| Multifunctional nanoprobes for nanoscale chemical imaging and localized chemical delivery at surfaces and interfaces Y Takahashi, AI Shevchuk, P Novak, Y Zhang, N Ebejer, JV Macpherson, ... Angewandte Chemie-International Edition 50 (41), 9638-9642, 2011 | 323 | 2011 |
| The determination of atomic force microscope cantilever spring constants via dimensionalmethods for nanomechanical analysis CA Clifford, MP Seah Nanotechnology 16 (9), 1666, 2005 | 227 | 2005 |
| Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation CA Clifford, MP Seah Applied surface science 252 (5), 1915-1933, 2005 | 205 | 2005 |
| An accurate semi‐empirical equation for sputtering yields I: for argon ions MP Seah, CA Clifford, FM Green, IS Gilmore Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 163 | 2005 |
| Modelling of nanomechanical nanoindentation measurements using an AFM ornanoindenter for compliant layers on stiffer substrates CA Clifford, MP Seah Nanotechnology 17 (21), 5283, 2006 | 106 | 2006 |
| Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference material V Kestens, G Roebben, J Herrmann, Å Jämting, V Coleman, C Minelli, ... Journal of Nanoparticle Research 18, 1-22, 2016 | 100 | 2016 |
| Towards easy and reliable AFM tip shape determination using blind tip reconstruction EE Flater, GE Zacharakis-Jutz, BG Dumba, IA White, CA Clifford Ultramicroscopy 146, 130-143, 2014 | 89 | 2014 |
| Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration PJ Cumpson, CA Clifford, J Hedley Measurement Science and Technology 15 (7), 1337, 2004 | 81 | 2004 |
| Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods CA Clifford, MP Seah Measurement Science and Technology 20 (12), 125501, 2009 | 67 | 2009 |
| Sample preparation protocols for realization of reproducible characterization of single-wall carbon nanotubes JE Decker, ARH Walker, K Bosnick, CA Clifford, L Dai, J Fagan, S Hooker, ... Metrologia 46 (6), 682, 2009 | 57 | 2009 |
| Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance PJ Cumpson, J Hedley, CA Clifford Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 47 | 2005 |
| Nanoindentation measurement of Young’s modulus for compliant layers on stiffer substratesincluding the effect of Poisson’s ratios CA Clifford, MP Seah Nanotechnology 20 (14), 145708, 2009 | 46 | 2009 |
| Particle size distributions for cellulose nanocrystals measured by atomic force microscopy: an interlaboratory comparison M Bushell, J Meija, M Chen, W Batchelor, C Browne, JY Cho, CA Clifford, ... Cellulose 28, 1387-1403, 2021 | 37 | 2021 |
| The importance of international standards for the graphene community CA Clifford, EH Martins Ferreira, T Fujimoto, J Herrmann, AR Hight Walker, ... Nature Reviews Physics 3 (4), 233-235, 2021 | 36 | 2021 |
| Characterisation of the Structure of Graphene AJ Pollard, KR Paton, CA Clifford, E Legge, A Oikonomou, S Haigh, ... | 32 | 2017 |
| Terminology: the first step towards international standardisation of graphene and related 2D materials AJ Pollard, CA Clifford Journal of Materials Science 52 (24), 13685-13688, 2017 | 28 | 2017 |
| Simplified drift characterization in scanning probe microscopes using a simple two-point method CA Clifford, MP Seah Measurement Science and Technology 20 (9), 095103, 2009 | 27 | 2009 |
| Surface kinetics using line of sight techniques: the reaction of chloroform with Cu (111) RG Jones, CA Clifford Physical Chemistry Chemical Physics 1 (22), 5223-5228, 1999 | 27 | 1999 |
| Calibrated Kelvin-probe force microscopy of 2D materials using Pt-coated probes EG Castanon, AF Scarioni, HW Schumacher, S Spencer, R Perry, ... Journal of Physics Communications 4 (9), 095025, 2020 | 25 | 2020 |
| Cantilever spring-constant calibration in atomic force microscopy PJ Cumpson, CA Clifford, JF Portoles, JE Johnstone, M Munz Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques …, 2008 | 25 | 2008 |
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