| Gevrey regularity for the attractor of the 3D Navier–Stokes–Voight equations VK Kalantarov, B Levant, ES Titi Journal of Nonlinear Science 19, 133-152, 2009 | 126 | 2009 |
| Analytic study of shell models of turbulence P Constantin, B Levant, ES Titi Physica D: Nonlinear Phenomena 219 (2), 120-141, 2006 | 83 | 2006 |
| On the statistical properties of the 3D incompressible Navier-Stokes-Voigt model B Levant, F Ramos, ES Titi | 76 | 2010 |
| Regularity of inviscid shell models of turbulence P Constantin, B Levant, ES Titi Physical Review E—Statistical, Nonlinear, and Soft Matter Physics 75 (1 …, 2007 | 49 | 2007 |
| Cystoid macular edema: a correlation between macular volumetric parameters and visual acuity M Mimouni, Y Nahum, A Levant, B Levant, D Weinberger Canadian Journal of Ophthalmology 49 (2), 183-187, 2014 | 20 | 2014 |
| Correcting registration errors in digital printing B Levant US Patent 11,630,618, 2023 | 17 | 2023 |
| Correcting registration errors in digital printing B Levant US Patent US20210182001A1,US11321028B2, 2022 | 15 | 2022 |
| Statistical properties of nonlinear shell models of turbulence from linear advection models: rigorous results R Benzi, B Levant, I Procaccia, ES Titi Nonlinearity 20 (6), 1431, 2007 | 8 | 2007 |
| Automatic defect segmentation by unsupervised anomaly learning N Ofir, R Yacobi, O Granoviter, B Levant, O Shtalrid 2022 IEEE International Conference on Image Processing (ICIP), 306-310, 2022 | 7 | 2022 |
| Sharp lower bounds for the dimension of the global attractor of the Sabra shell model of turbulence P Constantin, B Levant, ES Titi Journal of Statistical Physics 127, 1173-1192, 2007 | 5 | 2007 |
| Direct yield prediction from SEM images L Choona, J Linshiz, S Pres, B Levant, N Tal, G Santoro, S Baudot, ... Metrology, Inspection, and Process Control XXXVII 12496, 183-191, 2023 | 1 | 2023 |
| Detecting a defective nozzle in a digital printing system B Levant, S Silberstein, T Yanir, A Guttman, AS TOV US Patent 12,214,601, 2025 | | 2025 |
| Machine learning based defect examination for semiconductor specimens B Sherman, B Levant, R Yacoby, B Dubovski, B Reshef, T Yeminy, ... US Patent App. 18/212,179, 2024 | | 2024 |
| Optimal determination of an overlay target using machine learning B Dubovski, R Yacoby, T Hsieh, KR Houchens, T Itzkovich, N Bomshtein, ... US Patent App. 18/583,777, 2024 | | 2024 |
| Machine learning based examination for process monitoring N Tal, B Levant, S Sinitsa, B Sturlesi, S Yogev, A Ariel, L Choona, P Shaul US Patent App. 18/113,032, 2024 | | 2024 |
| Machine learning based yield prediction B Levant, N Tal, R Yacoby, L Choona, P Shaul, JS Linshiz, S Yogev, ... US Patent App. 18/113,030, 2024 | | 2024 |
| End-to-end measurement for semiconductor specimens TH Peled, B Dubovski, N Tal, BM Skaria, B Levant, T Frank US Patent App. 17/947,972, 2024 | | 2024 |
| Image augmentation for machine learning based defect examination B Sherman, B Levant, R Yacoby, B Reshef, T Yeminy US Patent App. 17/947,989, 2024 | | 2024 |
| Time-domain optical metrology and inspection of semiconductor devices G Barak, M Chemama, S Ferber, Y Hainick, B Levant, Z Lindenfeld, ... US Patent App. 17/844,770, 2022 | | 2022 |
| Time-domain optical metrology and inspection of semiconductor devices G Barak, M Chemama, S Ferber, Y Hainick, B Levant, Z Lindenfeld, ... US Patent 11,366,398, 2022 | | 2022 |
Edriss S. TitiUniversity of Cambridge and Texas A&M Universitymath.tamu.edu üzerinde doğrulanmış e-posta adresine sahip