| Effect of defects on the intrinsic strength and stiffness of graphene A Zandiatashbar, GH Lee, SJ An, S Lee, N Mathew, M Terrones, ... Nature communications 5 (1), 3186, 2014 | 762 | 2014 |
| Graphene nanoribbon composites MA Rafiee, W Lu, AV Thomas, A Zandiatashbar, J Rafiee, JM Tour, ... ACS nano 4 (12), 7415-7420, 2010 | 349 | 2010 |
| Control of epoxy creep using graphene A Zandiatashbar, CR Picu, N Koratkar Small 8 (11), 1676-1682, 2012 | 98 | 2012 |
| Raman spectroscopic imaging of graphene dispersion in polymer composites SA Shojaee, A Zandiatashbar, N Koratkar, DA Lucca Carbon 62, 510-513, 2013 | 60 | 2013 |
| Mechanical Behavior of Epoxy-Graphene Platelets Nanocomposites A Zandiatashbar, RC Picu, N Koratkar Journal of Engineering Materials and Technology 134, 031011-1, 2012 | 41 | 2012 |
| Synergy derived by combining graphene and carbon nanotubes as nanofillers in composites F Yavari, L Chen, A Zandiatashbar, Z Yu, N Koratkar Journal of nanoscience and nanotechnology 12 (4), 3165-3169, 2012 | 14 | 2012 |
| High-throughput automatic defect review for 300mm blank wafers with atomic force microscope A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015 | 13 | 2015 |
| Sub-angstrom roughness repeatability with tip-to-tip correlation A Zandiatashbar Nano-scientific.org, 2014 | 9 | 2014 |
| Automatic defect review for EUV photomask reticles by atomic force microscope A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park Photomask Technology 2015 9635, 302-310, 2015 | 6 | 2015 |
| Nanocomposite creep: control of epoxy creep using graphene (Small 11/2012) A Zandiatashbar, CR Picu, N Koratkar Small 8 (11), 1675-1675, 2012 | 5 | 2012 |
| Studying post-etching silicon crystal defects on 300mm wafers by automatic defect review AFM SILP ARDAVAN ZANDIATASHBAR, PATRICK A. TAYLOR, BYONG KIM, YOUNG-KOOK YOO ... SOLID STATE TECHNOLOGY 59, 22-26, 2016 | 4* | 2016 |
| Automated Non-Destructive Imaging and Characterization of the Graphene/hBN Moiré Pattern with Non-Contact Mode AFM A Zandiatashbar, B Kim, Y Yoo, K Lee Microscopy Today 23 (6), 26-31, 2015 | 4 | 2015 |
| Stiffness and strength of oxygen-functionalized graphene with vacancies A Zandiatashbar, E Ban, RC Picu Journal of Applied Physics 116 (18), 2014 | 4 | 2014 |
| Depth sensing indentation of nanoscale graphene platelets in nanocomposite thin films A Zandiatashbar, CR Picu, N Koratkar MRS Online Proceedings Library (OPL) 1312, mrsf10-1312-ii12-03, 2011 | 4 | 2011 |
| Introducing machine learning-based application for writer main pole CD metrology by dual beam FIB/SEM A Zandiatashbar, A Ngo, C Chien, J Baderot, S Martinez, B Darbon, ... Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 3 | 2021 |
| A hybrid total measurement uncertainty methodology for dual beam FIB/SEM metrology A Zandiatashbar, C Chien Metrology, Inspection, and Process Control for Microlithography XXXIV 11325 …, 2020 | 2 | 2020 |
| Fabrication of Graphene Platelet (GPL)-Epoxy Nanocomposites and Characterization by Nanoindentation OU Colak, A Zandiatashbar Advanced Materials Research 445, 809-814, 2012 | 2 | 2012 |
| Automated AFM for small-scale and large-scale surface profiling in CMP applications A Zandiatashbar, B Kim, Y Yoo, K Lee, A Jo, JS Lee, SJ Cho, S Park Metrology, Inspection, and Process Control for Microlithography XXXII 10585 …, 2018 | 1 | 2018 |
| In-line metrology for atomic resolution local height variation TG Kim, SW Kim, T Vanderwayer, AJ Jo, JS Lee, BW Ahn, ... 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2017 | 1 | 2017 |
| Study of Defect Morphology and Density on Mechano-Electrochemical Effect of Pipeline Corrosion S Rashidi, A Zandiatashbar, S Farhad ASME International Mechanical Engineering Congress and Exposition 85635 …, 2021 | | 2021 |
Nikhil KoratkarRensselaer Polytechnic Instituterpi.edu üzerinde doğrulanmış e-posta adresine sahip