| Dislocation-toughened ceramics L Porz, AJ Klomp, X Fang, N Li, C Yildirim, C Detlefs, E Bruder, M Höfling, ... Materials Horizons 8 (5), 1528-1537, 2021 | 111 | 2021 |
| The ESRF dark-field x-ray microscope at ID06 M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ... IOP conference series: Materials science and engineering 580 (1), 012007, 2019 | 69 | 2019 |
| Mapping of individual dislocations with dark-field X-ray microscopy AC Jakobsen, H Simons, W Ludwig, C Yildirim, H Leemreize, L Porz, ... Journal of Applied Crystallography 52, 122-132, 2019 | 58 | 2019 |
| Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations S Gustafson, W Ludwig, P Shade, D Naragani, D Pagan, P Cook, ... Nature communications 11 (1), 3189, 2020 | 48 | 2020 |
| Multilayer Laue lenses at high X-ray energies: performance and applications KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ... Optics express 27 (5), 7120-7138, 2019 | 46 | 2019 |
| A multi-scale study of the interaction of Sn solutes with dislocations during static recovery in α-Fe N Mavrikakis, C Detlefs, PK Cook, M Kutsal, APC Campos, M Gauvin, ... Acta Materialia 174, 92-104, 2019 | 41 | 2019 |
| In situ visualization of long-range defect interactions at the edge of melting LE Dresselhaus-Marais, G Winther, M Howard, A Gonzalez, SR Breckling, ... Science Advances 7 (29), eabe8311, 2021 | 40 | 2021 |
| Revealing the role of molecular rigidity on the fragility evolution of glass-forming liquids C Yildirim, JY Raty, M Micoulaut Nature communications 7 (1), 11086, 2016 | 40 | 2016 |
| Reciprocal space mapping and strain scanning using X-ray diffraction microscopy HF Poulsen, PK Cook, H Leemreize, AF Pedersen, C Yildirim, M Kutsal, ... Journal of Applied Crystallography 51 (5), 1428-1436, 2018 | 33 | 2018 |
| Probing nanoscale structure and strain by dark-field x-ray microscopy C Yildirim, P Cook, C Detlefs, H Simons, HF Poulsen MRS Bulletin 45 (4), 277-282, 2020 | 29 | 2020 |
| Sub-surface measurements of the austenite microstructure in response to martensitic phase transformation A Bucsek, H Seiner, H Simons, C Yildirim, P Cook, Y Chumlyakov, ... Acta Materialia 179, 273-286, 2019 | 29 | 2019 |
| Topological phases of chalcogenide glasses encoded in the melt dynamics P Boolchand, M Bauchy, M Micoulaut, C Yildirim physica status solidi (b) 255 (6), 1800027, 2018 | 25 | 2018 |
| Extensive 3D mapping of dislocation structures in bulk aluminum C Yildirim, HF Poulsen, G Winther, C Detlefs, PH Huang, ... Scientific Reports 13 (1), 3834, 2023 | 24 | 2023 |
| 3D mapping of orientation variation and local residual stress within individual grains of pearlitic steel using synchrotron dark field X-ray microscopy C Yildirim, C Jessop, J Ahlström, C Detlefs, Y Zhang Scripta Materialia 197, 113783, 2021 | 23 | 2021 |
| 4D microstructural evolution in a heavily deformed ferritic alloy: A new perspective in recrystallisation studies C Yildirim, N Mavrikakis, PK Cook, R Rodriguez-Lamas, M Kutsal, ... Scripta Materialia 214, 114689, 2022 | 21 | 2022 |
| darfix–data analysis for dark-field X-ray microscopy J Garriga Ferrer, R Rodríguez-Lamas, H Payno, W De Nolf, P Cook, ... Journal of Synchrotron Radiation 30 (3), 527-537, 2023 | 16 | 2023 |
| Anomalous diffusion and non-monotonic relaxation processes in Ge-Se liquids C Yildirim, JY Raty, M Micoulaut The Journal of Chemical Physics 144 (22), 2016 | 15 | 2016 |
| IOP Conference Series M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ... Materials Science and Engineering 580, 012007, 2019 | 14 | 2019 |
| Universal amorphous-amorphous transition in GexSe100−x glasses under pressure C Yildirim, M Micoulaut, P Boolchand, I Kantor, O Mathon, JP Gaspard, ... Scientific reports 6 (1), 27317, 2016 | 14 | 2016 |
| Quantitative mapping of nanotwin variants in the bulk J Schultheiß, L Porz, LK Venkataraman, M Höfling, C Yildirim, P Cook, ... Scripta Materialia 199, 113878, 2021 | 13 | 2021 |
Carsten DetlefsEuropean Synchrotron Radiation Facilityesrf.fr üzerinde doğrulanmış e-posta adresine sahip