Naresh Kumar Gunasekar

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Carol Trager-CowanDepartment of Physics, University of Strathclydestrath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Paul R. EdwardsSenior Research Fellow, University of Strathclydestrath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Robert MartinProfessor of Physics, Strathclyde Universitystrath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Ben HourahineSenior Lecturer in photonic materials, University of Strathclydestrath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Aimo WinkelmannAGH University of Science and Technologyagh.edu.pl üzerinde doğrulanmış e-posta adresine sahip
Angus J WilkinsonDepartment of Materials, University of Oxfordmaterials.ox.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Jochen BruckbauerDepartment of Physics, SUPA, University of Strathclydestrath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Peter J ParbrookStokes Professor of Nitride Materials, University College Corktyndall.ie üzerinde doğrulanmış e-posta adresine sahip
Stefano VespucciThermo Fisher Scientificthermofisher.com üzerinde doğrulanmış e-posta adresine sahip
Gunnar KuschCambridge Universitycam.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Michael KneisslProfessor, Institute of Solid State Physics, TU Berlin / Ferdinand-Braun-Institut (FBH), Berlinphysik.tu-berlin.de üzerinde doğrulanmış e-posta adresine sahip
Philip ShieldsSenior Lecturer in Electronic & Electrical Engineering, University of Bathbath.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Partha MukhopadhyayTokyo Electron Ltd. and Visiting at CREOL (The College of Optics & Photonics), University of Centralus.tel.com üzerinde doğrulanmış e-posta adresine sahip
Dima ManeuskiUniversity of Glasgowglasgow.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Emmanuel Le BoulbarResearch associate, Cardiff Universitycardiff.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Andrei VescanRWTH Aachencst.rwth-aachen.de üzerinde doğrulanmış e-posta adresine sahip
Elena Pascalillumionillumion.io üzerinde doğrulanmış e-posta adresine sahip
Henri JussilaPostdoctoral researcher, Department of Micro- and Nanosciences, Aalto University, Finlandaalto.fi üzerinde doğrulanmış e-posta adresine sahip
Shanthi Subashchandran (S.Shanthi)Associate Professor, Crystal Growth Centre, Anna University, Chennai, Indiaannauniv.edu üzerinde doğrulanmış e-posta adresine sahip
Rachel OliverProfessor of Materials Science, Cambridge Universitycam.ac.uk üzerinde doğrulanmış e-posta adresine sahip

Takip et

Naresh Kumar Gunasekar

Lecturer in Physics, Cardiff University

cardiff.ac.uk üzerinde doğrulanmış e-posta adresine sahip - Ana Sayfa

Ultra-wide-bandgap materials and devices Gallium oxide photodetectors and transistors


Başlık Alıntılara göre sırala Yıla göre sırala Başlığa göre sırala	Alıntı yapanlar Alıntı yapanlar	Yıl
Rapid Nondestructive Analysis of Threading Dislocations in Wurtzite Materials<? format?> Using the Scanning Electron Microscope G Naresh-Kumar, B Hourahine, PR Edwards, AP Day, A Winkelmann, ... Physical review letters 108 (13), 135503, 2012	87	2012
Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns S Vespucci, A Winkelmann, G Naresh-Kumar, KP Mingard, D Maneuski, ... Physical Review B 92 (20), 205301, 2015	65	2015
Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN … A Vilalta-Clemente, G Naresh-Kumar, M Nouf-Allehiani, P Gamarra, ... Acta Materialia 125, 125-135, 2017	54	2017
Origin of Red Emission in β‐Ga₂O₃ Analyzed by Cathodoluminescence and Photoluminescence Spectroscopy G Naresh-Kumar, H MacIntyre, S Subashchandran, PR Edwards, ... physica status solidi (b) 258 (2), 2000465, 2021	39	2021
Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN G Naresh-Kumar, J Bruckbauer, PR Edwards, S Kraeusel, B Hourahine, ... Microscopy and Microanalysis 20 (1), 55-60, 2014	37	2014
Electron channelling contrast imaging for III-nitride thin film structures G Naresh-Kumar, D Thomson, M Nouf-Allehiani, J Bruckbauer, ... Materials Science in Semiconductor Processing 47, 44-50, 2016	29	2016
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction G Naresh-Kumar, A Vilalta-Clemente, H Jussila, A Winkelmann, G Nolze, ... Scientific Reports 7 (1), 10916, 2017	28	2017
Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0. 82Ga0. 18N G Kusch, M Nouf-Allehiani, F Mehnke, C Kuhn, PR Edwards, T Wernicke, ... Applied Physics Letters 107 (7), 2015	28	2015
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope G Naresh-Kumar, C Mauder, KR Wang, S Kraeusel, J Bruckbauer, ... Applied Physics Letters 102 (14), 2013	26	2013
Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope G Naresh-Kumar, J Bruckbauer, A Winkelmann, X Yu, B Hourahine, ... Nano letters 19 (6), 3863-3870, 2019	24	2019
Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope G Naresh‐Kumar, B Hourahine, A Vilalta‐Clemente, P Ruterana, ... physica status solidi (a) 209 (3), 424-426, 2012	24	2012
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy S Walde, S Hagedorn, PM Coulon, A Mogilatenko, C Netzel, J Weinrich, ... Journal of Crystal Growth 531, 125343, 2020	20	2020
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors MHCTC G. Naresh-Kumar, A. Vilalta-Clemente, S. Pandey, D. Skuridina, H ... United Kingdom Nitrides Consortium (UKNC - 2015), England, 2015	19*	2015
Dislocation contrast in electron channelling contrast images as projections of strain-like components E Pascal, B Hourahine, G Naresh-Kumar, K Mingard, C Trager-Cowan Materials Today: Proceedings 5 (6), 14652-14661, 2018	17	2018
Diffraction effects and inelastic electron transport in angle‐resolved microscopic imaging applications A Winkelmann, G Nolze, S Vespucci, G Naresh‐Kumar, C Trager‐Cowan, ... Journal of Microscopy 267 (3), 330-346, 2017	17	2017
Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging BM Jablon, K Mingard, A Winkelmann, G Naresh-Kumar, B Hourahine, ... International Journal of Refractory Metals and Hard Materials 87, 105159, 2020	16	2020
Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE P Mukhopadhyay, I Hatipoglu, YK Frodason, JB Varley, MS Williams, ... Applied Physics Letters 121 (11), 2022	15	2022
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Semiconductor Science and Technology 35 (5), 054001, 2020	15	2020
Stress distribution of GaN layer grown on micro-pillar patterned GaN templates S Nagarajan, O Svensk, M Ali, G Naresh-Kumar, C Trager-Cowan, ... Applied Physics Letters 103 (1), 2013	15	2013
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Photonics Research 7 (11), B73-B82, 2019	12	2019

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