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Grzegorz (Greg) Greczynski
Grzegorz (Greg) Greczynski
Підтверджена електронна адреса в liu.se
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X-ray photoelectron spectroscopy: towards reliable binding energy referencing
G Greczynski, L Hultman
Progress in Materials Science 107, 100591, 2020
20792020
Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: resolving the myth of apparent …
G Greczynski, L Hultman
Applied Surface Science 451, 99-103, 2018
10972018
The effects of solvents on the morphology and sheet resistance in poly (3, 4-ethylenedioxythiophene)–polystyrenesulfonic acid (PEDOT–PSS) films
SKM Jönsson, J Birgerson, X Crispin, G Greczynski, W Osikowicz, ...
Synthetic metals 139 (1), 1-10, 2003
9502003
C 1s peak of adventitious carbon aligns to the vacuum level: dire consequences for material's bonding assignment by photoelectron spectroscopy
G Greczynski, L Hultman
ChemPhysChem 18 (12), 1507-1512, 2017
9302017
Compromising science by ignorant instrument calibration—need to revisit half a century of published XPS data
G Greczynski, L Hultman
Angewandte Chemie International Edition 59 (13), 5002-5006, 2020
7722020
A step-by-step guide to perform x-ray photoelectron spectroscopy
G Greczynski, L Hultman
Journal of Applied Physics 132 (1), 2022
5802022
Photoelectron spectroscopy of thin films of PEDOT–PSS conjugated polymer blend: a mini-review and some new results
G Greczynski, T Kugler, M Keil, W Osikowicz, M Fahlman, WR Salaneck
Journal of Electron Spectroscopy and Related Phenomena 121 (1-3), 1-17, 2001
5572001
The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy
G Greczynski, L Hultman
Scientific reports 11 (1), 11195, 2021
5302021
Characterization of the PEDOT-PSS system by means of X-ray and ultraviolet photoelectron spectroscopy
G Greczynski, T Kugler, WR Salaneck
Thin Solid Films 354 (1-2), 129-135, 1999
5221999
XPS guide: Charge neutralization and binding energy referencing for insulating samples
DR Baer, K Artyushkova, H Cohen, CD Easton, M Engelhard, ...
Journal of Vacuum Science & Technology A 38 (3), 2020
2242020
Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films
G Greczynski, L Hultman
Applied Surface Science 387, 294-300, 2016
1942016
Referencing to adventitious carbon in X-ray photoelectron spectroscopy: can differential charging explain C 1s peak shifts?
G Greczynski, L Hultman
Applied Surface Science 606, 154855, 2022
1922022
X-ray photoelectron spectroscopy of thin films
G Greczynski, RT Haasch, N Hellgren, E Lewin, L Hultman
Nature Reviews Methods Primers 3 (1), 40, 2023
1832023
Towards reliable X-ray photoelectron spectroscopy: sputter-damage effects in transition metal borides, carbides, nitrides, and oxides
G Greczynski, L Hultman
Applied surface science 542, 148599, 2021
1822021
A review of metal-ion-flux-controlled growth of metastable TiAlN by HIPIMS/DCMS co-sputtering
G Greczynski, J Lu, J Jensen, S Bolz, W Kölker, C Schiffers, O Lemmer, ...
Surface and Coatings Technology 257, 15-25, 2014
1682014
Role of Tin+ and Aln+ ion irradiation (n= 1, 2) during Ti1-xAlxN alloy film growth in a hybrid HIPIMS/magnetron mode
G Greczynski, J Lu, MP Johansson, J Jensen, I Petrov, JE Greene, ...
Surface and Coatings Technology 206 (19-20), 4202-4211, 2012
1482012
Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layers
G Greczynski, D Primetzhofer, J Lu, L Hultman
Applied Surface Science 396, 347-358, 2017
1442017
Time and energy resolved ion mass spectroscopy studies of the ion flux during high power pulsed magnetron sputtering of Cr in Ar and Ar/N2 atmospheres
G Greczynski, L Hultman
Vacuum 84 (9), 1159-1170, 2010
1422010
Impact of sample storage type on adventitious carbon and native oxide growth: X-ray photoelectron spectroscopy study
G Greczynski, L Hultman
Vacuum 205, 111463, 2022
1412022
An experimental study of poly (9, 9-dioctyl-fluorene) and its interfaces with Li, Al, and LiF
G Greczynski, M Fahlman, WR Salaneck
The Journal of Chemical Physics 113 (6), 2407-2412, 2000
1342000
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