| The effect of degree of reduction on the electrical properties of functionalized graphene sheets C Punckt, F Muckel, S Wolff, IA Aksay, CA Chavarin, G Bacher, W Mertin Applied Physics Letters 102 (2), 2013 | 157 | 2013 |
| Local voltage drop in a single functionalized graphene sheet characterized by Kelvin probe force microscopy L Yan, C Punckt, IA Aksay, W Mertin, G Bacher Nano letters 11 (9), 3543-3549, 2011 | 96 | 2011 |
| Low resistive edge contacts to CVD‐grown graphene using a CMOS compatible metal M Shaygan, M Otto, AA Sagade, CA Chavarin, G Bacher, W Mertin, ... Annalen der Physik 529 (11), 1600410, 2017 | 48 | 2017 |
| Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy S Vinaji, A Lochthofen, W Mertin, I Regolin, C Gutsche, W Prost, ... Nanotechnology 20 (38), 385702, 2009 | 46 | 2009 |
| Monolithic gallium arsenide cantilever for scanning near-field microscopy S Heisig, HU Danzebrink, A Leyk, W Mertin, S Münster, E Oesterschulze Ultramicroscopy 71 (1-4), 99-105, 1998 | 44 | 1998 |
| Spatially resolved photoelectric performance of axial GaAs nanowire pn-diodes A Lysov, S Vinaji, M Offer, C Gutsche, I Regolin, W Mertin, M Geller, ... Nano Research 4, 987-995, 2011 | 37 | 2011 |
| Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy A Lochthofen, W Mertin, G Bacher, L Hoeppel, S Bader, J Off, B Hahn Applied Physics Letters 93 (2), 2107, 2008 | 35 | 2008 |
| Voltage drop in an (AlxGa1− x) 0.5 In0. 5P light-emitting diode probed by Kelvin probe force microscopy K Katzer, W Mertin, G Bacher, A Jaeger, K Streubel Applied physics letters 89 (10), 2006 | 33 | 2006 |
| On the origin of contact resistances in graphene devices fabricated by optical lithography CA Chavarin, AA Sagade, D Neumaier, G Bacher, W Mertin Applied Physics A 122, 1-5, 2016 | 32 | 2016 |
| Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique W Mertin, C Bohm, LJ Balk, E Kubalek 1992 IEEE MTT-S Microwave Symposium Digest, 1443-1446, 1992 | 24 | 1992 |
| Graphene as a transparent conductive electrode in GaN-based LEDs H Zhang, J Mischke, W Mertin, G Bacher Materials 15 (6), 2203, 2022 | 21 | 2022 |
| Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier G David, S Redlich, W Mertin, RM Bertenburg, S Koßlowski, FJ Tegude, ... Microwave Conference, 1993. 23rd European, 497-499, 1993 | 20 | 1993 |
| Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique W Mertin, A Leyk, G David, RM Bertenburg, S Kosslowski, FJ Tegude, ... 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 94CH3389 …, 1994 | 19 | 1994 |
| Direct growth of graphene on Ge (100) and Ge (110) via thermal and plasma enhanced CVD B Bekdüz, U Kaya, M Langer, W Mertin, G Bacher Scientific Reports 10 (1), 12938, 2020 | 18 | 2020 |
| Probe tip invasiveness at indirect electro-optic sampling of MMIC W Mertin, C Roths, F Taenzler, E Kubalek 1993 IEEE MTT-S International Microwave Symposium Digest, 1351-1354, 1993 | 17 | 1993 |
| Transfer-free, scalable photodetectors based on MOCVD-grown 2D-heterostructures U Hutten, L Daniel, A Grundmann, N Stracke, M Abdelbaky, Y Beckmann, ... 2D Materials 8 (4), 045015, 2021 | 14 | 2021 |
| Cantilever influence suppression of contactless IC-testing by electric force microscopy V Wittpahl, U Behnke, B Wand, W Mertin Microelectronics Reliability 38 (6-8), 981-986, 1998 | 14 | 1998 |
| Time resolved near-field scanning optical microscopy C Bohm, J Bangert, W Mertin, E Kubalek Journal of Physics D: Applied Physics 27 (10), 2237, 1994 | 14 | 1994 |
| Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy A Lochthofen, W Mertin, G Bacher, M Furitsch, G Brüderl, U Strauss, ... Journal of Physics D: Applied Physics 41 (13), 135115, 2008 | 13 | 2008 |
| Contactless gigahertz testing W Mertin, A Leyk, U Behnke, V Wittpahl Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 13 | 1998 |
Gerd BacherUniversität Duisburg-EssenEmail được xác minh tại uni-due.de
