| Performance evaluation and reliability issues of junctionless CSG MOSFET for RFIC design Y Pratap, S Haldar, RS Gupta, M Gupta IEEE Transactions on Device and Materials Reliability 14 (1), 418-425, 2014 | 94 | 2014 |
| Analytical modeling of gate-all-around junctionless transistor based biosensors for detection of neutral biomolecule species Y Pratap, M Kumar, S Kabra, S Haldar, RS Gupta, M Gupta Journal of Computational Electronics 17, 288-296, 2018 | 79 | 2018 |
| Modeling and simulation of AlGaN/GaN MOS-HEMT for biosensor applications P Pal, Y Pratap, M Gupta, S Kabra IEEE Sensors Journal 19 (2), 587-593, 2018 | 76 | 2018 |
| An analytical subthreshold current modeling of cylindrical gate all around (CGAA) MOSFET incorporating the influence of device design engineering Y Pratap, P Ghosh, S Haldar, RS Gupta, M Gupta Microelectronics Journal 45 (4), 408-415, 2014 | 53 | 2014 |
| Effect of high-k and vacuum dielectrics as gate stack on a junctionless cylindrical surrounding gate (JL-CSG) MOSFET A Sharma, A Jain, Y Pratap, RS Gupta Solid-State Electronics 123, 26-32, 2016 | 45 | 2016 |
| Performance analysis and optimization of under-gate dielectric modulated Junctionless FinFET biosensor HD Sehgal, Y Pratap, M Gupta, S Kabra IEEE Sensors Journal 21 (17), 18897-18904, 2021 | 26 | 2021 |
| Performance Investigation of Novel Pt/Pd-SiO2 Junctionless FinFET as a High Sensitive Hydrogen Gas Sensor for Industrial Applications HD Sehgal, Y Pratap, M Gupta, S Kabra IEEE Sensors Journal 21 (12), 13356-13363, 2021 | 26 | 2021 |
| Localized charge-dependent threshold voltage analysis of gate-material-engineered junctionless nanowire transistor Y Pratap, S Haldar, RS Gupta, M Gupta IEEE Transactions on Electron Devices 62 (8), 2598-2605, 2015 | 25 | 2015 |
| Open gate AlGaN/GaN HEMT biosensor: Sensitivity analysis and optimization P Pal, Y Pratap, M Gupta, S Kabra Superlattices and Microstructures 156, 106968, 2021 | 23 | 2021 |
| Gate-material-engineered junctionless nanowire transistor (JNT) with vacuum gate dielectric for enhanced hot-carrier reliability Y Pratap, S Haldar, RS Gupta, M Gupta IEEE Transactions on Device and Materials Reliability 16 (3), 360-369, 2016 | 22 | 2016 |
| Impact of different localized trap charge profiles on the short channel double gate junctionless nanowire transistor based inverter and ring oscillator circuit N Garg, Y Pratap, M Gupta, S Kabra AEU-International Journal of Electronics and Communications 108, 251-261, 2019 | 17 | 2019 |
| Sensitivity investigation of gate-all-around junctionless transistor for hydrogen gas detection Y Pratap, M Kumar, M Gupta, S Haldar, RS Gupta, SS Deswal 2016 IEEE International Nanoelectronics Conference (INEC), 1-2, 2016 | 17 | 2016 |
| Reliability assessment of GaAs/Al₂O₃ junctionless FinFET in the presence of interfacial layer defects and radiations N Garg, Y Pratap, M Gupta, S Kabra IEEE Transactions on Device and Materials Reliability 20 (2), 452-458, 2020 | 16 | 2020 |
| Detection of breast cancer cell-MDA-MB-231 by measuring conductivity of Schottky Source/Drain GaN FinFET HD Sehgal, Y Pratap, S Kabra IEEE Sensors Journal 22 (6), 6108-6115, 2022 | 14 | 2022 |
| Comparative Analysis of Junctionless FinFET and Inverted Mode FinFET as Phosphine (PH3) Gas Sensor HD Sehgal, Y Pratap, M Gupta, S Kabra, P Pal 2020 5th International Conference on Devices, Circuits and Systems (ICDCS …, 2020 | 14 | 2020 |
| Physics-based drain current modeling of gate-all-around junctionless nanowire twin-gate transistor (JN-TGT) for digital applications Y Pratap, R Gautam, S Haldar, RS Gupta, M Gupta Journal of Computational Electronics 15, 492-501, 2016 | 14 | 2016 |
| Cylindrical gate all around Schottky barrier MOSFET with insulated shallow extensions at source/drain for removal of ambipolarity: a novel approach M Kumar, Y Pratap, S Haldar, M Gupta, RS Gupta Journal of Semiconductors 38 (12), 124002, 2017 | 13 | 2017 |
| Analytical modeling and simulation of AlGaN/GaN MOS-HEMT for high sensitive pH sensor P Pal, Y Pratap, M Gupta, S Kabra IEEE Sensors Journal 21 (12), 12998-13005, 2021 | 12 | 2021 |
| Small-signal analysis of double-channel AlGaN/GaN HEMT and MOSHEMT with undoped barrier for microwave applications P Pal, Y Pratap, S Kabra Journal of Electronic Materials 51 (7), 4095-4103, 2022 | 9 | 2022 |
| Performance analysis of ScAlN/GaN high electron mobility transistor (HEMT) for biosensing application P Pal, Y Pratap, M Gupta, S Kabra, HD Sehgal 2020 5th International Conference on Devices, Circuits and Systems (ICDCS …, 2020 | 9 | 2020 |
Prof. Mridula GuptaDepartment of Electronic Science, University of Delhi South CampusEmail được xác minh tại south.du.ac.in
