielectrics on plasma properties in plasma etching reactors RJ Hoekstra, MJ Kushner Journal of applied physics 77 (8), 3668-3673, 1995 | 26 | 1995 |
| Simulation of neutron radiation damage in silicon semiconductor devices GL Hennigan, RJ Hoekstra, JP Castro, DA Fixel, JN Shadid Sandia National Laboratories (SNL): Albuquerque, NM, USA, 2007 | 25 | 2007 |
| Trilinos home page MA Heroux, RA Bartlett, VE Howle, RJ Hoekstra, JJ Hu, TG Kolda, ... Go online to http://software. sandia. gov/trilinos, 2004 | 24 | 2004 |
