Підписатись
Marcello Dalpasso
Marcello Dalpasso
Professore Associato di Sistemi per l'Elaborazione dell'Informazione, Università di Padova, Italia
Підтверджена електронна адреса в unipd.it - Домашня сторінка
Назва
Посилання
Посилання
Рік
Virtual simulation of distributed IP-based designs
M Dalpasso, A Bogliolo, L Benini
Proceedings of the 36th annual ACM/IEEE Design Automation Conference, 50-55, 1999
601999
Specification and validation of disstributed IP-based designs with JavaCAD
M Dalpasso, A Bogliolo, L Benini
Proceedings of the conference on Design, automation and test in Europe, 132-es, 1999
531999
Fault simulation of parametric bridging faults in CMOS IC's
M Dalpasso, M Favalli, P Olivo, B Ricco
IEEE transactions on computer-aided design of integrated circuits and …, 1993
291993
Parametric Bridging Fault Characterieation for the Fault Simulation of Library-Based ICs
M Dalpasso, M Favalli, P Olivo, B Riccò
Proceedings International Test Conference 1992, 486-486, 1992
241992
Bridging fault modeling and simulation for deep submicron CMOS ICs
M Favalli, M Dalpasso
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2002
212002
Hardware/software IP protection
M Dalpasso, A Bogliolo, L Benini
Proceedings of the 37th Annual Design Automation Conference, 593-596, 2000
212000
Analysis of dynamic effects of resistive bridging faults in CMOS and BiCMOS digital ICs
M Favalli, M Dalpasso, P Olivo, B Ricco
Proceedings of IEEE International Test Conference-(ITC), 865-874, 1993
181993
Analysis of steady state detection of resistive bridging faults in BiCMOS digital ICs
M Favalli, M Dalpasso, P Olivo, B Ricco
Proceedings International Test Conference 1992, 466-466, 1992
171992
Modeling of broken connections faults in CMOS ICs
M Favalli, M Dalpasso, P Olivo, B Ricco
Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC, 159-164, 1994
141994
Self-learning signature analysis for non-volatile memory testing
P Olivo, M Dalpasso
Proceedings International Test Conference 1996. Test and Design Validity …, 1996
121996
High quality test vectors for bridging faults in the presence of IC's parameters variations
M Favalli, M Dalpasso
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
112007
Modeling and simulation of broken connections in CMOS IC's
M Favalli, M Dalpasso, P Olivo
IEEE transactions on computer-aided design of integrated circuits and …, 1996
101996
Switch-Level fault simulation by critical-path tracing
M Dalpasso, M Favalli, P Olivo, B Ricco
IEEE European Test Conference 1991, 181-190, 1991
91991
Boolean and pseudo-boolean test generation for feedback bridging faults
M Favalli, M Dalpasso
IEEE Transactions on Computers 65 (3), 706-715, 2015
82015
Virtual fault simulation of distributed IP-based designs
M Dalpasso, A Bogliolo, L Benini, M Favalli
Proceedings of the conference on Design, automation and test in Europe, 99-105, 2000
82000
Algorithmic strategies for a fast exploration of the tsp 4-opt neighborhood
G Lancia, M Dalpasso
Advances in Optimization and Decision Science for Society, Services and …, 2019
72019
Correlation between IDDQ Testing Quality and Sensor Accuracy
M Dalpasso, M Favalli, P Olivo
European Design and Test Conference, 1995. ED&TC 1995, Proceedings, 568-572, 1995
7*1995
Realistic testability estimates for CMOS ICs
M Dalpasso, M Favalli, P Olivo, JP Teixeira
Electronics Letters 30 (19), 1593-1595, 1994
71994
Finding the best 3-OPT move in subcubic time
G Lancia, M Dalpasso
Algorithms 13 (11), 306, 2020
62020
Applications of boolean satisfiability to verification and testing of switch-level circuits
M Favalli, M Dalpasso
Journal of Electronic Testing 30, 41-55, 2014
62014
У даний момент система не може виконати операцію. Спробуйте пізніше.
Статті 1–20