Atomic-scale imaging of individual dopant atoms and clusters in highly n -type bulk Si PM Voyles, DA Muller, JL Grazul, PH Citrin, HJL Gossmann
Nature 416 (6883), 826-829, 2002
541 2002 H2 V3 O8 Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity Q Pang, C Sun, Y Yu, K Zhao, Z Zhang, PM Voyles, G Chen, Y Wei, ...
Advanced Energy Materials 8 (19), 1800144, 2018
515 2018 Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts AB Yankovich, B Berkels, W Dahmen, P Binev, SI Sanchez, SA Bradley, ...
Nature communications 5 (1), 4155, 2014
332 2014 Imaging individual atoms inside crystals with ADF-STEM PM Voyles, JL Grazul, DA Muller
Ultramicroscopy 96 (3-4), 251-273, 2003
298 2003 Stabilization of copper catalysts for liquid‐phase reactions by atomic layer deposition BJ O'Neill, DHK Jackson, AJ Crisci, CA Farberow, F Shi, AC Alba‐Rubio, ...
Angewandte Chemie 125 (51), 14053-14057, 2013
237 2013 Nanoscale Structure and Structural Relaxation in J Hwang, ZH Melgarejo, YE Kalay, I Kalay, MJ Kramer, DS Stone, ...
Physical review letters 108 (19), 195505, 2012
235 2012 Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition MY Ho, H Gong, GD Wilk, BW Busch, ML Green, PM Voyles, DA Muller, ...
Journal of Applied Physics 93 (3), 1477-1481, 2003
234 2003 Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB2 A Matsumoto, H Kumakura, H Kitaguchi, BJ Senkowicz, MC Jewell, ...
Applied physics letters 89 (13), 2006
178 2006 Fluctuation microscopy in the STEM PM Voyles, DA Muller
Ultramicroscopy 93 (2), 147-159, 2002
175 2002 Tm3 Fe5 O12 /Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications A Quindeau, CO Avci, W Liu, C Sun, M Mann, AS Tang, MC Onbasli, ...
Advanced Electronic Materials 3 (1), 1600376, 2017
161 2017 High‐performance, quantum dot nanocomposites for nonlinear optical and optical gain applications MA Petruska, AV Malko, PM Voyles, VI Klimov
Advanced Materials 15 (7‐8), 610-613, 2003
160 2003 Atom pair persistence in disordered materials from fluctuation microscopy JM Gibson, MMJ Treacy, PM Voyles
Ultramicroscopy 83 (3-4), 169-178, 2000
156 2000 Fast flexible electronics with strained silicon nanomembranes H Zhou, JH Seo, DM Paskiewicz, Y Zhu, GK Celler, PM Voyles, W Zhou, ...
Scientific reports 3 (1), 1291, 2013
152 2013 Total reaction and 2n -removal cross sections of 20–60A MeV RE Warner, RA Patty, PM Voyles, A Nadasen, FD Becchetti, JA Brown, ...
Physical Review C 54 (4), 1700, 1996
149 1996 Quantitative measurement of density in a shear band of metallic glass monitored along its propagation direction V Schmidt, H Rösner, M Peterlechner, G Wilde, PM Voyles
Physical review letters 115 (3), 035501, 2015
142 2015 Influence of film composition in quaternary Heusler alloy Co2 (Mn, Fe) Si thin films on tunnelling magnetoresistance of Co2 (Mn, Fe) Si/MgO-based magnetic tunnel junctions H Liu, T Kawami, K Moges, T Uemura, M Yamamoto, F Shi, PM Voyles
Journal of Physics D: Applied Physics 48 (16), 164001, 2015
137 2015 Fluctuation microscopy: a probe of atomic correlations in disordered materials PM Voyles, JM Gibson, MMJ Treacy
Microscopy 49 (2), 259-266, 2000
136 2000 Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy WG Stratton, J Hamann, JH Perepezko, PM Voyles, X Mao, SV Khare
Applied Physics Letters 86 (14), 2005
131 2005 Structure and physical properties of paracrystalline atomistic models of amorphous silicon PM Voyles, N Zotov, SM Nakhmanson, DA Drabold, JM Gibson, ...
Journal of Applied Physics 90 (9), 4437-4451, 2001
128 2001 Medium-range order in amorphous silicon measured by fluctuation electron microscopy PM Voyles, JR Abelson
Solar energy materials and solar cells 78 (1-4), 85-113, 2003
122 2003