| Robust automatic void detection in solder balls AF Said, BL Bennett, LJ Karam, J Pettinato 2010 IEEE International Conference on Acoustics, Speech and Signal …, 2010 | 35 | 2010 |
| Automated void detection in solder balls in the presence of vias and other artifacts AF Said, BL Bennett, LJ Karam, A Siah, K Goodman, JS Pettinato IEEE transactions on components, packaging and manufacturing technology 2 …, 2012 | 33 | 2012 |
| Automated detection and classification of non-wet solder joints AF Said, BL Bennett, LJ Karam, JS Pettinato IEEE transactions on automation science and engineering 8 (1), 67-80, 2010 | 31 | 2010 |
| Automatic cell migration and proliferation analysis LJ Karam, A Said US Patent 9,082,164, 2015 | 17 | 2015 |
| Real-time detection and classification of traffic light signals AF Said, MK Hazrati, F Akhbari 2016 IEEE Applied Imagery Pattern Recognition Workshop (AIPR), 1-5, 2016 | 8 | 2016 |
| Non-wet solder joint detection in processor sockets and BGA assemblies AF Said, BL Bennett, F Toth, LJ Karam, J Pettinato 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC …, 2010 | 6 | 2010 |
| Multi-region texture image segmentation based on constrained level-set evolution functions AF Said, LJ Karam 2009 IEEE 13th Digital Signal Processing Workshop and 5th IEEE Signal …, 2009 | 6 | 2009 |
| White and color noise cancellation using adaptive feedback cross-coupled line enhancer filter AF Said 2008 IEEE International Symposium on Signal Processing and Information …, 2008 | 6 | 2008 |
| Migration and proliferation analysis for bladder cancer cells AF Said, LJ Karam, ME Berens, Z Lacroix, RA Renaut 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to …, 2007 | 6 | 2007 |
| A cost-effective, fast, and robust annotation tool AF Said, V Kashyap, N Choudhury, F Akhbari 2017 IEEE applied imagery pattern recognition workshop (AIPR), 1-6, 2017 | 5 | 2017 |
| Robust and Accurate Objects Measurement in Real-World Based on Camera System AF Said 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR), 1-5, 2017 | 4 | 2017 |
| Die level defects detection in semiconductor units AF Said, NS Patel ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 130-133, 2013 | 4 | 2013 |
| Cell migration analysis using a statistical level-set segmentation on a wavelet-based structure tensor feature space AF Said, LJ Karam 2007 IEEE International Symposium on Signal Processing and Information …, 2007 | 3 | 2007 |
| Noise resilient image segmentation and classification methods with applications in biomedical and semiconductor images AF Said Arizona State University, 2010 | 1 | 2010 |
| Bspline based Wavelets with Lifting Implementation85-89 AF Said | | |
