| Review of failures of photovoltaic modules M Köntges, S Kurtz, CE Packard, U Jahn, KA Berger, K Kato, T Friesen, ... IEA International Energy Agency, 2014 | 589 | 2014 |
| Potential-induced degradation in photovoltaic modules: a critical review W Luo, YS Khoo, P Hacke, V Naumann, D Lausch, SP Harvey, JP Singh, ... Energy & environmental science 10 (1), 43-68, 2017 | 496 | 2017 |
| A wafer-based monocrystalline silicon photovoltaics road map: Utilizing known technology improvement opportunities for further reductions in manufacturing costs A Goodrich, P Hacke, Q Wang, B Sopori, R Margolis, TL James, ... Solar Energy Materials and Solar Cells 114, 110-135, 2013 | 444 | 2013 |
| Schottky barrier on n‐type GaN grown by hydride vapor phase epitaxy P Hacke, T Detchprohm, K Hiramatsu, N Sawaki Applied physics letters 63 (19), 2676-2678, 1993 | 395 | 1993 |
| Analysis of deep levels in n‐type GaN by transient capacitance methods P Hacke, T Detchprohm, K Hiramatsu, N Sawaki, K Tadatomo, K Miyake Journal of Applied Physics 76 (1), 304-309, 1994 | 361 | 1994 |
| Interconnect technologies for back contact solar cells and modules P Hacke, DH Meakin, JM Gee, S Southimath, B Murphy US Patent App. 11/963,841, 2008 | 239 | 2008 |
| Growth and characterization of cubic GaN H Okumura, K Ohta, G Feuillet, K Balakrishnan, S Chichibu, H Hamaguchi, ... Journal of crystal Growth 178 (1-2), 113-133, 1997 | 231 | 1997 |
| System voltage potential-induced degradation mechanisms in PV modules and methods for test P Hacke, K Terwilliger, R Smith, S Glick, J Pankow, M Kempe, SKI Bennett, ... 2011 37th IEEE Photovoltaic Specialists Conference, 000814-000820, 2011 | 215 | 2011 |
| Back-contact solar cells and methods for fabrication JM Gee, P Hacke US Patent 7,144,751, 2006 | 186 | 2006 |
| Deep levels in the upper band‐gap region of lightly Mg‐doped GaN P Hacke, H Nakayama, T Detchprohm, K Hiramatsu, N Sawaki Applied physics letters 68 (10), 1362-1364, 1996 | 172 | 1996 |
| Characterization of multicrystalline silicon modules with system bias voltage applied in damp heat P Hacke, M Kempe, K Terwilliger, S Glick, N Call, S Johnston, S Kurtz National Renewable Energy Lab.(NREL), Golden, CO (United States), 2011 | 158 | 2011 |
| Enabling reliability assessments of pre-commercial perovskite photovoltaics with lessons learned from industrial standards HJ Snaith, P Hacke Nature Energy 3 (6), 459-465, 2018 | 154 | 2018 |
| Assessment of photovoltaic module failures in the field: International energy agency photovoltaic power systems programme: IEA PVPS task 13, subtask 3: Report IEA-PVPS T13-09: 2017 M Köntges, G Oreski, U Jahn, M Herz, P Hacke, KA Weiß International Energy Agency, 2017 | 150 | 2017 |
| Monitoring surface stoichiometry with the (2× 2) reconstruction during growth of hexagonal‐phase GaN by molecular beam epitaxy P Hacke, G Feuillet, H Okumura, S Yoshida Applied physics letters 69 (17), 2507-2509, 1996 | 142 | 1996 |
| Process and fabrication methods for emitter wrap through back contact solar cells P Hacke, J Gee US Patent App. 11/220,927, 2006 | 141 | 2006 |
| A status review of photovoltaic power conversion equipment reliability, safety, and quality assurance protocols P Hacke, S Lokanath, P Williams, A Vasan, P Sochor, GS TamizhMani, ... Renewable and Sustainable Energy Reviews 82, 1097-1112, 2018 | 120 | 2018 |
| Contact fabrication of emitter wrap-through back contact silicon solar cells P Hacke, J Gee US Patent App. 11/050,184, 2005 | 120 | 2005 |
| Buried-contact solar cells with self-doping contacts JM Gee, P Hacke US Patent 7,335,555, 2008 | 117 | 2008 |
| Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress P Hacke, R Smith, K Terwilliger, S Glick, D Jordan, S Johnston, M Kempe, ... 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2, 1-8, 2012 | 116 | 2012 |
| Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity P Hacke, S Spataru, K Terwilliger, G Perrin, S Glick, S Kurtz, ... IEEE, 2015 | 115 | 2015 |
