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| Copper bump structures having sidewall protection layers JC Lin, YH Hwung, HY Chen, PH Tsai, YF Lin, CL Huang, FW Tsai, ... US Patent 9,093,314, 2015 | 9 | 2015 |
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| Effect of annealing on electronic carrier transport properties of gamma-irradiated AlGaN/GaN high electron mobility transistors A Yadav, C Schwarz, M Shatkhin, L Wang, E Flitsiyan, L Chernyak, L Liu, ... ECS Transactions 61 (4), 171, 2014 | 8 | 2014 |